Fredric Scire

784 total citations
25 papers, 505 citations indexed

About

Fredric Scire is a scholar working on Mechanical Engineering, Computational Mechanics and Computer Vision and Pattern Recognition. According to data from OpenAlex, Fredric Scire has authored 25 papers receiving a total of 505 indexed citations (citations by other indexed papers that have themselves been cited), including 16 papers in Mechanical Engineering, 12 papers in Computational Mechanics and 8 papers in Computer Vision and Pattern Recognition. Recurrent topics in Fredric Scire's work include Advanced Measurement and Metrology Techniques (15 papers), Surface Roughness and Optical Measurements (11 papers) and Optical measurement and interference techniques (8 papers). Fredric Scire is often cited by papers focused on Advanced Measurement and Metrology Techniques (15 papers), Surface Roughness and Optical Measurements (11 papers) and Optical measurement and interference techniques (8 papers). Fredric Scire collaborates with scholars based in United States. Fredric Scire's co-authors include E. Clayton Teague, Russell D. Young, John F. Ward, Theodore V. Vorburger, David E. Gilsinn, John A. Kramar, John S. Villarrubia, Nicholas G. Dagalakis, Jack A. Stone and Jaehwa Jeong and has published in prestigious journals such as Wear, Review of Scientific Instruments and Journal of Aircraft.

In The Last Decade

Fredric Scire

23 papers receiving 457 citations

Peers

Countries citing papers authored by Fredric Scire

Since Specialization

Citations

This map shows the geographic impact of Fredric Scire's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Fredric Scire with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Fredric Scire more than expected).

Fields of papers citing papers by Fredric Scire

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Fredric Scire. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Fredric Scire. The network helps show where Fredric Scire may publish in the future.

Co-authorship network of co-authors of Fredric Scire

This figure shows the co-authorship network connecting the top 25 collaborators of Fredric Scire. A scholar is included among the top collaborators of Fredric Scire based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Fredric Scire. Fredric Scire is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

#	Work	Indexed citations
1	THE MOLECULAR MEASURING MACHINE 2008 ·John A. Kramar, (unknown), (unknown), Fredric Scire, (unknown), John S. Villarrubia, (unknown), David E. Gilsinn	0
2	A COMPACT, COMPOUND ACTUATOR FOR THE MOLECULAR MEASURING MACHINE \| NIST 2008 ·Jing Li, Yin-Lin Shen, Jaehwa Jeong, Fredric Scire, John A. Kramar	1
3	Molecular Measuring Machine Design and Performance \| NIST 2001 ·John A. Kramar, (unknown), (unknown), (unknown), Fredric Scire, (unknown)	1
4	Performance Evaluation of a Parallel Cantilever Biaxial Micropositioning Stage \| NIST 2000 ·(unknown), Nicholas G. Dagalakis, John A. Kramar, Fredric Scire	4
5	<title>Grating pitch measurements with the molecular measuring machine</title> 1999 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·John A. Kramar, (unknown), (unknown), Fredric Scire, E. Clayton Teague, John S. Villarrubia	5
6	Toward nanometer accuracy measurements 1999 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·John A. Kramar, (unknown), David E. Gilsinn, (unknown), (unknown), Fredric Scire, E. Clayton Teague, John S. Villarrubia	12
7	Method to characterize overlay tool misalignments and distortions 1997 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Richard M. Silver, (unknown), Fredric Scire, C. J. Evans, Michael L. McGlauflin, (unknown), Robert D. Larrabee	3
8	Fabry-Perot Interferometers for Small Displacement Measurements \| NIST 1996 ·(unknown), Fredric Scire, Jack A. Stone	2
9	<title>High-accuracy overlay measurements</title> 1996 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Richard M. Silver, (unknown), Fredric Scire, Robert D. Larrabee	0
10	Para-flex stage for microtopographic mapping 1988 ·Review of Scientific Instruments ·E. Clayton Teague, Russell D. Young, Fredric Scire, David E. Gilsinn	5
11	Surface roughness studies for wind tunnel models used in high Reynolds number testing 1986 ·Journal of Aircraft ·Theodore V. Vorburger, (unknown), Fredric Scire, David E. Gilsinn, (unknown), E. Clayton Teague	2
12	Optical measurement of the roughness of sinusoidal surfaces 1986 ·Wear ·Theodore V. Vorburger, David E. Gilsinn, Fredric Scire, (unknown), (unknown), E. Clayton Teague	3
13	Surface Roughness Metrology By Angular Distributions Of Scattered Light 1985 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·David E. Gilsinn, Theodore V. Vorburger, E. Clayton Teague, (unknown), (unknown), Fredric Scire	4
14	Surface Roughness Studies with DALLAS-Detector Array for Laser Light Angular Scattering 1984 ·Journal of Research of the National Bureau of Standards ·Theodore V. Vorburger, E. Clayton Teague, Fredric Scire, (unknown), David E. Gilsinn	19
15	Sinusoidal profile precision roughness specimens 1982 ·Wear ·E. Clayton Teague, Fredric Scire, Theodore V. Vorburger	22
16	Graphical Signatures for Manufactured Surfaces 1982 ·Journal of Lubrication Technology ·(unknown), E. Clayton Teague, Fredric Scire, Russell D. Young, Theodore V. Vorburger	9
17	Three-dimensional stylus profilometry 1982 ·Wear ·E. Clayton Teague, Fredric Scire, (unknown), (unknown)	60
18	Measurements of stylus radii 1979 ·Wear ·Theodore V. Vorburger, E. Clayton Teague, Fredric Scire, (unknown)	14
19	Piezodriven 50-μm range stage with subnanometer resolution 1978 ·Review of Scientific Instruments ·Fredric Scire, E. Clayton Teague	151
20	Precision reference specimens of surface roughness: Some characteristics of the cali-block 1972 ·Journal of Research of the National Bureau of Standards Section C Engineering and Instrumentation ·Russell D. Young, Fredric Scire	2

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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