J.P. Krusius

1.0k citations
97 papers · 753 indexed · h-index 13

J.P. Krusius

81 papers receiving 693 citations

Peers

J.P. Krusius
Comparison fields: 5 of 61
  • Electrical and Electronic Engineering 620
  • Atomic and Molecular Physics, and Optics 180
  • Hardware and Architecture 38
  • Surfaces, Coatings and Films 39
  • Materials Chemistry 172
Replace G. Declerck with:
G. Declerck Belgium
G. Sarrabayrouse France
T. Kure Japan
H.L. Hughes United States
N. G. Tarr Canada
K.R. Hofmann Germany
D. Frohman‐Bentchkowsky Israel
T. Sugii Japan
L. Forbes United States
E. Augendre France
J.P. Krusius relative to G. Declerck Belgium G. Declerck's profile →
Citations per field
00.5×1.5×1.9×
G. Declerck · 1×
Citations per year

Countries citing papers authored by J.P. Krusius

Since Specialization
Citations

This map shows the geographic impact of J.P. Krusius's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J.P. Krusius with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J.P. Krusius more than expected).

Fields of papers citing papers by J.P. Krusius

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by J.P. Krusius. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J.P. Krusius. The network helps show where J.P. Krusius may publish in the future.

Co-authorship network

The 25 scholars most cited alongside J.P. Krusius, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with J.P. Krusius Line = papers co-authored together J.P. Krusius links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown
#Work
1 20030
2 20030
3 200210
4 20023
5 20023
6 20022
7 20020
8 20004
9 19990
10 19925
11 199112
12 19891
13 198720
14 19873
15 19861
16 198515
17 198421
18 19832
19 19834
20 19825

About J.P. Krusius

J.P. Krusius is a scholar working on Electrical and Electronic Engineering, Surfaces, Coatings and Films, Hardware and Architecture, Atomic and Molecular Physics, and Optics and Architecture, having authored 97 papers that have together received 753 indexed citations. Recurring topics across this work include Semiconductor materials and devices (40 papers), Advancements in Semiconductor Devices and Circuit Design (35 papers), 3D IC and TSV technologies (23 papers), VLSI and FPGA Design Techniques (15 papers), Semiconductor materials and interfaces (10 papers), Thin-Film Transistor Technologies (9 papers), Electronic Packaging and Soldering Technologies (9 papers) and Semiconductor Quantum Structures and Devices (8 papers). The work is most often cited by research in Electrical and Electronic Engineering (620 citations), Atomic and Molecular Physics, and Optics (180 citations), Hardware and Architecture (38 citations), Surfaces, Coatings and Films (39 citations) and Materials Chemistry (172 citations). J.P. Krusius has collaborated with scholars based in United States and Australia. Frequent co-authors include J. Nulman, A. Gat, S. Hashimoto, W. M. Gibson, L. J. Schowalter, L. G. Turner, R. W. Fathauer, Raymond P. Goehner, R. W. DeBlois and Peng Jin. Their work appears in journals such as IEEE Transactions on Electron Devices, Journal of The Electrochemical Society, IEEE Electron Device Letters, Applied Physics Letters and Journal of Vacuum Science & Technology A Vacuum Surfaces and Films.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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