M. Hecq
Impact in
- Mechanics of Materials top 1%
- Metal and Thin Film Mechanics
- Surfaces, Coatings and Films top 2%
Papers in
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- Semiconductor materials and devices 36
- Plasma Diagnostics and Applications 27
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- Metal and Thin Film Mechanics 59
- Co-authors
- J. P. Dauchot (64 shared papers)M. Wautelet (40 shared papers)Stéphanos Konstantinidis (9 shared papers)R. Gouttebaron (18 shared papers)Rony Snyders (16 shared papers)A. Ricard (12 shared papers)M. Ganciu (4 shared papers)Thomas Godfroid (9 shared papers)
In The Last Decade
M. Hecq
115 papers receiving 2.7k citations
Peers
Comparison fields: 5 of 76
- Mechanics of Materials 1.1k
- Surfaces, Coatings and Films 301
- Materials Chemistry 1.6k
- Electrical and Electronic Engineering 1.4k
- Computational Mechanics 350
Countries citing papers authored by M. Hecq
This map shows the geographic impact of M. Hecq's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. Hecq with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. Hecq more than expected).
Fields of papers citing papers by M. Hecq
This network shows the impact of papers produced by M. Hecq. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. Hecq. The network helps show where M. Hecq may publish in the future.
Co-authors
The 25 scholars most cited alongside M. Hecq, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 117 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2006 | 143 | |
| 2 | 2006 | 142 | |
| 3 | 2000 | 92 | |
| 4 | 2000 | 83 | |
| 5 | 2001 | 81 | |
| 6 | 2009 | 78 | |
| 7 | 2009 | 71 | |
| 8 | 2008 | 71 | |
| 9 | 2006 | 69 | |
| 10 | 2003 | 68 | |
| 11 | 2007 | 64 | |
| 12 | 2004 | 62 | |
| 13 | 1998 | 60 | |
| 14 | 1979 | 58 | |
| 15 | 2003 | 57 | |
| 16 | 2002 | 53 | |
| 17 | 2006 | 52 | |
| 18 | 2008 | 52 | |
| 19 | 2008 | 52 | |
| 20 | 1984 | 49 |
About M. Hecq
M. Hecq is a scholar working on Electrical and Electronic Engineering, Mechanics of Materials, Materials Chemistry, Computational Mechanics and Surfaces, Coatings and Films, having authored 117 papers that have together received 2.8k indexed citations. Recurring topics across this work include Metal and Thin Film Mechanics (59 papers), Semiconductor materials and devices (36 papers), Ion-surface interactions and analysis (33 papers), Plasma Diagnostics and Applications (27 papers), Diamond and Carbon-based Materials Research (18 papers), ZnO doping and properties (11 papers), Mass Spectrometry Techniques and Applications (11 papers) and Copper Interconnects and Reliability (11 papers). The work is most often cited by research in Mechanics of Materials (1.1k citations), Surfaces, Coatings and Films (301 citations), Materials Chemistry (1.6k citations), Electrical and Electronic Engineering (1.4k citations) and Computational Mechanics (350 citations). M. Hecq has collaborated with scholars based in Belgium, France and Germany. Frequent co-authors include J. P. Dauchot, M. Wautelet, Stéphanos Konstantinidis, R. Gouttebaron, Rony Snyders, A. Ricard, M. Ganciu, Thomas Godfroid, Carla Bittencourt and Damien Cossement. Their work appears in journals such as Surface and Coatings Technology, Thin Solid Films, Journal of Vacuum Science & Technology A Vacuum Surfaces and Films, Journal of Applied Physics and Plasma Processes and Polymers.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.