Erik McCullen

616 total citations
23 papers, 539 citations indexed

About

Erik McCullen is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Materials Chemistry. According to data from OpenAlex, Erik McCullen has authored 23 papers receiving a total of 539 indexed citations (citations by other indexed papers that have themselves been cited), including 19 papers in Electrical and Electronic Engineering, 8 papers in Atomic and Molecular Physics, and Optics and 6 papers in Materials Chemistry. Recurrent topics in Erik McCullen's work include Semiconductor materials and devices (13 papers), Gas Sensing Nanomaterials and Sensors (8 papers) and Semiconductor materials and interfaces (4 papers). Erik McCullen is often cited by papers focused on Semiconductor materials and devices (13 papers), Gas Sensing Nanomaterials and Sensors (8 papers) and Semiconductor materials and interfaces (4 papers). Erik McCullen collaborates with scholars based in United States, United Kingdom and France. Erik McCullen's co-authors include Gregory W. Auner, Ronald J. Baird, Gina S. Shreve, R. G. Tobin, Ching‐Ling Hsu, R. Naik, Golam Newaz, K. Y. Simon Ng, J. S. Thakur and Jie Chen and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and Physical Review B.

In The Last Decade

Erik McCullen

22 papers receiving 533 citations

Peers

Erik McCullen

EEE

CMP

Sakari Sintonen Finland

Hsyi‐En Cheng Taiwan

Peng Zuo China

Dipak Paramanik India

Dominik Jaeger Switzerland

I. Dói Brazil

Soner Özen Türkiye

Volkan Şenay Türkiye

L. Imhoff France

Jow-Lay Huang Taiwan

Sakari Sintonen Finland

Erik McCullen

485 ×1.9

EEE

425 ×1.8

261 ×1.4

CMP

148 ×0.9

112 ×0.9

Citations per year, relative to Erik McCullen Erik McCullen (= 1×) peers Sakari Sintonen

Countries citing papers authored by Erik McCullen

Since Specialization

Citations

This map shows the geographic impact of Erik McCullen's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Erik McCullen with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Erik McCullen more than expected).

Fields of papers citing papers by Erik McCullen

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Erik McCullen. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Erik McCullen. The network helps show where Erik McCullen may publish in the future.

Co-authorship network of co-authors of Erik McCullen

This figure shows the co-authorship network connecting the top 25 collaborators of Erik McCullen. A scholar is included among the top collaborators of Erik McCullen based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Erik McCullen. Erik McCullen is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

Adhikari, Nirmal, et al.. (2020). A Novel Sample Preparation Approach for Dopant Profiling of 14 nm FinFET Devices with Scanning Capacitance Microscopy. Proceedings - International Symposium for Testing and Failure Analysis. 83348. 375–378. 1 indexed citations

McCullen, Erik, et al.. (2016). Intra-Device Defect Localization through EBIC/EBAC Combined with Electrical Nanoprobing for FinFET Devices Composed of Multiple Sub-Elements. Proceedings - International Symposium for Testing and Failure Analysis. 81368. 97–101. 3 indexed citations

Chen, Fen, et al.. (2015). Diagnostic electromigration reliability evaluation with a local sensing structure. 2D.4.1–2D.4.7. 4 indexed citations

Georgiev, Daniel G., et al.. (2012). Zinc nitride films prepared by reactive RF magnetron sputtering of zinc in nitrogen containing atmosphere. Journal of Physics D Applied Physics. 45(13). 135101–135101. 33 indexed citations

Gruzdev, Vitali E., et al.. (2009). Surface damage of thin AlN films with increased oxygen content by nanosecond and femtosecond laser pulses. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 7504. 750404–750404. 2 indexed citations

Baird, Ronald J., Erik McCullen, Golam Newaz, et al.. (2009). Chemical bond formation during laser bonding of Teflon® FEP and titanium. Applied Surface Science. 255(15). 7078–7083. 43 indexed citations

Baird, Ronald J., et al.. (2008). XPS analysis of aluminum nitride films deposited by plasma source molecular beam epitaxy. Surface and Interface Analysis. 40(9). 1254–1261. 297 indexed citations

Palyvoda, Olena, Andrey N. Bordenyuk, Achani K. Yatawara, et al.. (2008). Molecular Organization in SAMs Used for Neuronal Cell Growth. Langmuir. 24(8). 4097–4106. 22 indexed citations

McCullen, Erik, et al.. (2008). Investigation of the occupation behavior for oxygen atoms in AlN films using Raman spectroscopy. Journal of Applied Physics. 103(6). 12 indexed citations

10.

Thakur, J. S., Haripriya E. Prakasam, Linfeng Zhang, et al.. (2007). Characteristic jump in the electrical properties of aPd∕AlN∕Si-based device on exposure to hydrogen. Physical Review B. 75(7). 5 indexed citations

11.

Zhang, Linfeng, Erik McCullen, Haripriya E. Prakasam, et al.. (2006). Response transients in a Pd–Ni/AlN/n-Si hydrogen sensor. Sensors and Actuators B Chemical. 123(1). 277–282. 8 indexed citations

12.

Zhang, Linfeng, Erik McCullen, J. S. Thakur, et al.. (2005). Response to hydrogen of a metal/AlN/Si thin film structure: Effects of composition and structure of a combination Pd–Cr gate. Sensors and Actuators B Chemical. 113(2). 843–851. 13 indexed citations

13.

Zhang, Linfeng, Ibrahim A. Alhomoudi, Erik McCullen, et al.. (2005). Stabilized Pd-alloy/AlN/Si Hydrogen Sensors. MRS Proceedings. 872.

14.

Alhomoudi, Ibrahim A., Linfeng Zhang, Erik McCullen, et al.. (2004). Fabrication of Anatase TiO₂ Thin Film Using Pulsed DC Magnetron Sputtering. MRS Proceedings. 848. 2 indexed citations

15.

Rahman, Md. Habibur, K. Y. Simon Ng, Erik McCullen, et al.. (2004). Saturation and Flow Rate Effects on the Response of a Pd/AIN/SiC Hydrogen Sensor. MRS Proceedings. 815. 2 indexed citations

16.

Naik, R., G. M. Tsoĭ, Erik McCullen, et al.. (2004). Magnetic properties of iron-oxide and (iron, cobalt)-oxide nanoparticles synthesized in polystyrene resin matrix. Journal of Magnetism and Magnetic Materials. 272-276. E1239–E1241. 9 indexed citations

17.

Rimai, L., Md. Habibur Rahman, Erik McCullen, et al.. (2004). The Electrical Behavior of Pd/AIN/Semiconductor Thin Film Hydrogen Sensing Structures. MRS Proceedings. 815. 2 indexed citations

18.

McCullen, Erik, Haripriya E. Prakasam, Wenjun Mo, et al.. (2003). Electrical characterization of metal/AlN/Si thin film hydrogen sensors with Pd and Al gates. Journal of Applied Physics. 93(9). 5757–5762. 22 indexed citations

19.

Hsu, Ching‐Ling, Erik McCullen, & R. G. Tobin. (2003). Unusual adsorption kinetics of formic acid on Cu() studied by dc resistance and nonresonant infrared reflectance changes. Surface Science. 542(1-2). 120–128. 7 indexed citations

20.

McCullen, Erik, Ching‐Ling Hsu, & R. G. Tobin. (2001). Electron density changes and the surface resistivity of thin metal films: oxygen on Cu(100). Surface Science. 481(1-3). 198–204. 23 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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