R.F. Egerton

19.6k total citations · 9 hit papers
207 papers, 15.1k citations indexed

About

R.F. Egerton is a scholar working on Surfaces, Coatings and Films, Structural Biology and Electrical and Electronic Engineering. According to data from OpenAlex, R.F. Egerton has authored 207 papers receiving a total of 15.1k indexed citations (citations by other indexed papers that have themselves been cited), including 155 papers in Surfaces, Coatings and Films, 83 papers in Structural Biology and 74 papers in Electrical and Electronic Engineering. Recurrent topics in R.F. Egerton's work include Electron and X-Ray Spectroscopy Techniques (151 papers), Advanced Electron Microscopy Techniques and Applications (83 papers) and X-ray Spectroscopy and Fluorescence Analysis (48 papers). R.F. Egerton is often cited by papers focused on Electron and X-Ray Spectroscopy Techniques (151 papers), Advanced Electron Microscopy Techniques and Applications (83 papers) and X-ray Spectroscopy and Fluorescence Analysis (48 papers). R.F. Egerton collaborates with scholars based in Canada, United States and Japan. R.F. Egerton's co-authors include Dale E. Newbury, Marek Malac, P. Li, Shangcong Cheng, T. Malis, Peter A. Crozier, Robert R. McLeod, Matthew Libera, Zhenghe Xu and Qingxia Liu and has published in prestigious journals such as Nature, Journal of the American Chemical Society and ACS Nano.

In The Last Decade

R.F. Egerton

198 papers receiving 14.8k citations

Hit Papers

5 papers align trajectories

What are hit papers?

Hit papers significantly outperform the citation benchmark for their cohort. A paper qualifies if it has ≥500 total citations, achieves ≥1.5× the top-1% citation threshold for papers in the same subfield and year (this is the minimum needed to enter the top 1%, not the average within it), or reaches the top citation threshold in at least one of its specific research topics.

Electron Energy-Loss Spectroscopy in the Electron Microscope

1987 2.9k citations R.F. Egerton et al. profile →
Radiation damage in the TEM and SEM

2004 1.6k citations R.F. Egerton, P. Li et al. Micron profile →
Electron Energy-Loss Spectroscopy in the Electron Microscope

1996 1.3k citations R.F. Egerton profile →
Electron Energy-Loss Spectroscopy in the Electron Microscope

2011 1.3k citations R.F. Egerton profile →
EELS log‐ratio technique for specimen‐thickness measurement in the TEM

1988 730 citations R.F. Egerton et al. profile →
Electron energy-loss spectroscopy in the TEM

2008 585 citations R.F. Egerton profile →
Electron Energy-Loss Spectroscopy in the Electron Microscope

1995 500 citations R.F. Egerton profile →
Vibrational spectroscopy in the electron microscope

2014 492 citations Ondrej L. Krivanek, Tracy C. Lovejoy et al. Nature profile →
Radiation damage to organic and inorganic specimens in the TEM

2019 307 citations R.F. Egerton Micron profile →

Peers

Countries citing papers authored by R.F. Egerton

Since Specialization

Citations

This map shows the geographic impact of R.F. Egerton's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by R.F. Egerton with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites R.F. Egerton more than expected).

Fields of papers citing papers by R.F. Egerton

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by R.F. Egerton. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by R.F. Egerton. The network helps show where R.F. Egerton may publish in the future.

Co-authorship network of co-authors of R.F. Egerton

This figure shows the co-authorship network connecting the top 25 collaborators of R.F. Egerton. A scholar is included among the top collaborators of R.F. Egerton based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with R.F. Egerton. R.F. Egerton is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

Sort: Min cites: Since: Top N: Style:

20 of 20 papers shown

#	Work	Indexed citations
1	NanoMi (ナノ美): An Open Source Electron Microscopy Platform 2025 ·Marek Malac, Makoto Schreiber, (unknown), (unknown), (unknown), Xuanhao Wang, (unknown), Patrick Price, Martin Cloutier, D. Vick, (unknown), R.F. Egerton, (unknown), Yoshio Takahashi, Heiko Müller	1
2	Secondary-electron imaging of bulk crystalline specimens in an aberration corrected STEM 2024 ·Ultramicroscopy ·Sooyeon Hwang, Lijun Wu, Kim Kisslinger, Judith C. Yang, R.F. Egerton, Yimei Zhu	2
3	Spatial Resolution in Aloof EELS 2023 ·Microscopy and Microanalysis ·R.F. Egerton, Yifan Wang, Peter A. Crozier	0
4	Radiation Damage and Nanofabrication in TEM and STEM 2021 ·Microscopy Today ·R.F. Egerton	29
5	NanoMi - An Open Source Transmission Electron Microscope 2020 ·OSF Preprints (OSF Preprints) ·(unknown), (unknown), (unknown), (unknown), (unknown), Sean Chen, (unknown), (unknown), Patrick Price, (unknown), (unknown), (unknown), (unknown), (unknown), (unknown), (unknown), (unknown), (unknown), (unknown), (unknown), (unknown), (unknown), Marek Malac, Martin Cloutier, (unknown), (unknown), R.F. Egerton	3
6	Thermal expansion coefficient measurement from electron diffraction of amorphous films in a TEM 2018 ·Ultramicroscopy ·Misa Hayashida, Kai Cui, Marek Malac, R.F. Egerton	9
7	Characterization of single-atom catalysts by EELS and EDX spectroscopy 2018 ·Ultramicroscopy ·R.F. Egerton, Masashi Watanabe	32
8	Scattering delocalization and radiation damage in STEM-EELS 2017 ·Ultramicroscopy ·R.F. Egerton	60
9	Vibrational spectroscopy in the electron microscope breakdown → 2014 ·Nature ·Ondrej L. Krivanek, Tracy C. Lovejoy, Niklas Dellby, Toshihiro Aoki, R. W. Carpenter, Peter Rez, Emmanuel Soignard, Jiangtao Zhu, Philip E. Batson, Maureen J. Lagos, R.F. Egerton, Peter A. Crozier	492
10	Choice of operating voltage for a transmission electron microscope 2014 ·Ultramicroscopy ·R.F. Egerton	113
11	Convenient contrast enhancement by a hole-free phase plate 2012 ·Ultramicroscopy ·Marek Malac, Marco Beleggia, Masahiro Kawasaki, Peng Li, R.F. Egerton	70
12	Fourier-ratio deconvolution and its Bayesian equivalent 2007 ·Micron ·R.F. Egerton, (unknown), Marek Malac, M. Sergio Moreno, Ferdinand Hofer	18
13	Bright-field TEM imaging of single molecules: Dream or near future? 2006 ·Ultramicroscopy ·Marek Malac, Marco Beleggia, R.F. Egerton, Yimei Zhu	14
14	Interpretation of the postpeak in iron fluorides and oxides 2006 ·Ultramicroscopy ·Feng Wang, R.F. Egerton, Marek Malac	6
15	Energy-loss near-edge fine structures of iron nanoparticles 2006 ·Micron ·Feng Wang, Marek Malac, R.F. Egerton	21
16	Radiation damage in coronene, rubrene and p-terphenyl, measured for incident electrons of kinetic energy between 100 and 200kev 2004 ·Ultramicroscopy ·P. Li, R.F. Egerton	34
17	Radiation damage in the TEM and SEM breakdown → 2004 ·Micron ·R.F. Egerton, P. Li, Marek Malac	1649
18	Fourier deconvolution of electron energy-loss spectra 1985 ·Proceedings of the Royal Society of London A Mathematical and Physical Sciences ·R.F. Egerton, Brian Williams, T. G. Sparrow	35
19	Electron Compton scattering from solids 1984 ·Proceedings of the Royal Society of London A Mathematical and Physical Sciences ·Brian Williams, T. G. Sparrow, R.F. Egerton	35
20	Electron energy-loss spectroscopy for elemental analysis 1982 ·Philosophical Transactions of the Royal Society of London Series A Mathematical and Physical Sciences ·R.F. Egerton	4

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

Explore authors with similar magnitude of impact