Jong Shik Jang

468 total citations
18 papers, 401 citations indexed

About

Jong Shik Jang is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Computational Mechanics. According to data from OpenAlex, Jong Shik Jang has authored 18 papers receiving a total of 401 indexed citations (citations by other indexed papers that have themselves been cited), including 16 papers in Electrical and Electronic Engineering, 10 papers in Materials Chemistry and 8 papers in Computational Mechanics. Recurrent topics in Jong Shik Jang's work include Semiconductor materials and devices (11 papers), Ion-surface interactions and analysis (8 papers) and Electron and X-Ray Spectroscopy Techniques (7 papers). Jong Shik Jang is often cited by papers focused on Semiconductor materials and devices (11 papers), Ion-surface interactions and analysis (8 papers) and Electron and X-Ray Spectroscopy Techniques (7 papers). Jong Shik Jang collaborates with scholars based in South Korea, Italy and China. Jong Shik Jang's co-authors include Kyung Joong Kim, Woo Lee, Sunggi Baik, Sang-Joon Park, Hyun Ryu, Hee Han, Chang Soo Kim, Hyunung Yu, Yong Jai Cho and Hee Jae Kang and has published in prestigious journals such as Analytical Chemistry, ACS Applied Materials & Interfaces and Applied Surface Science.

In The Last Decade

Jong Shik Jang

17 papers receiving 389 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Jong Shik Jang South Korea 10 264 257 74 48 48 18 401
Marco Sturaro Italy 11 250 0.9× 305 1.2× 153 2.1× 27 0.6× 64 1.3× 16 465
C. Мансилла Spain 11 200 0.8× 158 0.6× 61 0.8× 17 0.4× 45 0.9× 35 367
Ralph Kurt Switzerland 9 330 1.3× 119 0.5× 108 1.5× 48 1.0× 31 0.6× 12 414
D. Sarangi Switzerland 14 520 2.0× 231 0.9× 98 1.3× 78 1.6× 12 0.3× 32 621
Wai‐Kin Chim Singapore 7 240 0.9× 164 0.6× 175 2.4× 78 1.6× 17 0.4× 8 374
Michael Crouse United States 7 277 1.0× 204 0.8× 185 2.5× 41 0.9× 38 0.8× 21 381
Jerzy Rużyłło United States 11 324 1.2× 422 1.6× 90 1.2× 73 1.5× 27 0.6× 56 518
Jin Seung Lee South Korea 7 575 2.2× 153 0.6× 233 3.1× 80 1.7× 19 0.4× 8 619
Mohammad Reza Ahmadpour Monazam Austria 11 348 1.3× 116 0.5× 59 0.8× 65 1.4× 30 0.6× 14 414
Masayuki Ohya Japan 6 298 1.1× 83 0.3× 63 0.9× 168 3.5× 106 2.2× 10 367

Countries citing papers authored by Jong Shik Jang

Since Specialization
Citations

This map shows the geographic impact of Jong Shik Jang's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Jong Shik Jang with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Jong Shik Jang more than expected).

Fields of papers citing papers by Jong Shik Jang

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Jong Shik Jang. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Jong Shik Jang. The network helps show where Jong Shik Jang may publish in the future.

Co-authorship network of co-authors of Jong Shik Jang

This figure shows the co-authorship network connecting the top 25 collaborators of Jong Shik Jang. A scholar is included among the top collaborators of Jong Shik Jang based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Jong Shik Jang. Jong Shik Jang is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

18 of 18 papers shown
1.
Jang, Jong Shik, et al.. (2017). Quantitative analysis of Si1-xGex alloy films by SIMS and XPS depth profiling using a reference material. Applied Surface Science. 432. 72–77. 11 indexed citations
2.
Kim, Kyung Joong, Jong Shik Jang, J. Bennett, et al.. (2017). Round‐robin test for the measurement of layer thickness of multilayer films by secondary ion mass spectrometry depth profiling. Surface and Interface Analysis. 49(11). 1057–1063. 5 indexed citations
3.
Jang, Jong Shik, et al.. (2016). Improved electrical properties of silicon quantum dot layers for photovoltaic applications. Solar Energy Materials and Solar Cells. 150. 71–75. 12 indexed citations
4.
Jang, Jong Shik, et al.. (2016). Band engineering of a Si quantum dot solar cell by modification of B-doping profile. Solar Energy Materials and Solar Cells. 159. 80–85. 12 indexed citations
5.
Jang, Jong Shik, Hee Jae Kang, & Kyung Joong Kim. (2014). Mechanism of abnormal interface artifacts in SIMS depth profiling of a Si/Ge multilayer by oxygen ions. Surface and Interface Analysis. 46(S1). 267–271. 3 indexed citations
6.
Jang, Jong Shik, et al.. (2014). Determination of interface locations and layer thicknesses in SIMS and AES depth profiling of Si/Ti multilayer films by 50 at% definition. Surface and Interface Analysis. 46(S1). 272–275. 3 indexed citations
7.
Jang, Jong Shik, et al.. (2014). SIMS study on the improvement of electrical conductivity of a Si quantum dot layer by insertion of polycrystalline Si interlayers. Surface and Interface Analysis. 46(S1). 337–340.
8.
Jang, Jong Shik, et al.. (2014). SIMS depth profiling analysis of P‐doped n‐type Si layer to develop the Si QD solar cell. Surface and Interface Analysis. 46(S1). 341–343. 1 indexed citations
9.
Park, Sang-Joon, Jong Shik Jang, Hyunung Yu, et al.. (2013). In situcontrol of oxygen vacancies in TiO2by atomic layer deposition for resistive switching devices. Nanotechnology. 24(29). 295202–295202. 132 indexed citations
10.
Han, Hee, Sang-Joon Park, Jong Shik Jang, et al.. (2013). In Situ Determination of the Pore Opening Point during Wet-Chemical Etching of the Barrier Layer of Porous Anodic Aluminum Oxide: Nonuniform Impurity Distribution in Anodic Oxide. ACS Applied Materials & Interfaces. 5(8). 3441–3448. 100 indexed citations
11.
Jang, Jong Shik, et al.. (2013). Accurate quantification of Cu(In,Ga)Se2 films by AES depth profiling analysis. Applied Surface Science. 282. 777–781. 7 indexed citations
12.
Jang, Jong Shik, Hee Jae Kang, Yong‐Duck Chung, et al.. (2012). Quantitative analysis of Cu(In,Ga)Se2thin films by secondary ion mass spectrometry using a total number counting method. Metrologia. 49(4). 522–529. 9 indexed citations
13.
Kim, Yong‐Sung, Woo Lee, Young Heon Kim, et al.. (2011). Active doping of B in silicon nanostructures and development of a Si quantum dot solar cell. Nanotechnology. 22(42). 425203–425203. 34 indexed citations
14.
Kim, Kyung Joong, et al.. (2011). Thickness measurement of a thin hetero-oxide film with an interfacial oxide layer by X-ray photoelectron spectroscopy. Applied Surface Science. 258(8). 3552–3556. 13 indexed citations
15.
Kim, Kyung Joong, Jong Shik Jang, Dae Won Moon, & Hee Jae Kang. (2010). A method to determine the interface position and layer thickness in SIMS depth profiling of multilayer films. Metrologia. 47(3). 253–261. 20 indexed citations
16.
Kim, Kyung Joong, et al.. (2009). Determination of the Absolute Thickness of Ultrathin Al2O3 Overlayers on Si (100) Substrate. Analytical Chemistry. 81(20). 8519–8522. 21 indexed citations
17.
Kim, Kyung Joong, Yong‐Sung Kim, Jong Shik Jang, Jeong Won Kim, & Kyung Won Kim. (2008). A mutual calibration method to certify the thickness of nanometre oxide films. Metrologia. 45(5). 507–511. 11 indexed citations
18.
Kim, Kyung Joong, Jong Shik Jang, & Dae Won Moon. (2006). Accurate determination of the surface normal for the reliable measurement of ultra-thin SiO2 thickness by x-ray photoelectron spectroscopy. Metrologia. 43(5). L28–L32. 7 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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