V. Soncini
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- Semiconductor materials and devices 14
- Integrated Circuits and Semiconductor Failure Analysis 13
- Silicon and Solar Cell Technologies 11
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- Silicon Nanostructures and Photoluminescence 8
- Electronic and Structural Properties of Oxides 3
- Diamond and Carbon-based Materials Research 2
- Computational Mechanics top 10%
- Ion-surface interactions and analysis 10
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- Semiconductor materials and interfaces 3
V. Soncini
23 papers receiving 391 citations
Peers
Comparison fields: 5 of 21
- Electrical and Electronic Engineering 364
- Materials Chemistry 244
- Computational Mechanics 96
- Atomic and Molecular Physics, and Optics 118
- Structural Biology 4
Countries citing papers authored by V. Soncini
This map shows the geographic impact of V. Soncini's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by V. Soncini with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites V. Soncini more than expected).
Fields of papers citing papers by V. Soncini
This network shows the impact of papers produced by V. Soncini. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by V. Soncini. The network helps show where V. Soncini may publish in the future.
Co-authorship network
The 25 scholars most cited alongside V. Soncini, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2016 | 4 | |
| 2 | 2014 | 1 | |
| 3 | 2012 | 3 | |
| 4 | 2012 | 1 | |
| 5 | 2007 | 6 | |
| 6 | 2004 | 50 | |
| 7 | 2003 | 24 | |
| 8 | Defect generation and suppression in device processes using a shallow trench isolation scheme | 2003 | 1 |
| 9 | 2003 | 9 | |
| 10 | 2003 | 3 | |
| 11 | 2003 | 10 | |
| 12 | 2003 | 35 | |
| 13 | 2003 | 32 | |
| 14 | 2003 | 5 | |
| 15 | 2003 | 22 | |
| 16 | 2003 | 44 | |
| 17 | 2002 | 40 | |
| 18 | 2002 | 1 | |
| 19 | 1998 | 12 | |
| 20 | 1992 | 6 |
About V. Soncini
V. Soncini is a scholar working on Computational Mechanics, Electrical and Electronic Engineering and Materials Chemistry, having authored 25 papers that have together received 399 indexed citations. Recurring topics across this work include Semiconductor materials and devices (14 papers), Integrated Circuits and Semiconductor Failure Analysis (13 papers), Silicon and Solar Cell Technologies (11 papers), Ion-surface interactions and analysis (10 papers), Silicon Nanostructures and Photoluminescence (8 papers), Semiconductor materials and interfaces (3 papers), Electronic and Structural Properties of Oxides (3 papers) and Diamond and Carbon-based Materials Research (2 papers). The work is most often cited by research in Electrical and Electronic Engineering (364 citations), Materials Chemistry (244 citations) and Computational Mechanics (96 citations). V. Soncini has collaborated with scholars based in Italy, Greece and France. Frequent co-authors include P. Normand, D. Tsoukalas, A. Claverie, E. Kapetanakis, Panagiotis Dimitrakis, S. Solmi, M. Bersani, D. Giubertoni, Caroline Bonafos and Aditya Agarwal. Their work appears in journals such as Materials Science and Engineering B, Applied Physics Letters, Journal of Applied Physics, Microelectronic Engineering and Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.