H. W. Werner

3.2k total citations · 1 hit paper
57 papers, 2.3k citations indexed

About

H. W. Werner is a scholar working on Computational Mechanics, Electrical and Electronic Engineering and Radiation. According to data from OpenAlex, H. W. Werner has authored 57 papers receiving a total of 2.3k indexed citations (citations by other indexed papers that have themselves been cited), including 47 papers in Computational Mechanics, 19 papers in Electrical and Electronic Engineering and 15 papers in Radiation. Recurrent topics in H. W. Werner's work include Ion-surface interactions and analysis (46 papers), Electron and X-Ray Spectroscopy Techniques (14 papers) and Integrated Circuits and Semiconductor Failure Analysis (13 papers). H. W. Werner is often cited by papers focused on Ion-surface interactions and analysis (46 papers), Electron and X-Ray Spectroscopy Techniques (14 papers) and Integrated Circuits and Semiconductor Failure Analysis (13 papers). H. W. Werner collaborates with scholars based in Netherlands, United States and Germany. H. W. Werner's co-authors include A. Benninghoven, A. E. Morgan, F. Rüdenauer, H. A. M. de Grefte, N. Warmoltz, Andreas Huber, D. P. Oosthoek, W. K. Hofker, M. Grasserbauer and J. Giber and has published in prestigious journals such as The Journal of Chemical Physics, Journal of Applied Physics and Analytical Chemistry.

In The Last Decade

H. W. Werner

57 papers receiving 2.0k citations

Hit Papers

align trajectories

What are hit papers?

Hit papers significantly outperform the citation benchmark for their cohort. A paper qualifies if it has ≥500 total citations, achieves ≥1.5× the top-1% citation threshold for papers in the same subfield and year (this is the minimum needed to enter the top 1%, not the average within it), or reaches the top citation threshold in at least one of its specific research topics.

Secondary Ion Mass Spectrometry: Basic Concepts, Instrumental Aspects, Applications and Trends

1987 433 citations A. Benninghoven, F. Rüdenauer et al. profile →

Peers

Countries citing papers authored by H. W. Werner

Since Specialization

Citations

This map shows the geographic impact of H. W. Werner's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by H. W. Werner with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites H. W. Werner more than expected).

Fields of papers citing papers by H. W. Werner

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by H. W. Werner. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by H. W. Werner. The network helps show where H. W. Werner may publish in the future.

Co-authorship network of co-authors of H. W. Werner

This figure shows the co-authorship network connecting the top 25 collaborators of H. W. Werner. A scholar is included among the top collaborators of H. W. Werner based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with H. W. Werner. H. W. Werner is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

#	Work	Indexed citations
1	Analysis of microelectronic materials and devices 1991 ·Wiley eBooks ·M. Grasserbauer, H. W. Werner	57
2	Interface and thin film analysis: Comparison of methods, trends 1990 ·Analytical and Bioanalytical Chemistry ·H. W. Werner, A. Torrisi	6
3	Diagnostic techniques for failure analysis and reliability evaluation in VLSI technology 1990 ·Surface and Interface Analysis ·(unknown), H. W. Werner	3
4	Secondary ion mass spectrometry (SIMS VI) 1988 ·Analytica Chimica Acta ·A. Benninghoven, Andreas Huber, H. W. Werner	174
5	Secondary ion mass spectrometry (Chemical analysis, vol. 86.) 1987 ·Analytica Chimica Acta ·A. Benninghoven, F. Rüdenauer, H. W. Werner, F. Adams	15
6	Ion-induced spectroscopic methods for the analysis of surfaces, interfaces and thin films 1985 ·TrAC Trends in Analytical Chemistry ·H. W. Werner, (unknown)	3
7	Quantitative analysis of trace and major elements in thin sections of soils with the secondary ion microscope (Cameca) 1983 ·Geoderma ·E.B.A. Bisdom, S. Henstra, H. W. Werner, (unknown), W.F. Knippenberg, H. A. M. de Grefte, (unknown), H.‐N. Migeon	7
8	Secondary Ion Mass Spectrometry SIMS III 1982 ·CERN Document Server (European Organization for Nuclear Research) ·A. Benninghoven, J. Giber, (unknown), (unknown), H. W. Werner	100
9	The depth dependence of the depth resolution in sputter profiling 1982 ·Surface and Interface Analysis ·H. W. Werner	44
10	Modern methods for thin film and surface analyses 1980 ·Materials Science and Engineering ·H. W. Werner	24
11	SIMS Analysis of Aqueous Corrosion Profiles in Soda‐Lime‐Silica Glass 1979 ·Journal of the American Ceramic Society ·(unknown), H. A. M. de Grefte, H. W. Werner	43
12	Quantitative analysis of low alloy steels by secondary ion mass spectrometry 1976 ·Analytical Chemistry ·A. E. Morgan, H. W. Werner	86
13	Secondary ion mass spectrometry of compositional changes in garnet films 1975 ·Journal of Crystal Growth ·(unknown), A. E. Morgan, H. W. Werner	13
14	A study on the maximum tolerable pressure in a residual gas analyzer 1974 ·Journal of Vacuum Science and Technology ·H. W. Werner, (unknown)	4
15	Theoretical and experimental aspects of secondary ion mass spectrometry 1974 ·Vacuum ·H. W. Werner	92
16	Application of characteristic secondary ion mass spectra to a depth analysis of copper oxide on copper 1973 ·Radiation Effects ·H. W. Werner, H. A. M. de Grefte, (unknown)	37
17	The measurement of small ion currents with the aid of photomultipliers 1972 ·International Journal of Mass Spectrometry and Ion Physics ·H. W. Werner, H. A. M. de Grefte, J. van den Berg	11
18	Application of Various Methods for the Determination of Adsorption Lifetime and Desorption Energy of Oxygen on Tungsten 1972 ·Journal of Vacuum Science and Technology ·H.‐W. Wassmuth, H. W. Werner, A. Mazumdar	5
19	Instrumental aspects of secondary ion mass spectrometry and secondary ion imaging mass spectrometry 1972 ·Vacuum ·H. W. Werner	14
20	Design of a Small Magnetic-Sector Mass Spectrometer with Reduced Mass Discrimination 1972 ·Journal of Vacuum Science and Technology ·H. W. Werner, (unknown), (unknown)	5

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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