Michael Gerard Pecht
Impact in
- Automotive Engineering top 0.01%
- Advanced Battery Technologies Research
- Safety, Risk, Reliability and Quality top 0.01%
- Reliability and Maintenance Optimization
Papers in
-
- Reliability and Maintenance Optimization 208
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- Advanced Battery Technologies Research 160
- Co-authors
- Michael D. Osterman (102 shared papers)Yinjiao Xing (19 shared papers)Nicholas Williard (15 shared papers)Michael H. Azarian (100 shared papers)Kwok‐Leung Tsui (12 shared papers)Rui Xiong (11 shared papers)Hongwen He (7 shared papers)Yongzhi Zhang (7 shared papers)
- Journals
- Microelectronics Reliability (71 papers)IEEE Transactions on Components and Packaging Technologies (53 papers)IEEE Access (50 papers)IEEE Transactions on Device and Materials Reliability (40 papers)IEEE Transactions on Reliability (27 papers)
- Partner nations
- United StatesChinaHong Kong
In The Last Decade
Michael Gerard Pecht
1.1k papers receiving 42.3k citations
Michael Gerard Pecht's Hit Papers
Peers
Comparison fields: 5 of 149
- Automotive Engineering 14.2k
- Safety, Risk, Reliability and Quality 5.1k
- Control and Systems Engineering 5.3k
- Electrical and Electronic Engineering 6.7k
- Energy Engineering and Power Technology 113
Countries citing papers authored by Michael Gerard Pecht
This map shows the geographic impact of Michael Gerard Pecht's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Michael Gerard Pecht with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Michael Gerard Pecht more than expected).
Fields of papers citing papers by Michael Gerard Pecht
This network shows the impact of papers produced by Michael Gerard Pecht. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Michael Gerard Pecht. The network helps show where Michael Gerard Pecht may publish in the future.
Co-authors
The 25 scholars most cited alongside Michael Gerard Pecht, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 1.1k papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | Deep Residual Shrinkage Networks for Fault Diagnosis Hit paper breakdown → | 2019 | 1122 |
| 2 | Long Short-Term Memory Recurrent Neural Network for Remaining Useful Life Prediction of Lithium-Ion Batteries Hit paper breakdown → | 2018 | 1052 |
| 3 | Battery Lifetime Prognostics Hit paper breakdown → | 2020 | 1049 |
| 4 | Prognostics of lithium-ion batteries based on Dempster–Shafer theory and the Bayesian Monte Carlo method Hit paper breakdown → | 2011 | 910 |
| 5 | State of charge estimation of lithium-ion batteries using the open-circuit voltage at various ambient temperatures Hit paper breakdown → | 2013 | 814 |
| 6 | Prognostics and Health Management of Electronics Hit paper breakdown → | 2008 | 690 |
| 7 | Light emitting diodes reliability review Hit paper breakdown → | 2011 | 659 |
| 8 | An ensemble model for predicting the remaining useful performance of lithium-ion batteries Hit paper breakdown → | 2013 | 572 |
| 9 | Remaining Useful Life Estimation Based on a Nonlinear Diffusion Degradation Process Hit paper breakdown → | 2012 | 541 |
| 10 | Effect of Temperature on the Aging rate of Li Ion Battery Operating above Room Temperature Hit paper breakdown → | 2015 | 494 |
| 11 | Machine learning pipeline for battery state-of-health estimation Hit paper breakdown → | 2021 | 485 |
| 12 | Influence of different open circuit voltage tests on state of charge online estimation for lithium-ion batteries Hit paper breakdown → | 2016 | 479 |
| 13 | State of charge estimation for Li-ion batteries using neural network modeling and unscented Kalman filter-based error cancellation Hit paper breakdown → | 2014 | 460 |
| 14 | A review of fractional-order techniques applied to lithium-ion batteries, lead-acid batteries, and supercapacitors Hit paper breakdown → | 2018 | 447 |
| 15 | Remaining useful life prediction of lithium-ion battery with unscented particle filter technique Hit paper breakdown → | 2012 | 427 |
| 16 | Battery Management Systems in Electric and Hybrid Vehicles Hit paper breakdown → | 2011 | 426 |
| 17 | Motor Bearing Fault Detection Using Spectral Kurtosis-Based Feature Extraction Coupled With K -Nearest Neighbor Distance Analysis Hit paper breakdown → | 2015 | 423 |
| 18 | A review of lead-free solders for electronics applications Hit paper breakdown → | 2017 | 420 |
| 19 | 2013 | 400 | |
| 20 | 2018 | 382 |
About Michael Gerard Pecht
Michael Gerard Pecht is a scholar working on Safety, Risk, Reliability and Quality, Automotive Engineering, Electrical and Electronic Engineering, Control and Systems Engineering and Mechanical Engineering, having authored 1.1k papers that have together received 44.1k indexed citations. Recurring topics across this work include Electronic Packaging and Soldering Technologies (244 papers), Reliability and Maintenance Optimization (208 papers), Advanced Battery Technologies Research (160 papers), Machine Fault Diagnosis Techniques (69 papers), Electrical Contact Performance and Analysis (17 papers), Fault Detection and Control Systems (12 papers), Integrated Circuits and Semiconductor Failure Analysis (9 papers) and Silicon Carbide Semiconductor Technologies (8 papers). The work is most often cited by research in Automotive Engineering (14.2k citations), Safety, Risk, Reliability and Quality (5.1k citations), Control and Systems Engineering (5.3k citations), Electrical and Electronic Engineering (6.7k citations) and Energy Engineering and Power Technology (113 citations). Michael Gerard Pecht has collaborated with scholars based in United States, China and Hong Kong. Frequent co-authors include Michael D. Osterman, Yinjiao Xing, Nicholas Williard, Michael H. Azarian, Kwok‐Leung Tsui, Rui Xiong, Hongwen He, Yongzhi Zhang, Diganta Das and Baoping Tang. Their work appears in journals such as Microelectronics Reliability, IEEE Transactions on Components and Packaging Technologies, IEEE Access, IEEE Transactions on Device and Materials Reliability and IEEE Transactions on Reliability.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.