G. P. Patsis
- Electrical and Electronic Engineering top 5%
- Biomedical Engineering top 10%
- Surfaces, Coatings and Films top 2%
- Computational Mechanics top 5%
- Radiology, Nuclear Medicine and Imaging
- Co-authors
- Εvangelos GogolidesVassilios ConstantoudisAngeliki TserepiI. RaptisLeonardus H. A. LeunissenΝ. ΓλέζοςE. ValamontesMinas Papadopoulos
- Topics
- Advancements in Photolithography Techniques (58 papers)Electron and X-Ray Spectroscopy Techniques (17 papers)Integrated Circuits and Semiconductor Failure Analysis (17 papers)
In The Last Decade
G. P. Patsis
83 papers receiving 1000 citations
Peers
Comparison fields: 5 of 77
- Electrical and Electronic Engineering 758
- Biomedical Engineering 398
- Surfaces, Coatings and Films 256
- Computational Mechanics 163
- Radiology, Nuclear Medicine and Imaging 107
Countries citing papers authored by G. P. Patsis
This map shows the geographic impact of G. P. Patsis's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by G. P. Patsis with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites G. P. Patsis more than expected).
Fields of papers citing papers by G. P. Patsis
This network shows the impact of papers produced by G. P. Patsis. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by G. P. Patsis. The network helps show where G. P. Patsis may publish in the future.
Co-authorship network of co-authors of G. P. Patsis
This figure shows the co-authorship network connecting the top 25 collaborators of G. P. Patsis. A scholar is included among the top collaborators of G. P. Patsis based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with G. P. Patsis. G. P. Patsis is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 4 | |
| 2 | 2 | |
| 3 | 1 | |
| 4 | 1 | |
| 5 | 16 | |
| 6 | 51 | |
| 7 | 3 | |
| 8 | 13 | |
| 9 | 20 | |
| 10 | 52 | |
| 11 | 80 | |
| 12 | 10 | |
| 13 | 4 | |
| 14 | 7 | |
| 15 | 7 | |
| 16 | 5 | |
| 17 | 22 | |
| 18 | 8 | |
| 19 | 3 | |
| 20 | 7 |
About G. P. Patsis
G. P. Patsis is a scholar working on Surfaces, Coatings and Films, Electrical and Electronic Engineering and Industrial and Manufacturing Engineering, having authored 83 papers that have together received 1.1k indexed citations. Recurring topics across this work include Advancements in Photolithography Techniques (58 papers), Electron and X-Ray Spectroscopy Techniques (17 papers) and Integrated Circuits and Semiconductor Failure Analysis (17 papers). The work is most often cited by research in Surfaces, Coatings and Films (256 citations), Electrical and Electronic Engineering (758 citations) and Biomedical Engineering (398 citations). G. P. Patsis has collaborated with scholars based in Greece, Belgium and Italy. Frequent co-authors include Εvangelos Gogolides, Vassilios Constantoudis, Angeliki Tserepi, I. Raptis, Leonardus H. A. Leunissen, Ν. Γλέζος, E. Valamontes, Minas Papadopoulos, Ioannis Pirmettis and Maria Pelecanou. Their work appears in journals such as Journal of Medicinal Chemistry, Polymer and Inorganic Chemistry.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.