Michael Crouse

616 total citations
21 papers, 381 citations indexed

About

Michael Crouse is a scholar working on Electrical and Electronic Engineering, Surfaces, Coatings and Films and Materials Chemistry. According to data from OpenAlex, Michael Crouse has authored 21 papers receiving a total of 381 indexed citations (citations by other indexed papers that have themselves been cited), including 16 papers in Electrical and Electronic Engineering, 9 papers in Surfaces, Coatings and Films and 6 papers in Materials Chemistry. Recurrent topics in Michael Crouse's work include Advancements in Photolithography Techniques (13 papers), Integrated Circuits and Semiconductor Failure Analysis (6 papers) and Electron and X-Ray Spectroscopy Techniques (6 papers). Michael Crouse is often cited by papers focused on Advancements in Photolithography Techniques (13 papers), Integrated Circuits and Semiconductor Failure Analysis (6 papers) and Electron and X-Ray Spectroscopy Techniques (6 papers). Michael Crouse collaborates with scholars based in United States, Netherlands and Belgium. Michael Crouse's co-authors include David T. Crouse, Yu‐Hwa Lo, A. E. Miller, Ataul Aziz Ikram, Albert E. Miller, Stephen Hsu, Yulu Chen, Obert R. Wood, Ryoung-Han Kim and N. Lustig and has published in prestigious journals such as Applied Physics Letters, Journal of The Electrochemical Society and SAE technical papers on CD-ROM/SAE technical paper series.

In The Last Decade

Michael Crouse

19 papers receiving 368 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Michael Crouse United States 7 277 204 185 47 41 21 381
Nicolò Chiodarelli Belgium 10 289 1.0× 167 0.8× 94 0.5× 16 0.3× 83 2.0× 21 381
Kurt Broderick United States 5 84 0.3× 216 1.1× 115 0.6× 5 0.1× 107 2.6× 7 328
G. S. Bocharov Russia 9 268 1.0× 84 0.4× 151 0.8× 7 0.1× 33 0.8× 37 337
L. C. Burton United States 12 344 1.2× 363 1.8× 62 0.3× 8 0.2× 91 2.2× 53 473
Daniel J. Ruebusch United States 6 320 1.2× 336 1.6× 394 2.1× 6 0.1× 98 2.4× 6 556
Zhipeng Tian United States 10 212 0.8× 128 0.6× 97 0.5× 8 0.2× 50 1.2× 14 339
Xia Yan Singapore 13 238 0.9× 289 1.4× 80 0.4× 3 0.1× 67 1.6× 28 428
Wei-Qi Huang China 11 259 0.9× 186 0.9× 194 1.0× 2 0.0× 93 2.3× 60 388
K. Ensslin Switzerland 5 347 1.3× 152 0.7× 120 0.6× 3 0.1× 83 2.0× 6 396

Countries citing papers authored by Michael Crouse

Since Specialization
Citations

This map shows the geographic impact of Michael Crouse's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Michael Crouse with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Michael Crouse more than expected).

Fields of papers citing papers by Michael Crouse

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Michael Crouse. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Michael Crouse. The network helps show where Michael Crouse may publish in the future.

Co-authorship network of co-authors of Michael Crouse

This figure shows the co-authorship network connecting the top 25 collaborators of Michael Crouse. A scholar is included among the top collaborators of Michael Crouse based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Michael Crouse. Michael Crouse is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Kajiwara, Kazuto, et al.. (2024). Affordable optical proximity correction runtime for EUV curvilinear mask tape-out flow. 28–28. 1 indexed citations
2.
Kaplan, Christopher J., Jeff Zhiqiang Lu, Michael Crouse, et al.. (2023). Physical dose modeling and throughput optimization in EUV computational lithography. 19–19. 1 indexed citations
3.
Crouse, Michael, Lars W. Liebmann, Yulu Chen, et al.. (2017). Design intent optimization at the beyond 7nm node: the intersection of DTCO and EUVL stochastic mitigation techniques. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 10148. 101480H–101480H. 10 indexed citations
4.
Kim, Ryoung-Han, et al.. (2016). Application of EUV resolution enhancement techniques (RET) to optimize and extend single exposure bi-directional patterning for 7nm and beyond logic designs. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 9776. 97761R–97761R. 17 indexed citations
5.
Terry, Mark A., et al.. (2015). A holistic methodology to drive process window entitlement and its application to 20nm logic. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 9427. 94270Z–94270Z. 1 indexed citations
6.
Halle, Scott, et al.. (2012). Lens heating challenges for negative tone develop layers with freeform illumination: a comparative study of experimental vs. simulated results. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 8326. 832607–832607. 9 indexed citations
7.
Koay, Chiew-Seng, Scott Halle, Steven J. Holmes, et al.. (2011). Towards manufacturing of advanced logic devices by double-patterning. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 7973. 79730F–79730F. 4 indexed citations
8.
Hunsche, S., Qian Zhao, Xu Xie, et al.. (2009). Improved model predictability by machine data in computational lithography and application to laser bandwidth tuning. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 7274. 727405–727405. 1 indexed citations
9.
Yamada, Yoshiaki, et al.. (2008). Enabling 35nm double patterning contact imaging using a novel CD shrink process. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 6924. 69242D–69242D. 1 indexed citations
10.
Liu, Huayu, Qian Zhao, Robert Socha, et al.. (2008). Separable OPC models for computational lithography. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 7028. 70280X–70280X. 6 indexed citations
11.
Crouse, Michael, et al.. (2007). Experimental demonstration of dark field illumination using contact hole features. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 25(6). 2453–2460. 2 indexed citations
12.
Ikram, Ataul Aziz, David T. Crouse, & Michael Crouse. (2006). Electrochemical fabrication of cadmium telluride quantum dots using porous anodized aluminum on a silicon substrate. Materials Letters. 61(17). 3666–3668. 5 indexed citations
13.
Crouse, David T. & Michael Crouse. (2006). Design and numerical modeling of normal-oriented quantum wire infrared photodetector array. Infrared Physics & Technology. 48(3). 227–234. 6 indexed citations
14.
Burns, Sean, Dirk Pfeiffer, Arpan P. Mahorowala, et al.. (2006). Silicon containing polymer in applications for 193 nm high NA lithography processes. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 6153. 61530K–61530K. 12 indexed citations
15.
Crouse, Michael, Albert E. Miller, David T. Crouse, & Ataul Aziz Ikram. (2005). Nanoporous Alumina Template with In Situ Barrier Oxide Removal, Synthesized from a Multilayer Thin Film Precursor. Journal of The Electrochemical Society. 152(10). D167–D167. 32 indexed citations
16.
Crouse, David T., Ataul Aziz Ikram, Albert E. Miller, & Michael Crouse. (2005). Design and fabrication of novel II-IV semiconductor quantum wire infrared detectors/sensors. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 5592. 296–296. 1 indexed citations
17.
Crouse, David T., Yu‐Hwa Lo, A. E. Miller, & Michael Crouse. (2003). Self-assembled nanostructures using anodized alumina thin films for optoelectronic applications. 1. 234–235. 1 indexed citations
18.
19.
Crouse, Michael. (2002). The Effects of Non-Petroleum Based Fuels on Thermoset Elastomers. SAE technical papers on CD-ROM/SAE technical paper series. 1. 7 indexed citations
20.
Crouse, David T., Yu‐Hwa Lo, A. E. Miller, & Michael Crouse. (2000). Self-ordered pore structure of anodized aluminum on silicon and pattern transfer. Applied Physics Letters. 76(1). 49–51. 260 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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