Fredric Scire

784 total citations
25 papers, 505 citations indexed

About

Fredric Scire is a scholar working on Mechanical Engineering, Computational Mechanics and Computer Vision and Pattern Recognition. According to data from OpenAlex, Fredric Scire has authored 25 papers receiving a total of 505 indexed citations (citations by other indexed papers that have themselves been cited), including 16 papers in Mechanical Engineering, 12 papers in Computational Mechanics and 8 papers in Computer Vision and Pattern Recognition. Recurrent topics in Fredric Scire's work include Advanced Measurement and Metrology Techniques (15 papers), Surface Roughness and Optical Measurements (11 papers) and Optical measurement and interference techniques (8 papers). Fredric Scire is often cited by papers focused on Advanced Measurement and Metrology Techniques (15 papers), Surface Roughness and Optical Measurements (11 papers) and Optical measurement and interference techniques (8 papers). Fredric Scire collaborates with scholars based in United States. Fredric Scire's co-authors include E. Clayton Teague, Russell D. Young, John F. Ward, Theodore V. Vorburger, David E. Gilsinn, John A. Kramar, John S. Villarrubia, Nicholas G. Dagalakis, Jack A. Stone and Jaehwa Jeong and has published in prestigious journals such as Wear, Review of Scientific Instruments and Journal of Aircraft.

In The Last Decade

Fredric Scire

23 papers receiving 457 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
Fredric Scire United States	8	252	187	178	147	130	25	505
E. Clayton Teague United States	14	255 1.0×	259 1.4×	396 2.2×	192 1.3×	302 2.3×	43	764
G. Jäger Germany	12	169 0.7×	181 1.0×	315 1.8×	123 0.8×	134 1.0×	42	486
Dean Brown United States	8	184 0.7×	248 1.3×	74 0.4×	461 3.1×	90 0.7×	16	607
M. Castagné France	15	172 0.7×	143 0.8×	40 0.2×	283 1.9×	165 1.3×	54	664
Frank Pohlenz Germany	15	365 1.4×	288 1.5×	428 2.4×	197 1.3×	181 1.4×	32	766
Günter Wilkening Germany	14	353 1.4×	322 1.7×	429 2.4×	213 1.4×	190 1.5×	31	743
K.J. Skrobis United States	12	152 0.6×	211 1.1×	86 0.5×	399 2.7×	34 0.3×	18	508
Wyatt O. Davis United States	10	182 0.7×	219 1.2×	57 0.3×	359 2.4×	58 0.4×	21	500
Sagnik Pal India	12	119 0.5×	228 1.2×	252 1.4×	237 1.6×	75 0.6×	55	525
Lee S. Tavrow United States	11	218 0.9×	392 2.1×	137 0.8×	445 3.0×	13 0.1×	15	712

Countries citing papers authored by Fredric Scire

Since Specialization

Citations

This map shows the geographic impact of Fredric Scire's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Fredric Scire with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Fredric Scire more than expected).

Fields of papers citing papers by Fredric Scire

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Fredric Scire. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Fredric Scire. The network helps show where Fredric Scire may publish in the future.

Co-authorship network of co-authors of Fredric Scire

This figure shows the co-authorship network connecting the top 25 collaborators of Fredric Scire. A scholar is included among the top collaborators of Fredric Scire based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Fredric Scire. Fredric Scire is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

Kramar, John A., et al.. (2008). THE MOLECULAR MEASURING MACHINE.

Li, Jing, Yin-Lin Shen, Jaehwa Jeong, Fredric Scire, & John A. Kramar. (2008). A COMPACT, COMPOUND ACTUATOR FOR THE MOLECULAR MEASURING MACHINE | NIST. 1 indexed citations

Kramar, John A., et al.. (2001). Molecular Measuring Machine Design and Performance | NIST. 25. 1 indexed citations

Dagalakis, Nicholas G., et al.. (2000). Performance Evaluation of a Parallel Cantilever Biaxial Micropositioning Stage | NIST. 22. 4 indexed citations

Kramar, John A., et al.. (1999). <title>Grating pitch measurements with the molecular measuring machine</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 3806. 46–53. 5 indexed citations

Kramar, John A., et al.. (1999). Toward nanometer accuracy measurements. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 3677. 1017–1017. 12 indexed citations

Silver, Richard M., et al.. (1997). Method to characterize overlay tool misalignments and distortions. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 3050. 143–143. 3 indexed citations

Scire, Fredric, et al.. (1996). Fabry-Perot Interferometers for Small Displacement Measurements | NIST. 2 indexed citations

Silver, Richard M., et al.. (1996). <title>High-accuracy overlay measurements</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 2725. 320–330.

10.

Teague, E. Clayton, Russell D. Young, Fredric Scire, & David E. Gilsinn. (1988). Para-flex stage for microtopographic mapping. Review of Scientific Instruments. 59(1). 67–73. 5 indexed citations

11.

Vorburger, Theodore V., et al.. (1986). Surface roughness studies for wind tunnel models used in high Reynolds number testing. Journal of Aircraft. 23(1). 56–61. 2 indexed citations

12.

Vorburger, Theodore V., et al.. (1986). Optical measurement of the roughness of sinusoidal surfaces. Wear. 109(1-4). 15–27. 3 indexed citations

13.

Gilsinn, David E., et al.. (1985). Surface Roughness Metrology By Angular Distributions Of Scattered Light. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 525. 2–2. 4 indexed citations

14.

Vorburger, Theodore V., et al.. (1984). Surface Roughness Studies with DALLAS-Detector Array for Laser Light Angular Scattering. Journal of Research of the National Bureau of Standards. 89(1). 3–3. 19 indexed citations

15.

Teague, E. Clayton, Fredric Scire, & Theodore V. Vorburger. (1982). Sinusoidal profile precision roughness specimens. Wear. 83(1). 61–73. 22 indexed citations

16.

Teague, E. Clayton, et al.. (1982). Graphical Signatures for Manufactured Surfaces. Journal of Lubrication Technology. 104(4). 533–537. 9 indexed citations

17.

Teague, E. Clayton, et al.. (1982). Three-dimensional stylus profilometry. Wear. 83(1). 1–12. 60 indexed citations

18.

Vorburger, Theodore V., et al.. (1979). Measurements of stylus radii. Wear. 57(1). 39–49. 14 indexed citations

19.

Scire, Fredric & E. Clayton Teague. (1978). Piezodriven 50-μm range stage with subnanometer resolution. Review of Scientific Instruments. 49(12). 1735–1740. 151 indexed citations

20.

Young, Russell D. & Fredric Scire. (1972). Precision reference specimens of surface roughness: Some characteristics of the cali-block. Journal of Research of the National Bureau of Standards Section C Engineering and Instrumentation. 76C(1 and 2). 21–21. 2 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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