Raymond P. Goehner
- Materials Chemistry
- Electrical and Electronic Engineering
- Mechanical Engineering
- Atomic and Molecular Physics, and Optics
- Electronic, Optical and Magnetic Materials
- Co-authors
- M. F. GarbauskasJ.P. KrusiusS. HashimotoW. M. GibsonR. W. DeBloisL. J. SchowalterL. G. TurnerR. W. Fathauer
- Topics
- X-ray Diffraction in Crystallography (14 papers)Electron and X-Ray Spectroscopy Techniques (8 papers)Force Microscopy Techniques and Applications (6 papers)
- Partner nations
- United StatesSwitzerlandGermany
In The Last Decade
Raymond P. Goehner
33 papers receiving 431 citations
Peers
Comparison fields: 5 of 63
- Materials Chemistry 240
- Electrical and Electronic Engineering 150
- Mechanical Engineering 91
- Atomic and Molecular Physics, and Optics 89
- Electronic, Optical and Magnetic Materials 73
Countries citing papers authored by Raymond P. Goehner
This map shows the geographic impact of Raymond P. Goehner's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Raymond P. Goehner with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Raymond P. Goehner more than expected).
Fields of papers citing papers by Raymond P. Goehner
This network shows the impact of papers produced by Raymond P. Goehner. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Raymond P. Goehner. The network helps show where Raymond P. Goehner may publish in the future.
Co-authorship network of co-authors of Raymond P. Goehner
This figure shows the co-authorship network connecting the top 25 collaborators of Raymond P. Goehner. A scholar is included among the top collaborators of Raymond P. Goehner based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Raymond P. Goehner. Raymond P. Goehner is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 1 | |
| 2 | 8 | |
| 3 | 4 | |
| 4 | 66 | |
| 5 | Crystallographic phase identification in the scanning electron microscope: Backscattered electron Kikuchi patterns | 3 |
| 6 | 0 | |
| 7 | 23 | |
| 8 | 4 | |
| 9 | 24 | |
| 10 | 21 | |
| 11 | 13 | |
| 12 | 1 | |
| 13 | 1 | |
| 14 | 9 | |
| 15 | 12 | |
| 16 | 1 | |
| 17 | 27 | |
| 18 | 1 | |
| 19 | 1 | |
| 20 | 11 |
About Raymond P. Goehner
Raymond P. Goehner is a scholar working on Surfaces, Coatings and Films, Structural Biology and Radiation, having authored 37 papers that have together received 464 indexed citations. Recurring topics across this work include X-ray Diffraction in Crystallography (14 papers), Electron and X-Ray Spectroscopy Techniques (8 papers) and Force Microscopy Techniques and Applications (6 papers). The work is most often cited by research in Surfaces, Coatings and Films (57 citations), Structural Biology (11 citations) and Materials Chemistry (240 citations). Raymond P. Goehner has collaborated with scholars based in United States, Switzerland and Germany. Frequent co-authors include M. F. Garbauskas, J.P. Krusius, S. Hashimoto, W. M. Gibson, R. W. DeBlois, L. J. Schowalter, L. G. Turner, R. W. Fathauer, Peng Jin and Michael O. Eatough. Their work appears in journals such as Journal of Applied Physics, Analytical Chemistry and Journal of The Electrochemical Society.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.