D.J. Dumin

2.0k citations

75 papers · 1.6k indexed · h-index 23

Electrical and Electronic Engineering top 2%
- Semiconductor materials and devices 58
- Advancements in Semiconductor Devices and Circuit Design 32
- Thin-Film Transistor Technologies 29
- Integrated Circuits and Semiconductor Failure Analysis 16
- Silicon and Solar Cell Technologies 12
Materials Chemistry top 10%
- Silicon Nanostructures and Photoluminescence 14
- Electronic and Structural Properties of Oxides 8
Atomic and Molecular Physics, and Optics top 10%
- Semiconductor materials and interfaces 12
Electronic, Optical and Magnetic Materials
Condensed Matter Physics

Co-authors: R.S. Scott Jay R. Maddux P. H. Robinson G. L. Pearson George Brown B. Moore Ömer Oralkan Deniz Wong
Cited by: Electrical and Electronic Engineering Materials Chemistry Atomic and Molecular Physics, and Optics
Journals: IEEE Transactions on Electron Devices (15 papers)Journal of The Electrochemical Society (13 papers)Journal of Applied Physics (8 papers)
Partner nations: United States Japan Italy

In The Last Decade

D.J. Dumin

72 papers receiving 1.5k citations

Peers

Countries citing papers authored by D.J. Dumin

Since Specialization

Citations

This map shows the geographic impact of D.J. Dumin's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by D.J. Dumin with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites D.J. Dumin more than expected).

Fields of papers citing papers by D.J. Dumin

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by D.J. Dumin. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by D.J. Dumin. The network helps show where D.J. Dumin may publish in the future.

Co-authorship network

The 25 scholars most cited alongside D.J. Dumin, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with D.J. Dumin Line = papers co-authored together D.J. Dumin links everyone, so they are left out of the graph.

All Works

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20 of 20 papers shown

#	Work
1	Correlation of wearout and breakdown in sub-10 nm silicon oxide D.J. Dumin,Z. Wagner,Judith Szente,Hans-George Gohring,George Brown	2003	0
2	Polarity dependence of thin oxide wearout D.J. Dumin,Carlos Roberto Baluz Almeida,Yuri Monteiro Padovani,Huilin Lu	2003	3
3	Analysis of charge injection and trapping in MOS capacitors formed on p-type silicon substrates Judith Szente,D.J. Dumin	2003	0
4	Oxide Reliability D.J. Dumin	2002	51
5	Differentiation between electric breakdowns and dielectric breakdown in thin silicon oxides Michael Sanchez,T. Robinson,Ömer Oralkan,D.J. Dumin,George Brown	2002	1
6	The use of low-level pre-tunneling currents to characterize thin oxide wearout and breakdown D.J. Dumin,Jay R. Maddux,Maïr Verthuy,R.S. Scott,Deniz Wong	2002	1
7	The field, time and fluence dependencies of trap generation in silicon oxides between 5 and 13.5 nm thick Semiconductor Science and Technology ·光一湯瀬,D.J. Dumin	2000	7
8	Electric breakdowns and breakdown mechanisms in ultra-thin silicon oxides Microelectronics Reliability ·Michael Sanchez,Ömer Oralkan,D.J. Dumin,George Brown	1999	11
9	The Search for Cathode and Anode Traps in High‐Voltage Stressed Silicon Oxides Journal of The Electrochemical Society ·Laparra Muñoz,L M Chernina,Ömer Oralkan,D.J. Dumin,George Brown,P. Bellutti	1998	1
10	Limitations on oxide thicknesses in flash EEPROM applications P Massin,Leonard Stefan John,R.S. Scott,D.J. Dumin,Lie Liu,J. Emondts	1996	21
11	Wearout and Breakdown in Thin Silicon Oxide Journal of The Electrochemical Society ·D.J. Dumin	1995	21
12	Effects of nitrogen incorporation during growth on thin oxide wearout and breakdown Solid-State Electronics ·Marcela Quiroz Sodi,D.J. Dumin,L. Sansolone,J. J. Wortman,Le Ky Liem	1995	1
13	Low-level leakage currents in thin silicon oxide films Journal of Applied Physics ·D.J. Dumin,mediKUSS,Jay R. Maddux,R.S. Scott,Deniz Wong	1994	39
14	Comparison of the Density and Distribution of Traps Generated by High Voltage Stress in Silicon Oxide and Silicon Oxynitrides MRS Proceedings ·James T. Richardson,D.J. Dumin,G. Q. Lo,D. L. Kwong,B. Groß,C.G. Sodini	1992	4
15	Extrapolation of high-voltage stress measurements to low-voltage operation for thin silicon-oxide films IEEE Transactions on Reliability ·D.J. Dumin,Z. Wagner,George Brown	1991	22
16	VB-7 MOS transistors fabricated on multiple silicon-insulator layers IEEE Transactions on Electron Devices ·Miguel Alonso Velarde Mariño,Takeshi Yoshida,Toshihiro Kaneko,槙田裕加,D.J. Dumin	1984	2
17	Deep levels within the forbidden gap of silicon-on-sapphire films Solid-State Electronics ·D.J. Dumin	1970	30
18	Electrically and optically active defects in silicon-on-sapphire films Journal of Crystal Growth ·D.J. Dumin,P. H. Robinson	1968	19
19	Autodoping of Silicon Films Grown Epitaxially on Sapphire Journal of The Electrochemical Society ·D.J. Dumin,P. H. Robinson	1966	38
20	Application of Quantized Trapped Flux in a Superconducting Memory Journal of Applied Physics ·D.J. Dumin,J. F. Gibbons	1963	1

About D.J. Dumin

D.J. Dumin is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Atomic and Molecular Physics, and Optics, having authored 75 papers that have together received 1.6k indexed citations. Recurring topics across this work include Semiconductor materials and devices (58 papers), Advancements in Semiconductor Devices and Circuit Design (32 papers), Thin-Film Transistor Technologies (29 papers), Integrated Circuits and Semiconductor Failure Analysis (16 papers), Silicon Nanostructures and Photoluminescence (14 papers), Semiconductor materials and interfaces (12 papers), Silicon and Solar Cell Technologies (12 papers) and Electronic and Structural Properties of Oxides (8 papers). The work is most often cited by research in Electrical and Electronic Engineering (1.5k citations), Materials Chemistry (466 citations) and Atomic and Molecular Physics, and Optics (283 citations). D.J. Dumin has collaborated with scholars based in United States, Japan and Italy. Frequent co-authors include R.S. Scott, Jay R. Maddux, P. H. Robinson, G. L. Pearson, George Brown, B. Moore, Ömer Oralkan, Deniz Wong, Lie Liu and T. Robinson. Their work appears in journals such as IEEE Transactions on Electron Devices, Journal of The Electrochemical Society, Journal of Applied Physics, Solid-State Electronics and Journal of Crystal Growth.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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