O. Fuchs

33 papers receiving 1.0k citations

Peers

O. Fuchs
Comparison fields: 5 of 63
  • Radiation 286
  • Surfaces, Coatings and Films 110
  • Materials Chemistry 647
  • Atomic and Molecular Physics, and Optics 360
  • Electrical and Electronic Engineering 469
Replace P. Väterlein with:
P. Väterlein Germany
P. Bennich Sweden
R. Treichler Germany
H. Tillborg Sweden
J.-O. Forsell Sweden
B. Hernnäs Sweden
R. F. Boehme United States
S. Terreni Italy
G. Bray Sweden
Yang Chu United States
O. Fuchs relative to P. Väterlein Germany P. Väterlein's profile →
Citations per field
00.5×4.1×
P. Väterlein · 1×
Citations per year

Countries citing papers authored by O. Fuchs

Since Specialization
Citations

This map shows the geographic impact of O. Fuchs's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by O. Fuchs with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites O. Fuchs more than expected).

Fields of papers citing papers by O. Fuchs

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by O. Fuchs. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by O. Fuchs. The network helps show where O. Fuchs may publish in the future.

Co-authors

The 25 scholars most cited alongside O. Fuchs, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with O. Fuchs Line = papers co-authored together O. Fuchs links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 34 papers — load more, or switch the sort, to bring in the rest.

#Work
1 2008156
2 200584
3 200971
4 200369
5 200359
6 200451
7 201545
8 200841
9 201241
10 201138
11 201237
12 200632
13 200731
14 200330
15 200130
16 200626
17 200224
18 200523
19 200623
20 200722

About O. Fuchs

O. Fuchs is a scholar working on Radiation, Condensed Matter Physics, Surfaces, Coatings and Films, Materials Chemistry and Electrical and Electronic Engineering, having authored 34 papers that have together received 1.1k indexed citations. Recurring topics across this work include Chalcogenide Semiconductor Thin Films (14 papers), X-ray Spectroscopy and Fluorescence Analysis (12 papers), Quantum Dots Synthesis And Properties (12 papers), Copper-based nanomaterials and applications (9 papers), Electron and X-Ray Spectroscopy Techniques (4 papers), ZnO doping and properties (4 papers), Crystallography and Radiation Phenomena (4 papers) and Advanced Chemical Physics Studies (3 papers). The work is most often cited by research in Radiation (286 citations), Surfaces, Coatings and Films (110 citations), Materials Chemistry (647 citations), Atomic and Molecular Physics, and Optics (360 citations) and Electrical and Electronic Engineering (469 citations). O. Fuchs has collaborated with scholars based in Germany, United States and Sweden. Frequent co-authors include Clemens Heske, L. Weinhardt, E. Umbach, Marcus Bär, Jonathan D. Denlinger, Markus Weigand, Yan V. Zubavichus, M. Blum, M. Grunze and Wanli Yang. Their work appears in journals such as Applied Physics Letters, Physical Review B, Journal of Electron Spectroscopy and Related Phenomena, The Journal of Chemical Physics and Physical Review Letters.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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