G. Pelous

986 total citations
32 papers, 782 citations indexed

About

G. Pelous is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Materials Chemistry. According to data from OpenAlex, G. Pelous has authored 32 papers receiving a total of 782 indexed citations (citations by other indexed papers that have themselves been cited), including 23 papers in Electrical and Electronic Engineering, 18 papers in Atomic and Molecular Physics, and Optics and 10 papers in Materials Chemistry. Recurrent topics in G. Pelous's work include Semiconductor materials and interfaces (15 papers), Semiconductor materials and devices (12 papers) and Silicon and Solar Cell Technologies (10 papers). G. Pelous is often cited by papers focused on Semiconductor materials and interfaces (15 papers), Semiconductor materials and devices (12 papers) and Silicon and Solar Cell Technologies (10 papers). G. Pelous collaborates with scholars based in France, Germany and United Kingdom. G. Pelous's co-authors include A. Guivarc’h, A. Piotrowska, D. Lecrosnier, P Auvray, P. Hénoc, H. L’Haridon, M. Salvi, Alexandre Souto Martinêz, G. Hollinger and P. Pertosa and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and IEEE Transactions on Electron Devices.

In The Last Decade

G. Pelous

31 papers receiving 678 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
G. Pelous France 16 647 544 153 95 76 32 782
F. Nava Italy 14 576 0.9× 341 0.6× 120 0.8× 46 0.5× 82 1.1× 37 752
K. E. Strege United States 11 358 0.6× 343 0.6× 116 0.8× 36 0.4× 42 0.6× 18 508
G. F. A. van de Walle Netherlands 18 812 1.3× 689 1.3× 269 1.8× 202 2.1× 25 0.3× 45 1.0k
C. van Opdorp Netherlands 15 525 0.8× 405 0.7× 182 1.2× 63 0.7× 28 0.4× 30 702
K. Graff Germany 11 948 1.5× 533 1.0× 218 1.4× 102 1.1× 16 0.2× 20 1.0k
O. K. Wu United States 17 585 0.9× 404 0.7× 151 1.0× 33 0.3× 27 0.4× 58 648
M. Quillec France 16 746 1.2× 782 1.4× 264 1.7× 38 0.4× 27 0.4× 61 982
Morio Inoue Japan 11 536 0.8× 165 0.3× 252 1.6× 45 0.5× 30 0.4× 55 620
M. A. G. Halliwell United Kingdom 13 397 0.6× 453 0.8× 238 1.6× 54 0.6× 28 0.4× 32 648
C. d’Anterroches France 17 595 0.9× 706 1.3× 248 1.6× 65 0.7× 66 0.9× 45 960

Countries citing papers authored by G. Pelous

Since Specialization
Citations

This map shows the geographic impact of G. Pelous's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by G. Pelous with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites G. Pelous more than expected).

Fields of papers citing papers by G. Pelous

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by G. Pelous. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by G. Pelous. The network helps show where G. Pelous may publish in the future.

Co-authorship network of co-authors of G. Pelous

This figure shows the co-authorship network connecting the top 25 collaborators of G. Pelous. A scholar is included among the top collaborators of G. Pelous based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with G. Pelous. G. Pelous is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Pelous, G., et al.. (1999). <title>Remote detection of natural gas clouds in open fields by IR imagery</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 5 indexed citations
2.
Pelous, G., et al.. (1999). <title>Passive standoff detection of gas clouds in open field by IR imagery</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 3533. 86–92. 5 indexed citations
3.
Pelous, G., et al.. (1991). <title>IC rewiring by laser microchemistry</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 1598. 149–158. 3 indexed citations
4.
Tonneau, D., Y. Guern, & G. Pelous. (1989). Laser Microchemistry : A Powerful Tool For VLSI. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 1138. 184–184. 1 indexed citations
5.
Contour, J. P., et al.. (1986). GaAlAs/GaAs solar cells grown by molecular beam epitaxy: Material properties and device parameters. Solar Cells. 17(2-3). 373–381. 8 indexed citations
6.
Leroux, M., G. Pelous, Frédéric Raymond, & C. Vèrié. (1985). Minority-carrier lifetime study of the pressure induced Γ-X crossover in GaAs. Applied Physics Letters. 46(3). 288–290. 24 indexed citations
7.
L’Haridon, H., M. Gauneau, A. Guivarc’h, et al.. (1985). Mixage ionique sur des structures Au/InP. Thin Solid Films. 123(2). 145–157. 2 indexed citations
8.
Lambert, B., et al.. (1983). Properties of vanadium in InP. Solid State Communications. 47(5). 337–340. 16 indexed citations
9.
Piotrowska, A., A. Guivarc’h, & G. Pelous. (1983). Ohmic contacts to III–V compound semiconductors: A review of fabrication techniques. Solid-State Electronics. 26(3). 179–197. 150 indexed citations
10.
Auvray, P, A. Guivarc’h, H. L’Haridon, et al.. (1982). Epitaxial regrowth of (100) InP layers amorphized by ion implantation at room temperature. Journal of Applied Physics. 53(9). 6202–6207. 42 indexed citations
11.
Salvi, M., P.N. Favennec, H. L’Haridon, & G. Pelous. (1982). Composition of anodic oxides grown on InP. Thin Solid Films. 87(1). 13–16. 3 indexed citations
12.
Lecrosnier, D., et al.. (1981). Gold gettering in silicon by phosphorous diffusion and argon implantation: Mechanisms and limitations. Journal of Applied Physics. 52(8). 5090–5097. 67 indexed citations
13.
Lecrosnier, D., et al.. (1980). Influence of phosphorus-induced point defects on a gold-gettering mechanism in silicon. Journal of Applied Physics. 51(2). 1036–1038. 25 indexed citations
14.
Martinêz, Alexandre Souto, D. Estève, A. Guivarc’h, et al.. (1980). Metallurgical and electrical properties of chromium silicon interfaces. Solid-State Electronics. 23(1). 55–64. 49 indexed citations
15.
Auvray, P, et al.. (1980). Study of buried silicon nitride layers synthesized by ion implantation. Journal of Applied Physics. 51(12). 6169–6175. 45 indexed citations
16.
Toulouse, B., P.N. Favennec, A. Guivarc’h, & G. Pelous. (1979). Physicochemical and resistivity studies of boron-implanted GaAs. 1 indexed citations
17.
Lecrosnier, D., et al.. (1979). Long-range enhancement of boron diffusivity induced by a high-surface-concentration phosphorus diffusion. Applied Physics Letters. 34(3). 224–226. 15 indexed citations
18.
Guivarc’h, A., et al.. (1978). Reaction kinetics of molybdenum thin films on silicon (111) surface. Journal of Applied Physics. 49(1). 233–237. 76 indexed citations
19.
Lecrosnier, D., et al.. (1977). Investigation of ion-implantation damage with x-ray double reflection. Applied Physics Letters. 30(3). 141–143. 10 indexed citations
20.
Lecrosnier, D. & G. Pelous. (1974). Ion-implanted FET for power applications. IEEE Transactions on Electron Devices. 21(1). 113–118. 23 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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