M. Schulz

1.5k citations

52 papers · 1.2k indexed · h-index 20

Impact in

Electrical and Electronic Engineering top 5%
- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Integrated Circuits and Semiconductor Failure Analysis
- Silicon and Solar Cell Technologies
- Thin-Film Transistor Technologies
Atomic and Molecular Physics, and Optics top 5%
- Semiconductor materials and interfaces

Papers in ⓘ

Electrical and Electronic Engineering 48
- Semiconductor materials and devices 26
- Silicon and Solar Cell Technologies 21
- Integrated Circuits and Semiconductor Failure Analysis 16
- Advancements in Semiconductor Devices and Circuit Design 14
- Thin-Film Transistor Technologies 5
- Chalcogenide Semiconductor Thin Films 5
Atomic and Molecular Physics, and Optics 20
- Semiconductor materials and interfaces 17
- Surface and Thin Film Phenomena 5

Co-authors: Gerhard Pensl (16 shared papers)M. J. Kirton (1 shared paper)Michael J. Uren (1 shared paper)H. P. Strunk (4 shared papers)Kay Hofmann (1 shared paper)K. Ploog (1 shared paper)E. Gmelin (1 shared paper)Renald Schaub (1 shared paper)
Journals: Applied Physics A (14 papers)Microelectronic Engineering (5 papers)Journal of Applied Physics (4 papers)Applied Physics Letters (3 papers)Applied Surface Science (2 papers)
Partner nations: Germany United States Belgium

In The Last Decade

M. Schulz

51 papers receiving 1.2k citations

Peers

Countries citing papers authored by M. Schulz

Since Specialization

Citations

This map shows the geographic impact of M. Schulz's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. Schulz with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. Schulz more than expected).

Fields of papers citing papers by M. Schulz

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by M. Schulz. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. Schulz. The network helps show where M. Schulz may publish in the future.

Co-authors

The 25 scholars most cited alongside M. Schulz, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with M. Schulz Line = papers co-authored together M. Schulz links everyone, so they are left out of the graph.

All Works

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20 of 20 papers shown

Showing the 20 most-cited of 52 papers — load more, or switch the sort, to bring in the rest.

#	Work
1	Nonuniformity correction and correctability of infrared focal plane arrays Infrared Physics & Technology ·M. Schulz, L. Caldwell	1995	126
2	Fluctuations of the Au-Si(100) Schottky barrier height Physical Review Letters ·Herbert Palm, M. Arbes, M. Schulz	1993	119
3	Individual defects at the Si:SiO₂interface Semiconductor Science and Technology ·M. J. Kirton, Michael J. Uren, S. Collins, M. Schulz, A. Karmann, K Scheffer	1989	89
4	Interface states at the SiO2-Si interface Surface Science ·M. Schulz	1983	88
5	Oxygen diffusion through thin Pt films on Si(100) Applied Physics A ·R. Schmiedl, V. Demuth, P. Lahnor, H. Godehardt, Y. Bodschwinna, C. Harder, Lutz Hammer, H. P. Strunk, M. Schulz, K. Heinz	1996	82
6	Coulomb energy of traps in semiconductor space-charge regions Journal of Applied Physics ·M. Schulz	1993	62
7	Random telegraph signal: An atomic probe of the local current in field-effect transistors Journal of Applied Physics ·H. H. Mueller, M. Schulz	1998	55
8	Assessment of persistent-photoconductivity centers in MBE grown Al x Ga1-x as using capacitance spectroscopy measurements Applied Physics A ·B.L. Zhou, K. Ploog, E. Gmelin, X. Q. Zheng, M. Schulz	1982	52
9	Duplex γ′ particle hardening of the superalloy Nimonic PE 16 Materials Science and Engineering ·Bernd Reppich, W. Kühlein, G. Meyer, Diethard Puppel, M. Schulz, G.O. Schumann	1986	50
10	Conductance modulation of submicrometer metal–oxide–semiconductor field-effect transistors by single-electron trapping Journal of Applied Physics ·H. H. Mueller, M. Schulz	1996	44
11	Evaluation of the Coulomb energy for single-electron interface trapping in sub-μm metal-oxide-semiconductor field-effect transistors Journal of Applied Physics ·H. H. Mueller, D. Wörle, M. Schulz	1994	40
12	Donor states in tellurium-doped silicon Applied Physics A ·Renald Schaub, Gerhard Pensl, M. Schulz, C. H. Holm	1984	36
13	Individual, attractive defect centers in the SiO2-Si interface of ?m-sized MOSFETs Applied Physics A ·M. Schulz, A. Karmann	1991	36
14	Trap spectrum of the ?new oxygen donor? in silicon Applied Physics A ·K. H�lzlein, Gerhard Pensl, M. Schulz	1984	34
15	Nanometer-microscopy of the electron transmission through an ultrathin (3?22 nm) Au film and of the Au-Si schottky barrier height Applied Physics A ·Herbert Palm, M. Arbes, M. Schulz	1993	31
16	Single, individual traps in MOSFETs Physica Scripta ·M. Schulz, A. Karmann	1991	24
17	Process‐Induced Interface and Bulk States in MOS Structures Journal of The Electrochemical Society ·Kay Hofmann, M. Schulz	1985	22
18	Infrared photoemission of holes from ultrathin (3?20 nm) Pt/Ir-compound silicide films into silicon Applied Physics A ·A. Czernik, Herbert Palm, Wolfgang A. Cabanski, M. Schulz, U. Suckow	1992	21
19	Fast computer-controlled deep level transient spectroscopy system for versatile applications in semiconductors Review of Scientific Instruments ·K. Hölzlein, Gerhard Pensl, M. Schulz, Peter Stolz	1986	21
20	New oxygen donors in silicon Applied Physics A ·Gerhard Pensl, M. Schulz, K. H�lzlein, W. Bergholz, J. L. Hutchison	1989	20

About M. Schulz

M. Schulz is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Computational Mechanics, Surfaces, Coatings and Films and Mechanical Engineering, having authored 52 papers that have together received 1.2k indexed citations. Recurring topics across this work include Semiconductor materials and devices (26 papers), Silicon and Solar Cell Technologies (21 papers), Semiconductor materials and interfaces (17 papers), Integrated Circuits and Semiconductor Failure Analysis (16 papers), Advancements in Semiconductor Devices and Circuit Design (14 papers), Surface and Thin Film Phenomena (5 papers), Thin-Film Transistor Technologies (5 papers) and Chalcogenide Semiconductor Thin Films (5 papers). The work is most often cited by research in Electrical and Electronic Engineering (993 citations), Atomic and Molecular Physics, and Optics (482 citations), Aerospace Engineering (124 citations), Surfaces, Coatings and Films (35 citations) and Structural Biology (7 citations). M. Schulz has collaborated with scholars based in Germany, United States and Belgium. Frequent co-authors include Gerhard Pensl, M. J. Kirton, Michael J. Uren, H. P. Strunk, Kay Hofmann, K. Ploog, E. Gmelin, Renald Schaub, C. H. Holm and K. Heinz. Their work appears in journals such as Applied Physics A, Microelectronic Engineering, Journal of Applied Physics, Applied Physics Letters and Applied Surface Science.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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