G. Dufour
- Surfaces, Coatings and Films top 1%
- Electron and X-Ray Spectroscopy Techniques 20
- Materials Chemistry top 5%
- Silicon Nanostructures and Photoluminescence 10
- Electronic and Structural Properties of Oxides 8
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- Surface and Thin Film Phenomena 15
- Advanced Chemical Physics Studies 15
- Semiconductor materials and interfaces 9
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- Semiconductor materials and devices 33
- Molecular Junctions and Nanostructures 9
- Radiation top 5%
- Journals
- Surface Science (15 papers)Physical review. B, Condensed matter (8 papers)Applied Surface Science (6 papers)
- Partner nations
- FranceItalyUnited States
In The Last Decade
G. Dufour
83 papers receiving 2.1k citations
Peers
Comparison fields: 5 of 71
- Surfaces, Coatings and Films 422
- Materials Chemistry 1.1k
- Atomic and Molecular Physics, and Optics 716
- Electrical and Electronic Engineering 1.3k
- Radiation 157
Countries citing papers authored by G. Dufour
This map shows the geographic impact of G. Dufour's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by G. Dufour with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites G. Dufour more than expected).
Fields of papers citing papers by G. Dufour
This network shows the impact of papers produced by G. Dufour. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by G. Dufour. The network helps show where G. Dufour may publish in the future.
Co-authorship network
The 25 scholars most cited alongside G. Dufour, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2017 | 18 | |
| 2 | 2011 | 67 | |
| 3 | 2005 | 32 | |
| 4 | 2005 | 28 | |
| 5 | The effect of metallurgical variables and porosity on the high cycle fatigue behaviour of aluminium alloy 319 | 2003 | 2 |
| 6 | 2002 | 14 | |
| 7 | 2000 | 3 | |
| 8 | 1998 | 5 | |
| 9 | 1995 | 25 | |
| 10 | 1994 | 115 | |
| 11 | 1993 | 7 | |
| 12 | 1993 | 15 | |
| 13 | 1992 | 21 | |
| 14 | 1992 | 41 | |
| 15 | 1989 | 2 | |
| 16 | 1989 | 23 | |
| 17 | 1984 | 9 | |
| 18 | 1984 | 27 | |
| 19 | 1977 | 7 | |
| 20 | 1974 | 21 |
About G. Dufour
G. Dufour is a scholar working on Surfaces, Coatings and Films, Atomic and Molecular Physics, and Optics and Materials Chemistry, having authored 83 papers that have together received 2.2k indexed citations. Recurring topics across this work include Semiconductor materials and devices (33 papers), Electron and X-Ray Spectroscopy Techniques (20 papers), Surface and Thin Film Phenomena (15 papers), Advanced Chemical Physics Studies (15 papers), Silicon Nanostructures and Photoluminescence (10 papers), Semiconductor materials and interfaces (9 papers), Molecular Junctions and Nanostructures (9 papers) and Electronic and Structural Properties of Oxides (8 papers). The work is most often cited by research in Surfaces, Coatings and Films (422 citations), Materials Chemistry (1.1k citations) and Atomic and Molecular Physics, and Optics (716 citations). G. Dufour has collaborated with scholars based in France, Italy and United States. Frequent co-authors include H. Roulet, F. Rochet, Fausto Sirotti, J.-M. Mariot, M. De Crescenzi, M. Froment, M. Che, C. Bonnelle, J.F. Tempère and S. Carniato. Their work appears in journals such as Surface Science, Physical review. B, Condensed matter, Applied Surface Science, Journal of Electron Spectroscopy and Related Phenomena and Physical Review B.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.