D. Eich
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- Advanced Semiconductor Detectors and Materials 47
- Chalcogenide Semiconductor Thin Films 17
- CCD and CMOS Imaging Sensors 8
- Instrumentation top 10%
- Materials Chemistry top 10%
- Quantum Dots Synthesis And Properties 9
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- Semiconductor Quantum Structures and Devices 12
- Aerospace Engineering top 10%
- Infrared Target Detection Methodologies 30
- Calibration and Measurement Techniques 13
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- Spectroscopy and Laser Applications 4
- Co-authors
- R. FinkE. UmbachHeinrich FiggemeierStefan HannaUlf WinklerS. K. KulkarniClemens HeskeRainer Breiter
- Journals
- Journal of Electronic Materials (11 papers)Applied Physics Letters (3 papers)Physical review. B, Condensed matter (3 papers)
- Partner nations
- GermanyItalyUnited States
In The Last Decade
D. Eich
56 papers receiving 631 citations
Peers
Comparison fields: 5 of 42
- Electrical and Electronic Engineering 643
- Instrumentation 31
- Materials Chemistry 368
- Atomic and Molecular Physics, and Optics 227
- Aerospace Engineering 155
Countries citing papers authored by D. Eich
This map shows the geographic impact of D. Eich's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by D. Eich with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites D. Eich more than expected).
Fields of papers citing papers by D. Eich
This network shows the impact of papers produced by D. Eich. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by D. Eich. The network helps show where D. Eich may publish in the future.
Co-authorship network
The 25 scholars most cited alongside D. Eich, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2025 | 1 | |
| 2 | 2024 | 0 | |
| 3 | 2023 | 3 | |
| 4 | 2019 | 2 | |
| 5 | 2019 | 12 | |
| 6 | 2019 | 1 | |
| 7 | 2019 | 0 | |
| 8 | 2018 | 6 | |
| 9 | 2018 | 11 | |
| 10 | 2018 | 17 | |
| 11 | 2017 | 4 | |
| 12 | 2017 | 25 | |
| 13 | 2016 | 14 | |
| 14 | 2016 | 18 | |
| 15 | 2014 | 3 | |
| 16 | 2012 | 5 | |
| 17 | 2011 | 11 | |
| 18 | 2000 | 11 | |
| 19 | 1999 | 6 | |
| 20 | 1997 | 3 |
About D. Eich
D. Eich is a scholar working on Aerospace Engineering, Instrumentation, Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Radiation, having authored 61 papers that have together received 733 indexed citations. Recurring topics across this work include Advanced Semiconductor Detectors and Materials (47 papers), Infrared Target Detection Methodologies (30 papers), Chalcogenide Semiconductor Thin Films (17 papers), Calibration and Measurement Techniques (13 papers), Semiconductor Quantum Structures and Devices (12 papers), Quantum Dots Synthesis And Properties (9 papers), CCD and CMOS Imaging Sensors (8 papers) and Spectroscopy and Laser Applications (4 papers). The work is most often cited by research in Electrical and Electronic Engineering (643 citations), Instrumentation (31 citations), Materials Chemistry (368 citations), Atomic and Molecular Physics, and Optics (227 citations) and Aerospace Engineering (155 citations). D. Eich has collaborated with scholars based in Germany, Italy and United States. Frequent co-authors include R. Fink, E. Umbach, Heinrich Figgemeier, Stefan Hanna, Ulf Winkler, S. K. Kulkarni, Clemens Heske, Rainer Breiter, J. Wendler and W. Riedl. Their work appears in journals such as Journal of Electronic Materials, Applied Physics Letters, Physical review. B, Condensed matter, Applied Optics and Thin Solid Films.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.