R.F. Egerton

19.6k total citations · 9 hit papers
207 papers, 15.1k citations indexed

About

R.F. Egerton is a scholar working on Surfaces, Coatings and Films, Structural Biology and Electrical and Electronic Engineering. According to data from OpenAlex, R.F. Egerton has authored 207 papers receiving a total of 15.1k indexed citations (citations by other indexed papers that have themselves been cited), including 155 papers in Surfaces, Coatings and Films, 83 papers in Structural Biology and 74 papers in Electrical and Electronic Engineering. Recurrent topics in R.F. Egerton's work include Electron and X-Ray Spectroscopy Techniques (151 papers), Advanced Electron Microscopy Techniques and Applications (83 papers) and X-ray Spectroscopy and Fluorescence Analysis (48 papers). R.F. Egerton is often cited by papers focused on Electron and X-Ray Spectroscopy Techniques (151 papers), Advanced Electron Microscopy Techniques and Applications (83 papers) and X-ray Spectroscopy and Fluorescence Analysis (48 papers). R.F. Egerton collaborates with scholars based in Canada, United States and Japan. R.F. Egerton's co-authors include Dale E. Newbury, Marek Malac, P. Li, Shangcong Cheng, T. Malis, Peter A. Crozier, Robert R. McLeod, Matthew Libera, Qingxia Liu and Zhenghe Xu and has published in prestigious journals such as Nature, Journal of the American Chemical Society and ACS Nano.

In The Last Decade

R.F. Egerton

198 papers receiving 14.8k citations

Hit Papers

Electron Energy-Loss Spec... 1987 2026 2000 2013 1987 2004 1996 2011 1988 500 1000 1.5k 2.0k 2.5k
What are hit papers?

Hit papers significantly outperform the citation benchmark for their cohort. A paper qualifies if it has ≥500 total citations, achieves ≥1.5× the top-1% citation threshold for papers in the same subfield and year (this is the minimum needed to enter the top 1%, not the average within it), or reaches the top citation threshold in at least one of its specific research topics.

  1. Electron Energy-Loss Spectroscopy in the Electron Microscope
    1987 2.9k citations R.F. Egerton et al. profile →
  2. Radiation damage in the TEM and SEM
    2004 1.6k citations R.F. Egerton, Marek Malac et al. Micron profile →
  3. Electron Energy-Loss Spectroscopy in the Electron Microscope
    1996 1.3k citations R.F. Egerton profile →
  4. Electron Energy-Loss Spectroscopy in the Electron Microscope
    2011 1.3k citations R.F. Egerton profile →
  5. EELS log‐ratio technique for specimen‐thickness measurement in the TEM
    1988 730 citations R.F. Egerton et al. profile →
  6. Electron energy-loss spectroscopy in the TEM
    2008 585 citations R.F. Egerton profile →
  7. Electron Energy-Loss Spectroscopy in the Electron Microscope
    1995 500 citations R.F. Egerton profile →
  8. Vibrational spectroscopy in the electron microscope
    2014 492 citations Ondrej L. Krivanek, Tracy C. Lovejoy et al. Nature profile →
  9. Radiation damage to organic and inorganic specimens in the TEM
    2019 307 citations R.F. Egerton Micron profile →

Author Peers

Peers are selected by citation overlap in the author's most active subfields. citations · hero ref

Author Last Decade Papers Cites
R.F. Egerton 7.0k 5.1k 5.0k 3.7k 2.7k 207 15.1k
Paul A. Midgley 8.6k 1.2× 3.1k 0.6× 3.4k 0.7× 3.6k 1.0× 2.0k 0.7× 356 17.3k
J. Silcox 4.4k 0.6× 2.1k 0.4× 3.3k 0.7× 1.8k 0.5× 2.4k 0.9× 176 9.3k
Rafal E. Dunin–Borkowski 8.2k 1.2× 2.0k 0.4× 6.0k 1.2× 2.8k 0.8× 4.7k 1.8× 656 18.6k
Nigel D. Browning 14.3k 2.1× 2.6k 0.5× 9.3k 1.8× 3.0k 0.8× 2.3k 0.9× 569 25.0k
C. Colliex 8.4k 1.2× 1.8k 0.3× 2.9k 0.6× 1.2k 0.3× 1.8k 0.7× 220 12.6k
G. Margaritondo 4.8k 0.7× 2.5k 0.5× 5.9k 1.2× 903 0.2× 6.0k 2.2× 713 15.1k
J. M. Cowley 3.6k 0.5× 2.7k 0.5× 1.6k 0.3× 2.7k 0.7× 2.2k 0.8× 369 9.0k
Peter Ercius 5.4k 0.8× 1.7k 0.3× 2.6k 0.5× 2.2k 0.6× 1.4k 0.5× 224 9.8k
Tetsuya Ishikawa 3.9k 0.6× 1.3k 0.3× 3.4k 0.7× 3.6k 1.0× 4.0k 1.5× 719 16.8k
Johan Verbeeck 6.5k 0.9× 1.5k 0.3× 4.7k 0.9× 1.9k 0.5× 3.2k 1.2× 337 13.0k

Countries citing papers authored by R.F. Egerton

Since Specialization
Citations

This map shows the geographic impact of R.F. Egerton's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by R.F. Egerton with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites R.F. Egerton more than expected).

Fields of papers citing papers by R.F. Egerton

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by R.F. Egerton. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by R.F. Egerton. The network helps show where R.F. Egerton may publish in the future.

Co-authorship network of co-authors of R.F. Egerton

This figure shows the co-authorship network connecting the top 25 collaborators of R.F. Egerton. A scholar is included among the top collaborators of R.F. Egerton based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with R.F. Egerton. R.F. Egerton is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Egerton, R.F.. (2025). Two- and three-dimensional electron imaging of beam-sensitive specimens. Micron. 194. 103819–103819. 2 indexed citations
2.
Hwang, Sooyeon, Lijun Wu, Kim Kisslinger, et al.. (2024). Secondary-electron imaging of bulk crystalline specimens in an aberration corrected STEM. Ultramicroscopy. 261. 113967–113967. 2 indexed citations
3.
Egerton, R.F., Yifan Wang, & Peter A. Crozier. (2023). Spatial Resolution in Aloof EELS. Microscopy and Microanalysis. 29(Supplement_1). 362–364.
4.
Egerton, R.F.. (2023). Voxel dose-limited resolution for thick beam-sensitive specimens imaged in a TEM or STEM. Micron. 177. 103576–103576. 3 indexed citations
5.
Malac, Marek, Patrick Price, Martin Cloutier, et al.. (2022). NanoMi: An open source electron microscope hardware and software platform. Micron. 163. 103362–103362. 5 indexed citations
6.
Egerton, R.F.. (2021). Radiation Damage and Nanofabrication in TEM and STEM. Microscopy Today. 29(3). 56–59. 29 indexed citations
7.
Chen, Sean, et al.. (2020). NanoMi - An Open Source Transmission Electron Microscope. OSF Preprints (OSF Preprints). 3 indexed citations
8.
Egerton, R.F.. (2017). Scattering delocalization and radiation damage in STEM-EELS. Ultramicroscopy. 180. 115–124. 60 indexed citations
9.
Egerton, R.F.. (2015). Vibrational-loss EELS and the avoidance of radiation damage. Ultramicroscopy. 159. 95–100. 41 indexed citations
10.
Egerton, R.F.. (2014). Choice of operating voltage for a transmission electron microscope. Ultramicroscopy. 145. 85–93. 113 indexed citations
11.
Krivanek, Ondrej L., Tracy C. Lovejoy, Niklas Dellby, et al.. (2014). Vibrational spectroscopy in the electron microscope. Nature. 514(7521). 209–212. 492 indexed citations breakdown →
12.
Wu, Lijun, R.F. Egerton, & Yimei Zhu. (2012). Image simulation for atomic resolution secondary electron image. Ultramicroscopy. 123. 66–73. 14 indexed citations
13.
Egerton, R.F.. (2011). TEM-EELS: A personal perspective. Ultramicroscopy. 119. 24–32. 9 indexed citations
14.
Zhang, H. R., R.F. Egerton, & Marek Malac. (2011). Local thickness measurement through scattering contrast and electron energy-loss spectroscopy. Micron. 43(1). 8–15. 71 indexed citations
15.
Wang, Feng, R.F. Egerton, & Marek Malac. (2009). Fourier-ratio deconvolution techniques for electron energy-loss spectroscopy (EELS). Ultramicroscopy. 109(10). 1245–1249. 27 indexed citations
16.
Malac, Marek, et al.. (2008). Low-dose performance of parallel-beam nanodiffraction. Ultramicroscopy. 109(1). 14–21. 10 indexed citations
17.
Malac, Marek, Marco Beleggia, R.F. Egerton, & Yimei Zhu. (2006). Bright-field TEM imaging of single molecules: Dream or near future?. Ultramicroscopy. 107(1). 40–49. 14 indexed citations
18.
Egerton, R.F., Brian Williams, & T. G. Sparrow. (1985). Fourier deconvolution of electron energy-loss spectra. Proceedings of the Royal Society of London A Mathematical and Physical Sciences. 398(1815). 395–404. 35 indexed citations
19.
Williams, Brian, T. G. Sparrow, & R.F. Egerton. (1984). Electron Compton scattering from solids. Proceedings of the Royal Society of London A Mathematical and Physical Sciences. 393(1805). 409–422. 35 indexed citations
20.
Egerton, R.F.. (1982). Electron energy-loss spectroscopy for elemental analysis. Philosophical Transactions of the Royal Society of London Series A Mathematical and Physical Sciences. 305(1491). 521–533. 4 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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