J.R. Shih

848 total citations
72 papers, 679 citations indexed

About

J.R. Shih is a scholar working on Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, J.R. Shih has authored 72 papers receiving a total of 679 indexed citations (citations by other indexed papers that have themselves been cited), including 62 papers in Electrical and Electronic Engineering, 10 papers in Electronic, Optical and Magnetic Materials and 7 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in J.R. Shih's work include Semiconductor materials and devices (51 papers), Advancements in Semiconductor Devices and Circuit Design (38 papers) and Integrated Circuits and Semiconductor Failure Analysis (26 papers). J.R. Shih is often cited by papers focused on Semiconductor materials and devices (51 papers), Advancements in Semiconductor Devices and Circuit Design (38 papers) and Integrated Circuits and Semiconductor Failure Analysis (26 papers). J.R. Shih collaborates with scholars based in Taiwan, United States and China. J.R. Shih's co-authors include Tsung‐Shune Chin, Kaijie Wu, Tzay-Ming Hong, Ji‐Jung Kai, Rong‐Tan Huang, Fu‐Rong Chen, Dongsheng Huang, Jian‐Hsing Lee, T.C. Ong and Rakesh Ranjan and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and Journal of Physics D Applied Physics.

In The Last Decade

J.R. Shih

70 papers receiving 652 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
J.R. Shih Taiwan 13 544 164 124 58 29 72 679
G. Ribes France 14 924 1.7× 121 0.7× 55 0.4× 54 0.9× 14 0.5× 49 940
C. D’Emic United States 11 605 1.1× 197 1.2× 39 0.3× 115 2.0× 10 0.3× 15 630
R. Khamankar United States 11 590 1.1× 117 0.7× 87 0.7× 38 0.7× 6 0.2× 34 629
V. Khemka United States 15 676 1.2× 40 0.2× 47 0.4× 141 2.4× 88 3.0× 54 691
J. L. Garrett United States 7 237 0.4× 191 1.2× 244 2.0× 40 0.7× 190 6.6× 18 487
Ryosuke Iijima Japan 13 519 1.0× 73 0.4× 73 0.6× 84 1.4× 17 0.6× 70 565
Arash Hazeghi United States 8 290 0.5× 205 1.3× 42 0.3× 41 0.7× 46 1.6× 11 370
Jay R. Maddux United States 9 410 0.8× 244 1.5× 31 0.3× 50 0.9× 14 0.5× 16 508
Juin J. Liou United States 10 518 1.0× 49 0.3× 30 0.2× 42 0.7× 74 2.6× 35 568
Megan Snook United States 10 344 0.6× 127 0.8× 67 0.5× 81 1.4× 64 2.2× 31 383

Countries citing papers authored by J.R. Shih

Since Specialization
Citations

This map shows the geographic impact of J.R. Shih's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J.R. Shih with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J.R. Shih more than expected).

Fields of papers citing papers by J.R. Shih

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by J.R. Shih. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J.R. Shih. The network helps show where J.R. Shih may publish in the future.

Co-authorship network of co-authors of J.R. Shih

This figure shows the co-authorship network connecting the top 25 collaborators of J.R. Shih. A scholar is included among the top collaborators of J.R. Shih based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with J.R. Shih. J.R. Shih is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
2.
Liu, Hwa‐Dong, Bin‐Juine Huang, Wei-Yu Chen, & J.R. Shih. (2025). A solar energy system with a dual-input power converter and global MPPT for off-grid applications. Electric Power Systems Research. 243. 111497–111497. 2 indexed citations
3.
Liao, P. J., et al.. (2017). Study of junction degradation and lifetime assessment in FinFETs. 49. 2B–1.1. 3 indexed citations
4.
5.
Liao, P. J., et al.. (2016). Study of oxygen vacancy in high-k gate dielectric by charge injection technique. 4B–3. 1 indexed citations
6.
Huang, Dongsheng, et al.. (2014). Self-heating effect in FinFETs and its impact on devices reliability characterization. 4A.4.1–4A.4.4. 97 indexed citations
7.
Hsieh, Min-Hsiu, et al.. (2014). Frequency dependence of NBTI in high-k/metal-gate technology. XT.3.1–XT.3.5. 9 indexed citations
8.
Shih, J.R., et al.. (2013). Re-investigation of frequency dependence of PBTI/TDDB and its impact on fast switching logic circuits. 86. 4A.4.1–4A.4.5. 14 indexed citations
9.
Liao, P. J., et al.. (2013). A junction leakage mechanism and its effects on advance SRAM failure. 3E.1.1–3E.1.5. 4 indexed citations
10.
Leu, Len-Yi, et al.. (2012). Gate oxide reliability improvement for CMOS and MEMS monolithic integration. 5F.3.1–5F.3.6. 1 indexed citations
11.
12.
Shih, J.R., et al.. (2012). The failure mechanism re-investigation Of ESD device on EPI wafer. EL.2.1–EL.2.7. 6 indexed citations
13.
Huang, Yen-Hsiang, et al.. (2011). Investigation of the self-heating effect on hot-carrier characteristics for packaged high voltage devices. Symposium on VLSI Technology. 154–155. 4 indexed citations
14.
15.
Ranjan, Rakesh, et al.. (2011). Re-investigation of gate oxide breakdown on logic circuit reliability. 2A.4.1–2A.4.6. 10 indexed citations
16.
17.
Lee, Jian‐Hsing, et al.. (2007). The Impact of Ball-Bonding Induced Voltage Transient on Sub-90nm CMOS Technology. 97–101. 2 indexed citations
18.
Su, Yan‐Kuin, et al.. (2006). Effects of gate bias on hot-carrier reliability in drain extended metal-oxide-semiconductor transistors. Applied Physics Letters. 89(18). 19 indexed citations
19.
20.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

Explore authors with similar magnitude of impact

Breakdown of academic impact, for papers by G. Ribes Breakdown of academic impact, for papers by C. D’Emic Breakdown of academic impact, for papers by R. Khamankar Breakdown of academic impact, for papers by V. Khemka Breakdown of academic impact, for papers by J. L. Garrett Breakdown of academic impact, for papers by Ryosuke Iijima Breakdown of academic impact, for papers by Arash Hazeghi Breakdown of academic impact, for papers by Jay R. Maddux Breakdown of academic impact, for papers by Juin J. Liou Breakdown of academic impact, for papers by Megan Snook
Rankless by CCL
2026