JD Ganière
About
In The Last Decade
JD Ganière
23 papers receiving 357 citations
Peers
Comparison fields: 5 of 36
- Atomic and Molecular Physics, and Optics 271
- Electrical and Electronic Engineering 210
- Materials Chemistry 133
- Biomedical Engineering 45
- Condensed Matter Physics 35
Countries citing papers authored by JD Ganière
This map shows the geographic impact of JD Ganière's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by JD Ganière with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites JD Ganière more than expected).
Fields of papers citing papers by JD Ganière
This network shows the impact of papers produced by JD Ganière. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by JD Ganière. The network helps show where JD Ganière may publish in the future.
Co-authorship network of co-authors of JD Ganière
This figure shows the co-authorship network connecting the top 25 collaborators of JD Ganière. A scholar is included among the top collaborators of JD Ganière based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with JD Ganière. JD Ganière is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 28 | |
| 2 | 2 | |
| 3 | 40 | |
| 4 | 64 | |
| 5 | 6 | |
| 6 | 19 | |
| 7 | 3 | |
| 8 | 10 | |
| 9 | 4 | |
| 10 | 7 | |
| 11 | 4 | |
| 12 | 1 | |
| 13 | 45 | |
| 14 | 1 | |
| 15 | Characterization by transmission electron microscopy of wedge shaped semiconductor samples | 3 |
| 16 | 48 | |
| 17 | Transmission and reflection electron microscopy on cleaved edges of III-V multilayered structures in evaluation of Advanced Semiconductor Materials by Electron Microscopy | 1 |
| 18 | 2 | |
| 19 | 19 | |
| 20 | 5 |
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.