M. Bartur

516 citations
22 papers · 414 indexed · h-index 10

M. Bartur

19 papers receiving 390 citations

Peers

M. Bartur
Comparison fields: 5 of 29
  • Atomic and Molecular Physics, and Optics 300
  • Electrical and Electronic Engineering 292
  • Mechanical Engineering 111
  • Electronic, Optical and Magnetic Materials 52
  • Surfaces, Coatings and Films 18
Replace J. W. Honeycutt with:
J. W. Honeycutt United States
P. Kasiraj United States
M. Finetti Finland
S. Nygren Sweden
D. B. Fraser United States
A. Lahav Israel
S. Zirinsky United States
H. Kräutle Germany
S. Prussin United States
Z. Atzmon United States
M. Bartur relative to J. W. Honeycutt United States J. W. Honeycutt's profile →
Citations per field
00.5×3.5×
J. W. Honeycutt · 1×
Citations per year

Countries citing papers authored by M. Bartur

Since Specialization
Citations

This map shows the geographic impact of M. Bartur's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. Bartur with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. Bartur more than expected).

Fields of papers citing papers by M. Bartur

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by M. Bartur. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. Bartur. The network helps show where M. Bartur may publish in the future.

Co-authorship network

The 16 scholars most cited alongside M. Bartur, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with M. Bartur Line = papers co-authored together M. Bartur links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown
#Work
1 20130
2 20133
3 19913
4 19857
5 19840
6 19841
7 198430
8 19845
9 198441
10 19847
11 19849
12 19847
13 198319
14 198320
15 19831
16 19829
17 198216
18 198238
19 19820
20 198110

About M. Bartur

M. Bartur is a scholar working on Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering and Electronic, Optical and Magnetic Materials, having authored 22 papers that have together received 414 indexed citations. Recurring topics across this work include Semiconductor materials and interfaces (18 papers), Semiconductor materials and devices (12 papers), Silicon and Solar Cell Technologies (6 papers), Copper Interconnects and Reliability (5 papers), Integrated Circuits and Semiconductor Failure Analysis (4 papers), Intermetallics and Advanced Alloy Properties (4 papers), Silicon Nanostructures and Photoluminescence (3 papers) and Anodic Oxide Films and Nanostructures (3 papers). The work is most often cited by research in Atomic and Molecular Physics, and Optics (300 citations), Electrical and Electronic Engineering (292 citations) and Mechanical Engineering (111 citations). M. Bartur has collaborated with scholars based in United States and United Kingdom. Frequent co-authors include M.−A. Nicolet, M-A. Nicolet, M‐A. Nicolet, T.C. Banwell, Marc‐A. Nicolet, M. Finetti, I. Suni, M.‐A. Nicolet, A. Barcz and D. Nesset. Their work appears in journals such as Applied Physics Letters, Thin Solid Films, Journal of The Electrochemical Society, IEEE Electron Device Letters and Journal of Electronic Materials.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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