Moshe Gurfinkel

3.7k total citations · 2 hit papers
27 papers, 3.1k citations indexed

About

Moshe Gurfinkel is a scholar working on Electrical and Electronic Engineering, Cellular and Molecular Neuroscience and Polymers and Plastics. According to data from OpenAlex, Moshe Gurfinkel has authored 27 papers receiving a total of 3.1k indexed citations (citations by other indexed papers that have themselves been cited), including 22 papers in Electrical and Electronic Engineering, 4 papers in Cellular and Molecular Neuroscience and 4 papers in Polymers and Plastics. Recurrent topics in Moshe Gurfinkel's work include Semiconductor materials and devices (20 papers), Advancements in Semiconductor Devices and Circuit Design (18 papers) and Silicon Carbide Semiconductor Technologies (10 papers). Moshe Gurfinkel is often cited by papers focused on Semiconductor materials and devices (20 papers), Advancements in Semiconductor Devices and Circuit Design (18 papers) and Silicon Carbide Semiconductor Technologies (10 papers). Moshe Gurfinkel collaborates with scholars based in United States, Israel and France. Moshe Gurfinkel's co-authors include George G. Malliaras, Dion Khodagholy, Sébastien Sanaur, Thierry Hervé, P. Leleux, Róisı́n M. Owens, Esma Ismailova, Thomas Doublet, Pascale Quilichini and Christophe Bernard and has published in prestigious journals such as Advanced Materials, Nature Communications and Applied Physics Letters.

In The Last Decade

Moshe Gurfinkel

27 papers receiving 3.0k citations

Hit Papers

align trajectories

What are hit papers?

Hit papers significantly outperform the citation benchmark for their cohort. A paper qualifies if it has ≥500 total citations, achieves ≥1.5× the top-1% citation threshold for papers in the same subfield and year (this is the minimum needed to enter the top 1%, not the average within it), or reaches the top citation threshold in at least one of its specific research topics.

In vivo recordings of brain activity using organic transistors

2013 803 citations Dion Khodagholy, Thomas Doublet et al. Nature Communications profile →
High transconductance organic electrochemical transistors

2013 701 citations Dion Khodagholy, Jonathan Rivnay et al. Nature Communications profile →

Peers

Countries citing papers authored by Moshe Gurfinkel

Since Specialization

Citations

This map shows the geographic impact of Moshe Gurfinkel's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Moshe Gurfinkel with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Moshe Gurfinkel more than expected).

Fields of papers citing papers by Moshe Gurfinkel

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Moshe Gurfinkel. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Moshe Gurfinkel. The network helps show where Moshe Gurfinkel may publish in the future.

Co-authorship network of co-authors of Moshe Gurfinkel

This figure shows the co-authorship network connecting the top 25 collaborators of Moshe Gurfinkel. A scholar is included among the top collaborators of Moshe Gurfinkel based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Moshe Gurfinkel. Moshe Gurfinkel is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

#	Work	Indexed citations
1	In vivo recordings of brain activity using organic transistors breakdown → 2013 ·Nature Communications ·Dion Khodagholy, Thomas Doublet, Pascale Quilichini, Moshe Gurfinkel, P. Leleux, Antoine Ghestem, Esma Ismailova, Thierry Hervé, Sébastien Sanaur, Christophe Bernard, George G. Malliaras	803
2	High transconductance organic electrochemical transistors breakdown → 2013 ·Nature Communications ·Dion Khodagholy, Jonathan Rivnay, Michele Sessolo, Moshe Gurfinkel, P. Leleux, Leslie H. Jimison, Eleni Stavrinidou, Thierry Hervé, Sébastien Sanaur, Róisı́n M. Owens, George G. Malliaras	701
3	Measurement of Barrier Tissue Integrity with an Organic Electrochemical Transistor 2012 ·Advanced Materials ·Leslie H. Jimison, Scherrine A. Tria, Dion Khodagholy, Moshe Gurfinkel, Erica Lanzarini, Adel Hama, George G. Malliaras, Róisı́n M. Owens	150
4	Organic electrochemical transistor incorporating an ionogel as a solid state electrolyte for lactate sensing 2012 ·Journal of Materials Chemistry ·Dion Khodagholy, Vincenzo F. Curto, Kevin J. Fraser, Moshe Gurfinkel, Robert Byrne, Dermot Diamond, George G. Malliaras, Fernando Benito‐Lopez, Róisı́n M. Owens	242
5	Highly Conformable Conducting Polymer Electrodes for In Vivo Recordings 2011 ·Advanced Materials ·Dion Khodagholy, Thomas Doublet, Moshe Gurfinkel, Pascale Quilichini, Esma Ismailova, P. Leleux, Thierry Hervé, Sébastien Sanaur, Christophe Bernard, George G. Malliaras	295
6	Ion implantation and SiC transistor performance 2009 ·Journal of Applied Physics ·Moshe Gurfinkel, Siddharth Potbhare, Hao Xiong, John S. Suehle, Yoram Shapira, Aivars J. Lelis, Daniel B. Habersat, Neil Goldsman	9
7	Local Oscillations of On-Die Supply Voltage—A Reliability Issue 2009 ·IEEE Transactions on Device and Materials Reliability ·Moshe Gurfinkel, (unknown), (unknown), (unknown), J.B. Bernstein, Y. Shapira	3
8	Time Dependence of Bias-Stress-Induced SiC MOSFET Threshold-Voltage Instability Measurements 2008 ·IEEE Transactions on Electron Devices ·Aivars J. Lelis, Daniel B. Habersat, Ronald Green, Aderinto Ogunniyi, Moshe Gurfinkel, John S. Suehle, Neil Goldsman	267
9	Characterization of Transient Gate Oxide Trapping in SiC MOSFETs Using Fast $I$–$V$ Techniques 2008 ·IEEE Transactions on Electron Devices ·Moshe Gurfinkel, Hao Xiong, Kin P. Cheung, John S. Suehle, J.B. Bernstein, Yoram Shapira, Aivars J. Lelis, Daniel B. Habersat, Neil Goldsman	107
10	Stress-induced defect generation in HfO<inf>2</inf>/SiO<inf>2</inf> stacks observed by using charge pumping and low frequency noise measurements 2008 ·Hao Xiong, Dawei Heh, (unknown), Xiaoxiao Zhu, Moshe Gurfinkel, G. Bersuker, D.E. Ioannou, Curt A. Richter, Kin P. Cheung, John S. Suehle	11
11	Effect of SiC Power DMOSFET Threshold-Voltage Instability 2008 ·MRS Proceedings ·Aivars J. Lelis, Daniel B. Habersat, (unknown), Aderinto Ogunniyi, Moshe Gurfinkel, John S. Suehle, Neil Goldsman	4
12	Supply signal fluctuations due to chip power grid resonance — a new reliability concern 2008 ·Moshe Gurfinkel, (unknown), (unknown), (unknown), J.B. Bernstein, Y. Shapira	2
13	Energy- and Time-Dependent Dynamics of Trap Occupation in 4H-SiC MOSFETs 2008 ·IEEE Transactions on Electron Devices ·Siddharth Potbhare, Neil Goldsman, Akin Akturk, Moshe Gurfinkel, Aivars J. Lelis, (unknown)	33
14	Time-Dependent Dielectric Breakdown of 4H-SiC/$ \hbox{SiO}_{2}$ MOS Capacitors 2008 ·IEEE Transactions on Device and Materials Reliability ·Moshe Gurfinkel, (unknown), John S. Suehle, J.B. Bernstein, Yoram Shapira, Kevin Matocha, Greg Dunne, Richard Beaupre	56
15	Time dependence of bias-stress induced threshold-voltage instability measurements 2007 ·Aivars J. Lelis, Daniel B. Habersat, (unknown), Aderinto Ogunniyi, Moshe Gurfinkel, John S. Suehle, Neil Goldsman	3
16	Characterization of electrically active defects in high-k gate dielectrics by using low frequency noise and charge pumping measurements 2007 ·Microelectronic Engineering ·Hao Xiong, Dawei Heh, Moshe Gurfinkel, (unknown), Y. Shapira, Curt A. Richter, G. Bersuker, Rino Choi, John S. Suehle	47
17	Characterization of interface and bulk oxide traps in SiC MOSFETs with epitaxialy grown and implanted channels 2007 ·Moshe Gurfinkel, Jin-Woo Kim, Siddharth Potbhare, Hao Xiong, Kin P. Cheung, John S. Suehle, J.B. Bernstein, Yoram Shapira, Aivars J. Lelis, Daniel B. Habersat, Neil Goldsman	2
18	Study of leakage-induced photon emission processes in sub-90nm CMOS devices 2006 ·Solid-State Electronics ·(unknown), Moshe Gurfinkel, (unknown), (unknown), Y. Shapira, (unknown)	2
19	Study of hot-carrier-induced photon emission from 90nm Si MOSFETs 2005 ·Applied Surface Science ·Moshe Gurfinkel, (unknown), (unknown), (unknown), (unknown), (unknown), Yoram Shapira	8
20	Diagnostic imaging of breast cancer using fluorescence-enhanced optical tomography: phantom studies 2004 ·Journal of Biomedical Optics ·Anuradha Godavarty, Alan Bruce Thompson, Ranadhir Roy, Moshe Gurfinkel, Margaret J. Eppstein, (unknown), Eva M. Sevick‐Muraca	82

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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