Ian Swindells
Impact in
-
- Metal and Thin Film Mechanics
-
- Plasma Diagnostics and Applications
- CCD and CMOS Imaging Sensors
- Semiconductor materials and devices
Papers in
-
- Plasma Diagnostics and Applications 6
- CCD and CMOS Imaging Sensors 4
-
- Metal and Thin Film Mechanics 5
- Laser-induced spectroscopy and plasma 2
- Co-authors
- James W. Bradley (6 shared papers)S. K. Karkari (2 shared papers)A. R. Ellingboe (2 shared papers)Peter Kelly (3 shared papers)Paul Jerram (3 shared papers)Paul Jorden (2 shared papers)Paul M. Bryant (1 shared paper)Morgan R. Alexander (1 shared paper)
- Journals
- Surface and Coatings Technology (2 papers)Journal of Applied Physics (1 paper)The Journal of Physical Chemistry B (1 paper)New Journal of Physics (1 paper)Measurement Science and Technology (1 paper)
- Partner nations
- United KingdomIreland
In The Last Decade
Ian Swindells
12 papers receiving 178 citations
Peers
Comparison fields: 5 of 27
- Mechanics of Materials 74
- Electrical and Electronic Engineering 146
- Aerospace Engineering 46
- Instrumentation 6
- Surfaces, Coatings and Films 12
Countries citing papers authored by Ian Swindells
This map shows the geographic impact of Ian Swindells's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Ian Swindells with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Ian Swindells more than expected).
Fields of papers citing papers by Ian Swindells
This network shows the impact of papers produced by Ian Swindells. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Ian Swindells. The network helps show where Ian Swindells may publish in the future.
Co-authors
The 21 scholars most cited alongside Ian Swindells, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2007 | 57 | |
| 2 | 2012 | 22 | |
| 3 | 2014 | 20 | |
| 4 | 2006 | 19 | |
| 5 | 2007 | 17 | |
| 6 | 2008 | 16 | |
| 7 | 2007 | 13 | |
| 8 | 2018 | 8 | |
| 9 | 2008 | 5 | |
| 10 | 2014 | 4 | |
| 11 | 2018 | 1 | |
| 12 | 2023 | 1 |
About Ian Swindells
Ian Swindells is a scholar working on Electrical and Electronic Engineering, Mechanics of Materials, Aerospace Engineering, Biomedical Engineering and Materials Chemistry, having authored 12 papers that have together received 183 indexed citations. Recurring topics across this work include Plasma Diagnostics and Applications (6 papers), Metal and Thin Film Mechanics (5 papers), Infrared Target Detection Methodologies (4 papers), CCD and CMOS Imaging Sensors (4 papers), Diamond and Carbon-based Materials Research (2 papers), Calibration and Measurement Techniques (2 papers), Photocathodes and Microchannel Plates (2 papers) and Laser-induced spectroscopy and plasma (2 papers). The work is most often cited by research in Mechanics of Materials (74 citations), Electrical and Electronic Engineering (146 citations), Aerospace Engineering (46 citations), Instrumentation (6 citations) and Surfaces, Coatings and Films (12 citations). Ian Swindells has collaborated with scholars based in United Kingdom and Ireland. Frequent co-authors include James W. Bradley, S. K. Karkari, A. R. Ellingboe, Peter Kelly, Paul Jerram, Paul Jorden, Paul M. Bryant, Morgan R. Alexander, David Burt and Jason Gow. Their work appears in journals such as Surface and Coatings Technology, Journal of Applied Physics, The Journal of Physical Chemistry B, New Journal of Physics and Measurement Science and Technology.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.