Frank Pohlenz

977 total citations
32 papers, 766 citations indexed

About

Frank Pohlenz is a scholar working on Mechanical Engineering, Atomic and Molecular Physics, and Optics and Biomedical Engineering. According to data from OpenAlex, Frank Pohlenz has authored 32 papers receiving a total of 766 indexed citations (citations by other indexed papers that have themselves been cited), including 19 papers in Mechanical Engineering, 18 papers in Atomic and Molecular Physics, and Optics and 12 papers in Biomedical Engineering. Recurrent topics in Frank Pohlenz's work include Force Microscopy Techniques and Applications (17 papers), Advanced Measurement and Metrology Techniques (17 papers) and Surface Roughness and Optical Measurements (10 papers). Frank Pohlenz is often cited by papers focused on Force Microscopy Techniques and Applications (17 papers), Advanced Measurement and Metrology Techniques (17 papers) and Surface Roughness and Optical Measurements (10 papers). Frank Pohlenz collaborates with scholars based in Germany and Indonesia. Frank Pohlenz's co-authors include Gaoliang Dai, Hans‐Ulrich Danzebrink, Min Xu, Ludger Koenders, Thorsten Dziomba, Konrad Herrmann, Günter Wilkening, Sebastian Bütefisch, Alexander C. Diener and Zhi Li and has published in prestigious journals such as Applied Physics Letters, Optics Letters and Review of Scientific Instruments.

In The Last Decade

Frank Pohlenz

31 papers receiving 715 citations

Peers

Countries citing papers authored by Frank Pohlenz

Since Specialization

Citations

This map shows the geographic impact of Frank Pohlenz's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Frank Pohlenz with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Frank Pohlenz more than expected).

Fields of papers citing papers by Frank Pohlenz

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Frank Pohlenz. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Frank Pohlenz. The network helps show where Frank Pohlenz may publish in the future.

Co-authorship network of co-authors of Frank Pohlenz

This figure shows the co-authorship network connecting the top 25 collaborators of Frank Pohlenz. A scholar is included among the top collaborators of Frank Pohlenz based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Frank Pohlenz. Frank Pohlenz is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

#	Work	Indexed citations
1	Indentation modulus and hardness investigation of crystalline silicon surfaces treated by inductively coupled plasma reactive ion etching 2019 ·Journal of Physics Conference Series ·(unknown), (unknown), Frank Pohlenz, (unknown), (unknown), Zhi Li, Hutomo Suryo Wasisto, Erwin Peiner, Uwe Brand	2
2	Nanoindentation of crystalline silicon pillars fabricated by soft UV nanoimprint lithography and cryogenic deep reactive ion etching 2018 ·Sensors and Actuators A Physical ·(unknown), (unknown), (unknown), Zhi Li, Frank Pohlenz, Min Xu, (unknown), Maik Bertke, Hutomo Suryo Wasisto, Uwe Brand, Erwin Peiner	32
3	Dimensional nanometrology at PTB 2012 ·Hans‐Ulrich Danzebrink, Gaoliang Dai, Frank Pohlenz, Thorsten Dziomba, Sebastian Bütefisch, Jens Flügge, Harald Bosse	5
4	Metrological AFMs and its application for versatile nano-dimensional metrology tasks 2010 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Gaoliang Dai, Thorsten Dziomba, Frank Pohlenz, Hans‐Ulrich Danzebrink, Ludger Koenders	4
5	Heck cattle in nature conservation projects - current experiences. 2009 ·(unknown), (unknown), (unknown), Frank Pohlenz, (unknown), (unknown), (unknown), (unknown)	1
6	Rastersondenmetrologie: Vom metrologischen Rasterkraftmikroskop zum Mikro- und NanokoordinatenmessgerätScanning Probe Metrology: From the Metrological SFM to the Micro/Nano CMM 2009 ·tm - Technisches Messen ·Gaoliang Dai, Sebastian Bütefisch, Frank Pohlenz, Hans‐Ulrich Danzebrink, Ludger Koenders	2
7	A high precision micro/nano CMM using piezoresistive tactile probes 2009 ·Measurement Science and Technology ·Gaoliang Dai, Sebastian Bütefisch, Frank Pohlenz, Hans‐Ulrich Danzebrink	56
8	Accurate and traceable calibration of two-dimensional gratings 2007 ·Measurement Science and Technology ·Gaoliang Dai, Frank Pohlenz, Thorsten Dziomba, Min Xu, Alexander C. Diener, Ludger Koenders, Hans‐Ulrich Danzebrink	88
9	Lateral scanning confocal microscopy for the determination of in-plane displacements of microelectromechanical systems devices 2007 ·Optics Letters ·(unknown), Konrad Herrmann, Frank Pohlenz	17
10	Nanoscale surface measurements at sidewalls of nano- and micro-structures 2007 ·Measurement Science and Technology ·Gaoliang Dai, (unknown), Thomas Weimann, Min Xu, Frank Pohlenz, Hans‐Ulrich Danzebrink	36
11	Die Ankopplung verschiedenartiger Detektionssysteme für dimensionelle Messungen im Mikro- und Nanometerbereich an die Nanomessmaschine (Linking up Various Detection Systems for Dimensional Measurements in the Micro- and Nanorange with the Nanomeasuring Machine) 2006 ·tm - Technisches Messen ·Gaoliang Dai, Frank Pohlenz, Hans‐Ulrich Danzebrink	3
12	An optical differential probe for measurement of MEMS topography 2006 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·(unknown), Konrad Herrmann, Frank Pohlenz	1
13	Improving the performance of interferometers in metrological scanning probe microscopes 2004 ·Measurement Science and Technology ·Gaoliang Dai, Frank Pohlenz, Hans‐Ulrich Danzebrink, (unknown), (unknown)	37
14	Metrological large range scanning probe microscope 2004 ·Review of Scientific Instruments ·Gaoliang Dai, Frank Pohlenz, Hans‐Ulrich Danzebrink, Min Xu, (unknown), (unknown)	120
15	Development and calibration of standards for the coating thickness in the range of micrometer and nanometer 2003 ·Surface and Coatings Technology ·K.‐P. Hoffmann, (unknown), Konrad Herrmann, (unknown), Frank Pohlenz, Jing Sun	3
16	Development of a standard on hardness and Young's modulus testing of thin coatings by nanoindentation 2002 ·Zeitschrift für Metallkunde ·Konrad Herrmann, N.M. Jennett, S. R. J. Saunders, J. Meneve, Frank Pohlenz	2
17	Dimensionelle Metrologie mittels Rastersondenmikroskopie (Dimensional Metrology based on Scanning Probe Microscopy) 2002 ·tm - Technisches Messen ·(unknown), Ludger Koenders, Hans‐Ulrich Danzebrink, (unknown), Günter Wilkening, Frank Pohlenz, U. Kuetgens, (unknown), Andrew Yacoot	1
18	Characterisation of the geometry of indenters used for the micro- and nanoindentation method 2001 ·Measurement ·Konrad Herrmann, (unknown), Frank Pohlenz, (unknown)	16
19	Determination of the geometry of microhardness indenters with a scanning force microscope 1998 ·Measurement Science and Technology ·(unknown), Konrad Herrmann, Frank Pohlenz, K. Thiele	11
20	Evaluation of shape measurements by using non-orthogonal sine functions 1991 ·Measurement ·(unknown), (unknown), Frank Pohlenz, (unknown)	1

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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