P. H. Fuoss

3.2k citations
29 papers · 1.7k indexed · h-index 20
Topics
Surface and Thin Film Phenomena (9 papers)Semiconductor materials and devices (8 papers)Electron and X-Ray Spectroscopy Techniques (5 papers)

In The Last Decade

P. H. Fuoss

29 papers receiving 1.7k citations

Peers

P. H. Fuoss
Comparison fields: 5 of 51
  • Materials Chemistry 1.1k
  • Electrical and Electronic Engineering 745
  • Atomic and Molecular Physics, and Optics 502
  • Electronic, Optical and Magnetic Materials 342
  • Biomedical Engineering 239
Replace B. G. Yacobi with:
B. G. Yacobi United States
J. Hornstra Netherlands
M.L. Thèye France
A. G. Marinopoulos Portugal
Azusa N. Hattori Japan
A. L. Shluger United Kingdom
Wolfgang Neumann Germany
Paul F. Fewster United Kingdom
A. Koma Japan
Hiroyuki Kageshima Japan
P. H. Fuoss relative to B. G. Yacobi United States B. G. Yacobi's profile →
Citations per field
00.5×1.5×1.8×
B. G. Yacobi · 1×
Citations per year

Countries citing papers authored by P. H. Fuoss

Since Specialization
Citations

This map shows the geographic impact of P. H. Fuoss's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by P. H. Fuoss with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites P. H. Fuoss more than expected).

Fields of papers citing papers by P. H. Fuoss

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by P. H. Fuoss. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by P. H. Fuoss. The network helps show where P. H. Fuoss may publish in the future.

Co-authorship network of co-authors of P. H. Fuoss

This figure shows the co-authorship network connecting the top 25 collaborators of P. H. Fuoss. A scholar is included among the top collaborators of P. H. Fuoss based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with P. H. Fuoss. P. H. Fuoss is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
#WorkIndexed citations
1 13
2 14
3 25
4 332
5 1
6 41
7 1
8 30
9 33
10 28
11 29
12 6
13 36
14 47
15 41
16 8
17 25
18 61
19 243
20 17

About P. H. Fuoss

P. H. Fuoss is a scholar working on Structural Biology, Surfaces, Coatings and Films and Ceramics and Composites, having authored 29 papers that have together received 1.7k indexed citations. Recurring topics across this work include Surface and Thin Film Phenomena (9 papers), Semiconductor materials and devices (8 papers) and Electron and X-Ray Spectroscopy Techniques (5 papers). The work is most often cited by research in Ceramics and Composites (214 citations), Materials Chemistry (1.1k citations) and Structural Biology (34 citations). P. H. Fuoss has collaborated with scholars based in United States, Netherlands and Italy. Frequent co-authors include Arthur Bienenstock, P. Eisenberger, W. K. Warburton, S. Brennan, G. B. Stephenson, J. A. Eastman, W.C. Sinke, F. Spaepen, D. C. Jacobson and B. S. Dennis. Their work appears in journals such as Physical Review Letters, Physical review. B, Condensed matter and Applied Physics Letters.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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