Milton Ohring
Impact in
-
- Copper Interconnects and Reliability
-
- Semiconductor materials and devices
- Electronic Packaging and Soldering Technologies
Papers in
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- Copper Interconnects and Reliability 16
- Co-authors
- R. RosenbergRobert PfefferR. OswaldK. TaiR. F. KopfM. Lamont SchnoesA. P. PerleyG. Livescu
- Journals
- Journal of Applied Physics (9 papers)Thin Solid Films (6 papers)Review of Scientific Instruments (3 papers)Journal of Materials Science (2 papers)Solid State Communications (1 paper)
- Partner nations
- United StatesUnited KingdomRussia
In The Last Decade
Milton Ohring
39 papers receiving 1.3k citations
Peers
Comparison fields: 5 of 77
- Electronic, Optical and Magnetic Materials 400
- Electrical and Electronic Engineering 750
- Atomic and Molecular Physics, and Optics 373
- Materials Chemistry 498
- Ceramics and Composites 54
Countries citing papers authored by Milton Ohring
This map shows the geographic impact of Milton Ohring's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Milton Ohring with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Milton Ohring more than expected).
Fields of papers citing papers by Milton Ohring
This network shows the impact of papers produced by Milton Ohring. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Milton Ohring. The network helps show where Milton Ohring may publish in the future.
Co-authorship network
The 20 scholars most cited alongside Milton Ohring, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | Reliability and Failure of Electronic Materials and Devices, Second Edition | 2009 | 2 |
| 2 | Materials science of thin films : deposition and structure | 2002 | 428 |
| 3 | 2002 | 104 | |
| 4 | 1995 | 1 | |
| 5 | 1992 | 20 | |
| 6 | 1992 | 114 | |
| 7 | 1988 | 1 | |
| 8 | 1984 | 38 | |
| 9 | 1978 | 17 | |
| 10 | 1977 | 6 | |
| 11 | 1976 | 17 | |
| 12 | 1975 | 9 | |
| 13 | 1974 | 3 | |
| 14 | 1974 | 9 | |
| 15 | 1973 | 2 | |
| 16 | 1972 | 4 | |
| 17 | 1971 | 34 | |
| 18 | 1971 | 17 | |
| 19 | 1971 | 3 | |
| 20 | 1969 | 8 |
About Milton Ohring
Milton Ohring is a scholar working on Electronic, Optical and Magnetic Materials, Structural Biology, Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering and Surfaces, Coatings and Films, having authored 40 papers that have together received 1.3k indexed citations. Recurring topics across this work include Copper Interconnects and Reliability (16 papers), Electronic Packaging and Soldering Technologies (12 papers), Semiconductor materials and interfaces (11 papers), Surface and Thin Film Phenomena (8 papers), Semiconductor materials and devices (8 papers), Metal and Thin Film Mechanics (4 papers), Magnetic properties of thin films (4 papers) and Aluminum Alloy Microstructure Properties (2 papers). The work is most often cited by research in Electronic, Optical and Magnetic Materials (400 citations), Electrical and Electronic Engineering (750 citations), Atomic and Molecular Physics, and Optics (373 citations), Materials Chemistry (498 citations) and Ceramics and Composites (54 citations). Milton Ohring has collaborated with scholars based in United States, United Kingdom and Russia. Frequent co-authors include R. Rosenberg, Robert Pfeffer, R. Oswald, K. Tai, R. F. Kopf, M. Lamont Schnoes, A. P. Perley, G. Livescu, R. B. Laibowitz and Moshe Ron. Their work appears in journals such as Journal of Applied Physics, Thin Solid Films, Review of Scientific Instruments, Journal of Materials Science and Solid State Communications.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.