Kyung Joong Kim

1.2k total citations
68 papers, 995 citations indexed

About

Kyung Joong Kim is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Computational Mechanics. According to data from OpenAlex, Kyung Joong Kim has authored 68 papers receiving a total of 995 indexed citations (citations by other indexed papers that have themselves been cited), including 45 papers in Electrical and Electronic Engineering, 32 papers in Materials Chemistry and 25 papers in Computational Mechanics. Recurrent topics in Kyung Joong Kim's work include Semiconductor materials and devices (26 papers), Ion-surface interactions and analysis (24 papers) and Electron and X-Ray Spectroscopy Techniques (23 papers). Kyung Joong Kim is often cited by papers focused on Semiconductor materials and devices (26 papers), Ion-surface interactions and analysis (24 papers) and Electron and X-Ray Spectroscopy Techniques (23 papers). Kyung Joong Kim collaborates with scholars based in South Korea, Germany and United States. Kyung Joong Kim's co-authors include Dae Won Moon, Jong Shik Jang, Sang-Joon Park, Woo Lee, Sunggi Baik, Sun Kyung Lee, Jung H. Shin, M. P. Seah, Jeong Won Kim and Hee Han and has published in prestigious journals such as Advanced Materials, Applied Physics Letters and Analytical Chemistry.

In The Last Decade

Kyung Joong Kim

65 papers receiving 967 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Kyung Joong Kim South Korea 18 583 578 206 168 167 68 995
A. Hadjadj France 19 549 0.9× 555 1.0× 112 0.5× 69 0.4× 44 0.3× 64 875
Alexander Diethert Germany 15 151 0.3× 304 0.5× 116 0.6× 93 0.6× 70 0.4× 22 647
Damien Jamon France 16 446 0.8× 254 0.4× 264 1.3× 84 0.5× 50 0.3× 86 814
J. Bertomeu Spain 20 930 1.6× 767 1.3× 198 1.0× 27 0.2× 52 0.3× 110 1.2k
B. K. Furman United States 16 577 1.0× 125 0.2× 145 0.7× 47 0.3× 140 0.8× 41 983
A. del Prado Spain 20 1.0k 1.7× 611 1.1× 151 0.7× 27 0.2× 86 0.5× 86 1.2k
Efthymios Klampaftis United Kingdom 16 903 1.5× 875 1.5× 139 0.7× 113 0.7× 18 0.1× 28 1.3k
F. Bouamrane France 12 311 0.5× 245 0.4× 153 0.7× 36 0.2× 39 0.2× 23 571
C. Summonte Italy 21 1.2k 2.0× 838 1.4× 332 1.6× 51 0.3× 65 0.4× 110 1.4k
Jan Mistrı́k Czechia 17 497 0.9× 442 0.8× 179 0.9× 117 0.7× 56 0.3× 64 903

Countries citing papers authored by Kyung Joong Kim

Since Specialization
Citations

This map shows the geographic impact of Kyung Joong Kim's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Kyung Joong Kim with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Kyung Joong Kim more than expected).

Fields of papers citing papers by Kyung Joong Kim

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Kyung Joong Kim. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Kyung Joong Kim. The network helps show where Kyung Joong Kim may publish in the future.

Co-authorship network of co-authors of Kyung Joong Kim

This figure shows the co-authorship network connecting the top 25 collaborators of Kyung Joong Kim. A scholar is included among the top collaborators of Kyung Joong Kim based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Kyung Joong Kim. Kyung Joong Kim is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Kim, Kyung Joong, et al.. (2024). Momentum Fourier ptychographic topography. Optics and Lasers in Engineering. 180. 108276–108276. 4 indexed citations
2.
Kim, Kyung Joong, et al.. (2023). Investigation of tetrakis(ethylmethylamido)hafnium adsorption mechanism in initial growth of atomic layer deposited-HfO2 thin films on H-/OH-terminated Si (100) surfaces. Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena. 41(6).
3.
Lee, Seung Mi, et al.. (2021). Uncertainty in the mutual calibration method for the traceable thickness measurement of ultra-thin oxide films. Metrologia. 58(3). 34002–34002. 2 indexed citations
4.
Kim, Tae Gun, et al.. (2021). Traceable quantitative analysis of Ag x Cu 1− x alloy films by ID ICP-MS, RBS and MEIS. Metrologia. 58(6). 65004–65004. 1 indexed citations
5.
Kim, Kyung Joong. (2021). Review on the thickness measurement of ultrathin oxide films by mutual calibration method. Surface and Interface Analysis. 54(4). 405–416. 4 indexed citations
6.
Kim, Tae Gun, et al.. (2019). High efficiency Si quantum dot heterojunction solar cells using a single SiO X :B layer. Nanotechnology. 30(32). 325404–325404. 5 indexed citations
7.
Kim, Kyung Joong, et al.. (2019). Traceable thickness measurement of ultra-thin HfO 2 films by medium-energy ion scattering spectroscopy. Metrologia. 57(2). 25001–25001. 7 indexed citations
8.
Yang, Sena, Ansoon Kim, Jaesung Park, et al.. (2018). Thermal annealing of black phosphorus for etching and protection. Applied Surface Science. 457. 773–779. 19 indexed citations
9.
Hodoroaba, Vasile‐Dan & Kyung Joong Kim. (2018). Measurement of Elemental Composition of FeNi and SiGe Thin Films by Electron Probe Microanalysis with Stratagem Software. Microscopy and Microanalysis. 24(S1). 758–759. 2 indexed citations
10.
Jang, Jong Shik, et al.. (2016). Improved electrical properties of silicon quantum dot layers for photovoltaic applications. Solar Energy Materials and Solar Cells. 150. 71–75. 12 indexed citations
11.
Kang, Namgoo, Kyung Joong Kim, Jin Seog Kim, & Joung Hae Lee. (2014). Roles of chemical metrology in electronics industry and associated environment in Korea: A tutorial. Talanta. 134. 284–291. 2 indexed citations
12.
Lee, Seung Mi, Kyung Joong Kim, Dae Won Moon, & Hanchul Kim. (2012). Optical and Electronic Properties of Hydrogenated Silicon Nanoclusters and Nitrogen Passivated Silicon Nanoclusters: A Density Functional Theory Study. Journal of Nanoscience and Nanotechnology. 12(7). 5835–5838. 1 indexed citations
13.
Wang, Dong Hwan, et al.. (2011). The effect of a concentration graded cathode for organic solar cells. Solar Energy Materials and Solar Cells. 95(8). 2443–2447. 8 indexed citations
14.
15.
Kim, Kyung Joong & M. P. Seah. (2007). Ultra‐thin SiO 2 on Si VIII. Accuracy of method, linearity and attenuation lengths for XPS. Surface and Interface Analysis. 39(6). 512–518. 30 indexed citations
16.
Kim, Kyung Joong, David S. Simons, & Greg Gillen. (2007). Quantitative depth profiling of an alternating Pt/Co multilayer and a Pt–Co alloy multilayer by SIMS using a Buckminsterfullerene (C60) source. Applied Surface Science. 253(14). 6000–6005. 18 indexed citations
17.
Kim, Kyung Joong, et al.. (2005). Thickness measurement of SiO2 films thinner than 1 nm by X-ray photoelectron spectroscopy. Thin Solid Films. 500(1-2). 356–359. 42 indexed citations
18.
19.
Kim, Kyung Joong. (2004). Two-frequency-dependent Gauss quadrature rules. Journal of Computational and Applied Mathematics. 174(1). 43–55. 8 indexed citations
20.
Moon, Dae Won, Y.H. Ha, Hyun‐Kyung Kim, et al.. (1999). Low sputter damage of metal single crystalline surfaces investigated with medium energy ion scattering spectroscopy. Applied Surface Science. 150(1-4). 235–243. 9 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

Explore authors with similar magnitude of impact

Breakdown of academic impact, for papers by A. Hadjadj Breakdown of academic impact, for papers by Alexander Diethert Breakdown of academic impact, for papers by Damien Jamon Breakdown of academic impact, for papers by J. Bertomeu Breakdown of academic impact, for papers by B. K. Furman Breakdown of academic impact, for papers by A. del Prado Breakdown of academic impact, for papers by Efthymios Klampaftis Breakdown of academic impact, for papers by F. Bouamrane Breakdown of academic impact, for papers by C. Summonte Breakdown of academic impact, for papers by Jan Mistrı́k
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2026