G. Pavia

799 total citations
46 papers, 658 citations indexed

About

G. Pavia is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, G. Pavia has authored 46 papers receiving a total of 658 indexed citations (citations by other indexed papers that have themselves been cited), including 33 papers in Electrical and Electronic Engineering, 18 papers in Materials Chemistry and 11 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in G. Pavia's work include Semiconductor materials and devices (23 papers), Integrated Circuits and Semiconductor Failure Analysis (15 papers) and Semiconductor materials and interfaces (10 papers). G. Pavia is often cited by papers focused on Semiconductor materials and devices (23 papers), Integrated Circuits and Semiconductor Failure Analysis (15 papers) and Semiconductor materials and interfaces (10 papers). G. Pavia collaborates with scholars based in Italy, Switzerland and Germany. G. Pavia's co-authors include M. Fanciulli, Claudia Wiemer, G. Scarel, Simon D. Elliott, S. Ferrari, Luca Lutterotti, A. Armigliato, R. Balboni, Stefano Frabboni and Sabina Spiga and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and Chemistry of Materials.

In The Last Decade

G. Pavia

46 papers receiving 635 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
G. Pavia Italy 12 495 358 127 89 63 46 658
Tobias Meyer Germany 13 288 0.6× 230 0.6× 218 1.7× 75 0.8× 41 0.7× 43 528
X.Z. Xu France 15 195 0.4× 273 0.8× 206 1.6× 154 1.7× 105 1.7× 35 533
Takaomi Matsutani Japan 13 308 0.6× 290 0.8× 26 0.2× 66 0.7× 63 1.0× 50 508
Emi Kano Japan 13 197 0.4× 240 0.7× 50 0.4× 68 0.8× 55 0.9× 32 408
Qichen Song United States 16 331 0.7× 921 2.6× 155 1.2× 217 2.4× 51 0.8× 24 1.0k
Yuji Suwa Japan 13 270 0.5× 199 0.6× 204 1.6× 117 1.3× 87 1.4× 54 525
S. Berkebile Austria 13 431 0.9× 232 0.6× 252 2.0× 35 0.4× 155 2.5× 18 570
J. D’Arcy-Gall United States 11 166 0.3× 365 1.0× 67 0.5× 71 0.8× 83 1.3× 14 496
E. Vicario France 9 329 0.7× 355 1.0× 69 0.5× 45 0.5× 26 0.4× 16 493
M. Kaiser Netherlands 14 752 1.5× 690 1.9× 244 1.9× 110 1.2× 356 5.7× 49 1.2k

Countries citing papers authored by G. Pavia

Since Specialization
Citations

This map shows the geographic impact of G. Pavia's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by G. Pavia with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites G. Pavia more than expected).

Fields of papers citing papers by G. Pavia

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by G. Pavia. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by G. Pavia. The network helps show where G. Pavia may publish in the future.

Co-authorship network of co-authors of G. Pavia

This figure shows the co-authorship network connecting the top 25 collaborators of G. Pavia. A scholar is included among the top collaborators of G. Pavia based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with G. Pavia. G. Pavia is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Kinyanjui, M. K., G. Benner, G. Pavia, et al.. (2015). Spatially and momentum resolved energy electron loss spectra from an ultra-thin PrNiO3 layer. Applied Physics Letters. 106(20). 4 indexed citations
2.
Lü, Hong-Liang, G. Scarel, Claudia Wiemer, et al.. (2008). Atomic Layer Deposition of NiO Films on Si(100) Using Cyclopentadienyl-Type Compounds and Ozone as Precursors. Journal of The Electrochemical Society. 155(10). H807–H807. 47 indexed citations
3.
Scarel, G., Claudia Wiemer, M. Fanciulli, et al.. (2007). [(Me3Si)2N]3Lu: Molecular Structure and Use as Lu and Si Source for Atomic Layer Deposition of Lu Silicate Films. Zeitschrift für anorganische und allgemeine Chemie. 633(11-12). 2097–2103. 25 indexed citations
4.
Molle, Alessandro, Claudia Wiemer, Mohammad Nazrul Islam Bhuiyan, et al.. (2007). Cubic-to-monoclinic phase transition during the epitaxial growth of crystalline Gd2O3 films on Ge(001) substrates. Applied Physics Letters. 90(19). 41 indexed citations
5.
Ghidini, G., Alberto Modelli, G. Pavia, et al.. (2006). High-k Materials in Flash Memories. ECS Transactions. 1(5). 91–105. 8 indexed citations
6.
Elliott, Simon D., G. Scarel, Claudia Wiemer, M. Fanciulli, & G. Pavia. (2006). Ozone-Based Atomic Layer Deposition of Alumina from TMA:  Growth, Morphology, and Reaction Mechanism. Chemistry of Materials. 18(16). 3764–3773. 161 indexed citations
7.
Armigliato, A., A. Spessot, R. Balboni, et al.. (2006). Convergent beam electron diffraction investigation of strain induced by Ti self-aligned silicides in shallow trench Si isolation structures. Journal of Applied Physics. 99(6). 13 indexed citations
8.
Moreau, O., et al.. (2006). Early detection of crystal defects in the device process flow by electron beam inspection. 334–339. 6 indexed citations
9.
El‐Baz, Ayman, et al.. (2004). Metrology issues in thin ONO stacks measurements by spectroscopic ellipsometry and X-ray reflectivity. Thin Solid Films. 450(1). 120–123. 4 indexed citations
10.
Wiemer, Claudia, et al.. (2003). Evolution of crystallographic ordering in Hf1−xAlxOy high-κ dielectric deposited by atomic layer deposition. Applied Physics Letters. 83(25). 5271–5273. 11 indexed citations
11.
Brambilla, Massimo, Monica Martinelli, G. Pavia, et al.. (2003). Defect generation and suppression in device processes using a shallow trench isolation scheme. BOA (University of Milano-Bicocca). 6. 477–488. 1 indexed citations
12.
Wiemer, Claudia, et al.. (2003). Effects of annealing temperature and surface preparation on the formation of cobalt silicide interconnects. Microelectronic Engineering. 70(2-4). 233–239. 7 indexed citations
13.
Polignano, M. L., A. Armigliato, R. Balboni, et al.. (2003). Dislocation Generation in Device Fabrication Process. Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena. 95-96. 439–446. 5 indexed citations
14.
Dekadjevi, D. T., Claudia Wiemer, Sabina Spiga, et al.. (2003). Monitoring the formation of Sb nanocrystals in SiO2 by grazing incidence x-ray techniques. Applied Physics Letters. 83(11). 2148–2150. 3 indexed citations
15.
Corni, Federico, et al.. (2002). In-situ time-resolved reflectivity: a technique useful to investigate solid-state transformations. Materials Science and Engineering B. 91-92. 96–99. 1 indexed citations
16.
Alessandri, M., D. T. Dekadjevi, Jan Willem Maes, et al.. (2002). Physical-Chemical Evolution upon Thermal Treatments of Al2O3, HfO2 and Al/Hf Composite Materials Deposited by ALCVD™. MRS Proceedings. 745. 2 indexed citations
17.
Armigliato, A., R. Balboni, Stefano Frabboni, et al.. (2001). Strain characterisation of shallow trench isolation structures on a nanometer scale by convergent beam electron diffraction. Materials Science in Semiconductor Processing. 4(1-3). 97–99. 8 indexed citations
18.
Casati, Giulio, et al.. (2001). Impact of plasma treatment time on MOCVD-TiN properties and on the electrical performance of deep contacts. Microelectronic Engineering. 55(1-4). 205–211. 1 indexed citations
19.
Corni, Federico, R. Tonini, Stefano Frabboni, et al.. (1999). Vacancy-Gettering in Silicon: Cavities and Helium-Implantation. Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena. 69-70. 229–234. 2 indexed citations
20.
Polignano, M. L., et al.. (1998). Denuded Zone Thickness from Surface Photovoltage Measurements: Comparison with Microscopy Techniques. Journal of The Electrochemical Society. 145(5). 1632–1639. 1 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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