Ju-Yi Lee

700 total citations
56 papers, 544 citations indexed

About

Ju-Yi Lee is a scholar working on Mechanical Engineering, Computer Vision and Pattern Recognition and Computational Mechanics. According to data from OpenAlex, Ju-Yi Lee has authored 56 papers receiving a total of 544 indexed citations (citations by other indexed papers that have themselves been cited), including 35 papers in Mechanical Engineering, 28 papers in Computer Vision and Pattern Recognition and 25 papers in Computational Mechanics. Recurrent topics in Ju-Yi Lee's work include Advanced Measurement and Metrology Techniques (35 papers), Optical measurement and interference techniques (26 papers) and Surface Roughness and Optical Measurements (20 papers). Ju-Yi Lee is often cited by papers focused on Advanced Measurement and Metrology Techniques (35 papers), Optical measurement and interference techniques (26 papers) and Surface Roughness and Optical Measurements (20 papers). Ju-Yi Lee collaborates with scholars based in Taiwan, France and China. Ju-Yi Lee's co-authors include Jyh-Chen Chen, Gilles Lérondel, Der-Chin Su, Hui‐Yu Chen, Ching‐Liang Dai, Kun‐Yi Andrew Lin, Jiing‐Yih Lai, Régis Déturche, Yu‐Pin Chen and Lin‐Yu Chen and has published in prestigious journals such as Optics Letters, Optics Express and Thin Solid Films.

In The Last Decade

Ju-Yi Lee

52 papers receiving 513 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Ju-Yi Lee Taiwan 13 269 217 190 173 155 56 544
Ichiko Misumi Japan 16 369 1.4× 194 0.9× 106 0.6× 216 1.2× 239 1.5× 57 694
G. Jäger Germany 12 315 1.2× 123 0.6× 76 0.4× 181 1.0× 134 0.9× 42 486
Ki-Nam Joo South Korea 15 313 1.2× 265 1.2× 212 1.1× 161 0.9× 111 0.7× 61 604
Heui Jae Pahk South Korea 13 191 0.7× 95 0.4× 112 0.6× 144 0.8× 119 0.8× 31 432
Junhao Zhu China 12 150 0.6× 133 0.6× 75 0.4× 61 0.4× 23 0.1× 37 367
Sebastian Bütefisch Germany 12 175 0.7× 255 1.2× 34 0.2× 244 1.4× 71 0.5× 27 512
Günter Wilkening Germany 14 429 1.6× 213 1.0× 126 0.7× 322 1.9× 190 1.2× 31 743
Gaopeng Xue China 9 141 0.5× 120 0.6× 98 0.5× 80 0.5× 21 0.1× 32 292
Chunyu Zhao United States 13 197 0.7× 104 0.5× 228 1.2× 168 1.0× 99 0.6× 47 490
Masato Aketagawa Japan 13 307 1.1× 181 0.8× 83 0.4× 143 0.8× 87 0.6× 71 504

Countries citing papers authored by Ju-Yi Lee

Since Specialization
Citations

This map shows the geographic impact of Ju-Yi Lee's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Ju-Yi Lee with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Ju-Yi Lee more than expected).

Fields of papers citing papers by Ju-Yi Lee

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Ju-Yi Lee. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Ju-Yi Lee. The network helps show where Ju-Yi Lee may publish in the future.

Co-authorship network of co-authors of Ju-Yi Lee

This figure shows the co-authorship network connecting the top 25 collaborators of Ju-Yi Lee. A scholar is included among the top collaborators of Ju-Yi Lee based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Ju-Yi Lee. Ju-Yi Lee is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Lee, Ju-Yi, et al.. (2025). One-shot polarization interferometry for measurement of surface profile. Measurement Sensors. 38. 101827–101827.
2.
Lee, Ju-Yi, et al.. (2025). High sensitivity roll angle measurement based on birefringent polarization interferometry. Optics & Laser Technology. 189. 113052–113052.
3.
Lee, Ju-Yi, et al.. (2024). Simultaneous measurement of roll and pitch angular displacements based on polarization interferometry. Measurement. 242. 116270–116270. 2 indexed citations
4.
Lee, Ju-Yi, et al.. (2023). Dual beam polarization interferometry for roll angular displacement measurement. Measurement. 222. 113571–113571. 2 indexed citations
5.
Lee, Ju-Yi, et al.. (2019). Force-displacement measurement using simultaneous phase-shifting technique. Japanese Journal of Applied Physics. 58(SJ). SJJD02–SJJD02. 2 indexed citations
6.
Lee, Ju-Yi, et al.. (2013). Heterodyne common-path grating interferometer with Littrow configuration. Optics Express. 21(11). 13322–13322. 19 indexed citations
7.
Chen, Yi-Cheng, Yu‐Pin Chen, & Ju-Yi Lee. (2012). Experimental results of a wafer positioning system using machine vision after system calibration. Society of Instrument and Control Engineers of Japan. 1014–1017. 5 indexed citations
8.
Lee, Ju-Yi, et al.. (2012). Double corner cube method for enhancing the sensitivity of straightness measurement. Society of Instrument and Control Engineers of Japan. 1010–1013.
9.
Lee, Ju-Yi, et al.. (2012). Measurement of in-plane displacement by wavelength-modulated heterodyne speckle interferometry. Applied Optics. 51(8). 1095–1095. 12 indexed citations
10.
Lee, Ju-Yi, et al.. (2011). Wafer positioning by laser scanning method. Society of Instrument and Control Engineers of Japan. 1833–1837. 2 indexed citations
11.
Chen, Yi-Cheng, et al.. (2011). Implementation of a wafer positioning system. Society of Instrument and Control Engineers of Japan. 1938–1943. 3 indexed citations
12.
Chen, Yi‐Cheng, Yu‐Pin Chen, & Ju-Yi Lee. (2011). A novel method for real-time wafer positioning during transfer process. Society of Instrument and Control Engineers of Japan. 1933–1937. 2 indexed citations
13.
14.
Chen, Jyh-Chen, et al.. (2011). Two-dimensional displacement measurement by quasi-common-optical-path heterodyne grating interferometer. Optics Express. 19(10). 9770–9770. 49 indexed citations
15.
Lee, Ju-Yi, et al.. (2008). Polarization-interferometric surface-plasmon-resonance imaging system. Optics Letters. 33(5). 434–434. 14 indexed citations
16.
Chen, Jyh-Chen, et al.. (2006). Applying an interferometric exposure model to analyze the influences of process parameters on the linewidth. Applied Optics. 45(32). 8278–8278. 1 indexed citations
17.
Lee, Ju-Yi, et al.. (2006). Heterodyne interferometer for measurement of in-plane displacement with subnanometer resolution. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 6280. 62800J–62800J. 3 indexed citations
18.
Lee, Ju-Yi, et al.. (2005). Thickness and optical constants measurement of thin film growth with circular heterodyne interferometry. Thin Solid Films. 491(1-2). 91–95. 8 indexed citations
19.
Lee, Ju-Yi, et al.. (1999). Complex refractive-index measurement based on Fresnel’s equations and the uses of heterodyne interferometry. Applied Optics. 38(19). 4047–4047. 68 indexed citations
20.
Lee, Ju-Yi, et al.. (1998). High resolution central fringe identification. Optics Communications. 156(1-3). 1–4. 5 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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