Emil Pinčík

698 total citations
84 papers, 573 citations indexed

About

Emil Pinčík is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, Emil Pinčík has authored 84 papers receiving a total of 573 indexed citations (citations by other indexed papers that have themselves been cited), including 76 papers in Electrical and Electronic Engineering, 48 papers in Materials Chemistry and 28 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in Emil Pinčík's work include Semiconductor materials and devices (43 papers), Silicon Nanostructures and Photoluminescence (42 papers) and Thin-Film Transistor Technologies (31 papers). Emil Pinčík is often cited by papers focused on Semiconductor materials and devices (43 papers), Silicon Nanostructures and Photoluminescence (42 papers) and Thin-Film Transistor Technologies (31 papers). Emil Pinčík collaborates with scholars based in Slovakia, Japan and Czechia. Emil Pinčík's co-authors include Hikaru Kobayashi, I. Thurzo, J. Ivančo, G. Margaritondo, J. Almeida, Milan Mikula, Martin Kopáni, Masatoshi Takahashi, M. Jergel and Róbert Brunner and has published in prestigious journals such as Physical review. B, Condensed matter, Applied Physics Letters and Journal of Applied Physics.

In The Last Decade

Emil Pinčík

77 papers receiving 558 citations

Peers

Emil Pinčík

EEE

AMPO

Kunisuke Maki Japan

J. Ivančo Slovakia

Alexander V. Vasiliev Russia

S. Bäder Germany

Ami Chand India

Daisuke Yamashita Japan

Dezhang Zhu China

Ilsoo Kim South Korea

H. C. Yang Taiwan

Christoph Meinecke Germany

Kunisuke Maki Japan

Emil Pinčík

244 ×0.8

EEE

267 ×1.2

160 ×1.2

AMPO

86 ×0.7

47 ×0.5

Citations per year, relative to Emil Pinčík Emil Pinčík (= 1×) peers Kunisuke Maki

Countries citing papers authored by Emil Pinčík

Since Specialization

Citations

This map shows the geographic impact of Emil Pinčík's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Emil Pinčík with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Emil Pinčík more than expected).

Fields of papers citing papers by Emil Pinčík

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Emil Pinčík. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Emil Pinčík. The network helps show where Emil Pinčík may publish in the future.

Co-authorship network of co-authors of Emil Pinčík

This figure shows the co-authorship network connecting the top 25 collaborators of Emil Pinčík. A scholar is included among the top collaborators of Emil Pinčík based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Emil Pinčík. Emil Pinčík is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

Pinčík, Emil, et al.. (2020). Optical properties of electrochemically etched N-type silicon wafers for solar cell applications. Journal of Electrical Engineering. 71(6). 406–412. 1 indexed citations

Müllerová, Jarmila, et al.. (2018). Angle- and polarization resolved antireflection properties of black silicon prepared by electrochemical etching supported by external electric field. Applied Surface Science. 461. 182–189. 14 indexed citations

Pinčík, Emil & Taketoshi Matsumoto. (2018). Progress in applied surface, interface and thin film science 2017. Applied Surface Science. 461. 1–2. 1 indexed citations

Kopáni, Martin, Milan Mikula, Emil Pinčík, H. Kobayashi, & Masatoshi Takahashi. (2014). FT IR spectroscopy of nitric acid oxidation of silicon with hafnium oxide very thin layer. Applied Surface Science. 301. 24–27. 17 indexed citations

Pinčík, Emil, Hikaru Kobayashi, Masao Takahashi, Róbert Brunner, & Stanislav Jurečka. (2013). Passivation of a-Si:H-based structures in KCN and HCN solutions and its application on p-i-n solar cell. 1(2). 151–165. 1 indexed citations

Jurečka, Stanislav, Hikaru Kobayashi, Masao Takahashi, Taketoshi Matsumoto, & Emil Pinčík. (2012). Properties of charge states in MOS structure with ultrathin oxide layer. Applied Surface Science. 258(21). 8409–8414. 3 indexed citations

Denecke, R., J. Korecki, Emil Pinčík, Pavel Jelı́nek, & Krzysztof Malarz. (2009). Solid state surfaces and interfaces. Open Physics. 7(2). 207–208.

Pinčík, Emil, et al.. (2007). Photoluminescence of very thin oxide/a-Si:H structures passivated in HCN solutions. Applied Surface Science. 254(12). 3710–3714. 7 indexed citations

Pinčík, Emil, J Bartoš, Róbert Brunner, & J. Ivančo. (2003). A study of Al/Si3N4/ultrathin Si/GaAs structures by DLTS and C–V measurements. Thin Solid Films. 433(1-2). 352–358. 3 indexed citations

10.

Mikula, Milan, et al.. (2000). Electrical and optical properties of copper nitride thin films prepared by reactive D C magnetron sputtering. 51(1). 35–43. 7 indexed citations

11.

Durný, R., Emil Pinčík, Vojtěch Nádaždy, et al.. (2000). Very thin insulating layer formed by low-energy Ar-beam bombardment in the surface region of undoped hydrogenated amorphous silicon. Applied Physics Letters. 77(12). 1783–1785. 11 indexed citations

12.

Nádaždy, Vojtěch, R. Durný, Emil Pinčík, et al.. (2000). Spatial distribution of dangling bonds in undoped hydrogenated amorphous silicon observed by solid-state voltcoulometry. Journal of Non-Crystalline Solids. 266-269. 558–564. 2 indexed citations

13.

Swaaij, R.A.C.M.M. van, Vojtěch Nádaždy, Miro Zeman, Emil Pinčík, & J.W. Metselaar. (2000). Defect re-distribution in amorphous silicon below equilibration temperature. Journal of Non-Crystalline Solids. 266-269. 553–557. 4 indexed citations

14.

Jergel, M., Petr Mikulı́k, E. Majková, et al.. (1999). Structural characterization of a lamellar W/Si multilayer grating. Journal of Applied Physics. 85(2). 1225–1227. 7 indexed citations

15.

Nádaždy, Vojtěch, R. Durný, I. Thurzo, & Emil Pinčík. (1998). New experimental facts on the Staebler–Wronski effect. Journal of Non-Crystalline Solids. 227-230. 316–319. 10 indexed citations

16.

Pinčík, Emil, et al.. (1997). The influence of the inductively-coupled hydrogen plasma on the GaAs surface properties. Thin Solid Films. 299(1-2). 136–142. 2 indexed citations

17.

Ivančo, J., I. Thurzo, & Emil Pinčík. (1994). Influence of plasma on silicon surface during low-energy plasma deposition process: The comparative study on Si3N4/Si structures. Applied Physics Letters. 65(20). 2594–2596. 3 indexed citations

18.

Thurzo, I. & Emil Pinčík. (1994). Excess capacitance of Al/n-GaAs Schottky diodes prepared on Ar-(Ar + H)-ion-beam-etched surfaces. Applied Surface Science. 74(2). 135–145.

19.

Thurzo, I. & Emil Pinčík. (1992). On the spatial resolution of small-signal DLTS: the need for a quantum model. Semiconductor Science and Technology. 7(4). 516–523. 4 indexed citations

20.

Bartoš, J, et al.. (1990). Characterization of MAOS Structures on GaAs. physica status solidi (a). 122(2). 715–722. 1 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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