K. J. Wan
Impact in
- Surfaces, Coatings and Films top 5%
- Electron and X-Ray Spectroscopy Techniques
-
- Surface and Thin Film Phenomena
- Advanced Chemical Physics Studies
- Semiconductor materials and interfaces
- Magnetic properties of thin films
- Quantum and electron transport phenomena
Papers in
-
- Surface and Thin Film Phenomena 6
- Quantum and electron transport phenomena 3
- Advanced Chemical Physics Studies 3
- Journals
- Physical review. B, Condensed matter (5 papers)Surface Science (1 paper)Journal of Physics Conference Series (1 paper)Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena (1 paper)
- Partner nations
- United States
In The Last Decade
K. J. Wan
8 papers receiving 370 citations
Peers
Comparison fields: 5 of 20
- Surfaces, Coatings and Films 89
- Atomic and Molecular Physics, and Optics 355
- Structural Biology 14
- Condensed Matter Physics 30
- Materials Chemistry 86
Countries citing papers authored by K. J. Wan
This map shows the geographic impact of K. J. Wan's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by K. J. Wan with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites K. J. Wan more than expected).
Fields of papers citing papers by K. J. Wan
This network shows the impact of papers produced by K. J. Wan. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by K. J. Wan. The network helps show where K. J. Wan may publish in the future.
Co-authorship network
The 5 scholars most cited alongside K. J. Wan, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2011 | 3 | |
| 2 | 1994 | 55 | |
| 3 | 1993 | 109 | |
| 4 | 1993 | 28 | |
| 5 | 1993 | 6 | |
| 6 | 1993 | 45 | |
| 7 | 1992 | 66 | |
| 8 | 1992 | 65 |
About K. J. Wan
K. J. Wan is a scholar working on Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Biomedical Engineering, Condensed Matter Physics and Astronomy and Astrophysics, having authored 8 papers that have together received 377 indexed citations. Recurring topics across this work include Surface and Thin Film Phenomena (6 papers), Quantum and electron transport phenomena (3 papers), Advanced Materials Characterization Techniques (3 papers), Advanced Chemical Physics Studies (3 papers), Thermal properties of materials (1 paper), Superconductivity in MgB2 and Alloys (1 paper), Advanced Sensor Technologies Research (1 paper) and Solar and Space Plasma Dynamics (1 paper). The work is most often cited by research in Surfaces, Coatings and Films (89 citations), Atomic and Molecular Physics, and Optics (355 citations), Structural Biology (14 citations), Condensed Matter Physics (30 citations) and Materials Chemistry (86 citations). K. J. Wan has collaborated with scholars based in United States. Frequent co-authors include J. Nogami, X. F. Lin, John T. Yates, Kevin D. John and D. C. Braun. Their work appears in journals such as Physical review. B, Condensed matter, Surface Science, Journal of Physics Conference Series and Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.