J.-O. Forsell
- Surfaces, Coatings and Films top 2%
- Electron and X-Ray Spectroscopy Techniques 4
- Radiation top 5%
- X-ray Spectroscopy and Fluorescence Analysis 5
- Advanced X-ray Imaging Techniques 2
- Spectroscopy top 10%
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- Advancements in Photolithography Techniques 2
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- Mineralogy and Gemology Studies 1
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- Catalytic Processes in Materials Science 1
- X-ray Diffraction in Crystallography 1
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- nanoparticles nucleation surface interactions 1
- Co-authors
- Olle BjörneholmN. MårtenssonAnders NilssonR. NyholmS. SvenssonA. AusmeesS. AkselaMarko Jurvansuu
In The Last Decade
J.-O. Forsell
8 papers receiving 958 citations
Peers
Comparison fields: 5 of 44
- Surfaces, Coatings and Films 246
- Atomic and Molecular Physics, and Optics 684
- Radiation 171
- Physical and Theoretical Chemistry 78
- Spectroscopy 119
Countries citing papers authored by J.-O. Forsell
This map shows the geographic impact of J.-O. Forsell's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J.-O. Forsell with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J.-O. Forsell more than expected).
Fields of papers citing papers by J.-O. Forsell
This network shows the impact of papers produced by J.-O. Forsell. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J.-O. Forsell. The network helps show where J.-O. Forsell may publish in the future.
Co-authorship network
The 25 scholars most cited alongside J.-O. Forsell, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2001 | 212 | |
| 2 | 2000 | 18 | |
| 3 | 1999 | 169 | |
| 4 | 1996 | 72 | |
| 5 | 1994 | 46 | |
| 6 | 1994 | 220 | |
| 7 | 1991 | 228 | |
| 8 | 1968 | 1 |
About J.-O. Forsell
J.-O. Forsell is a scholar working on Radiation, Surfaces, Coatings and Films, Geochemistry and Petrology, Condensed Matter Physics and Atomic and Molecular Physics, and Optics, having authored 8 papers that have together received 966 indexed citations. Recurring topics across this work include X-ray Spectroscopy and Fluorescence Analysis (5 papers), Electron and X-Ray Spectroscopy Techniques (4 papers), Advancements in Photolithography Techniques (2 papers), Advanced X-ray Imaging Techniques (2 papers), Mineralogy and Gemology Studies (1 paper), Catalytic Processes in Materials Science (1 paper), nanoparticles nucleation surface interactions (1 paper) and X-ray Diffraction in Crystallography (1 paper). The work is most often cited by research in Surfaces, Coatings and Films (246 citations), Atomic and Molecular Physics, and Optics (684 citations), Radiation (171 citations), Physical and Theoretical Chemistry (78 citations) and Spectroscopy (119 citations). J.-O. Forsell has collaborated with scholars based in Sweden, Finland and Estonia. Frequent co-authors include Olle Björneholm, N. Mårtensson, Anders Nilsson, R. Nyholm, S. Svensson, A. Ausmees, S. Aksela, Marko Jurvansuu, S. Sundin and B. Wannberg. Their work appears in journals such as Journal of Electron Spectroscopy and Related Phenomena, Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment, The Journal of Chemical Physics, Review of Scientific Instruments and Synchrotron Radiation News.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.