F. Roy

860 total citations
62 papers, 623 citations indexed

About

F. Roy is a scholar working on Electrical and Electronic Engineering, Aerospace Engineering and Condensed Matter Physics. According to data from OpenAlex, F. Roy has authored 62 papers receiving a total of 623 indexed citations (citations by other indexed papers that have themselves been cited), including 56 papers in Electrical and Electronic Engineering, 11 papers in Aerospace Engineering and 9 papers in Condensed Matter Physics. Recurrent topics in F. Roy's work include CCD and CMOS Imaging Sensors (33 papers), Thin-Film Transistor Technologies (12 papers) and Advanced Memory and Neural Computing (10 papers). F. Roy is often cited by papers focused on CCD and CMOS Imaging Sensors (33 papers), Thin-Film Transistor Technologies (12 papers) and Advanced Memory and Neural Computing (10 papers). F. Roy collaborates with scholars based in France, Switzerland and Canada. F. Roy's co-authors include Frédéric Sirois, B. Dutoit, M. Valenza, J.C. Vildeuil, C. Leyris, A. Hoffmann, F. Mart́ınez, Daniel L. Benoit, Guo‐Neng Lu and J. Sastré‐Hernández and has published in prestigious journals such as Sensors, IEEE Transactions on Electron Devices and Thin Solid Films.

In The Last Decade

F. Roy

53 papers receiving 596 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
F. Roy France	16	451	136	116	90	86	62	623
Christian Laubis Germany	16	420 0.9×	151 1.1×	31 0.3×	36 0.4×	78 0.9×	65	676
D.D. Rathman United States	13	614 1.4×	161 1.2×	17 0.1×	21 0.2×	338 3.9×	39	822
D. R. Lampe United States	10	409 0.9×	235 1.7×	14 0.1×	22 0.2×	327 3.8×	28	676
M. Raine France	22	1.0k 2.3×	29 0.2×	12 0.1×	82 0.9×	76 0.9×	71	1.2k
Larissa Juschkin Germany	13	369 0.8×	140 1.0×	12 0.1×	88 1.0×	47 0.5×	79	607
B.C. Burkey United States	13	477 1.1×	40 0.3×	15 0.1×	14 0.2×	104 1.2×	43	572
R. Tatchyn United States	12	361 0.8×	112 0.8×	66 0.6×	89 1.0×	35 0.4×	118	582
Mehmet Kaynak Germany	22	1.7k 3.8×	386 2.8×	48 0.4×	14 0.2×	97 1.1×	223	1.9k
Zhi M. Liao United States	15	259 0.6×	209 1.5×	5 0.0×	66 0.7×	60 0.7×	40	745
M. Weiner United States	19	977 2.2×	54 0.4×	116 1.0×	11 0.1×	109 1.3×	110	1.1k

Countries citing papers authored by F. Roy

Since Specialization

Citations

This map shows the geographic impact of F. Roy's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by F. Roy with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites F. Roy more than expected).

Fields of papers citing papers by F. Roy

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by F. Roy. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by F. Roy. The network helps show where F. Roy may publish in the future.

Co-authorship network of co-authors of F. Roy

This figure shows the co-authorship network connecting the top 25 collaborators of F. Roy. A scholar is included among the top collaborators of F. Roy based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with F. Roy. F. Roy is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

Roy, F., et al.. (2024). Total Ionizing Dose Effects on a CDTI-Based CCD-on-CMOS Through Buildup of Interface Traps and Oxide Charges. IEEE Transactions on Nuclear Science. 71(8). 1774–1782. 2 indexed citations

Roché, Philippe, et al.. (2024). Radiation Hardness of Modern Photogate Pixels Under Total Ionizing Dose: Impact of Pixel Pitch and Electron or Hole Collection. IEEE Transactions on Nuclear Science. 71(8). 1766–1773.

Roy, F., et al.. (2024). Dark Current and Clock-Induced Charges in a Fully Depleted Charge Domain CDTI-Based CCD-on-CMOS Image Sensor. IEEE Sensors Journal. 24(16). 25652–25661. 2 indexed citations

Roy, F., et al.. (2024). Displacement Damage Effects on a CDTI-Based CCD-on-CMOS: Dark Current and Charge Transfer Inefficiency. IEEE Transactions on Nuclear Science. 72(4). 1217–1227.

Roy, F., et al.. (2023). Capacitive Deep Trench Isolation-Based CCD-on-CMOS Image Sensor Sensitivity to Total Ionizing Dose. IEEE Transactions on Nuclear Science. 70(8). 2018–2026. 5 indexed citations

García-Hernansanz, R., Pablo Acosta-Alba, S. Kerdilès, et al.. (2023). Estimation of the melting threshold of Ti supersaturated Si using time resolved reflectometry and haze measurements. Semiconductor Science and Technology. 38(3). 34002–34002.

Goiffon, Vincent, et al.. (2023). Ionizing Radiation Effects on Hole Collection Backside-Illuminated p-Type Deep-Trench-Pinned Photo-MOS Pixels Under Image Acquisition. IEEE Transactions on Nuclear Science. 70(8). 1958–1965. 4 indexed citations

Roy, F., et al.. (2022). Radiation Characterization of a Backside-Illuminated P-Type Photo-MOS Pixel With Gamma Rays and Fusion-Induced Neutrons. IEEE Transactions on Nuclear Science. 69(3). 534–541. 4 indexed citations

Roy, F., et al.. (2020). Capacitive Trench-Based Charge Transfer Device. IEEE Electron Device Letters. 41(9). 1388–1391. 11 indexed citations

10.

Lu, Guo‐Neng, et al.. (2015). Total Ionizing Dose Effects on Quantum Efficiency and Dark Current of CMOS Image Sensors with Deep-Trench-Isolation. Sensor Letters. 13(7). 539–542. 1 indexed citations

11.

Magnan, Pierre, et al.. (2012). Rad Tolerant CMOS Image Sensor Based on Hole Collection 4T Pixel Pinned Photodiode. IEEE Transactions on Nuclear Science. 59(6). 2888–2893. 8 indexed citations

12.

Richard, C., et al.. (2011). New mechanism of plasma induced damage on CMOS image sensor: Analysis and process optimization. Solid-State Electronics. 65-66. 51–56. 20 indexed citations

13.

Goiffon, Vincent, et al.. (2011). Radiation effects on CMOS image sensors with sub-2µm pinned photodiodes. 5167. 314–320. 4 indexed citations

14.

Sirois, Frédéric, Jonathan Coulombe, F. Roy, & B. Dutoit. (2010). Characterization of the electrical resistance of high temperature superconductor coated conductors at high currents using ultra-fast regulated current pulses. Superconductor Science and Technology. 23(3). 34018–34018. 23 indexed citations

15.

Vigil‐Galán, O., et al.. (2009). Physical properties of Bi₂Te₃and Sb₂Te₃films deposited by close space vapor transport. Semiconductor Science and Technology. 24(2). 25025–25025. 28 indexed citations

16.

Roy, F., et al.. (2009). Numerical Studies of the Quench Propagation in Coated Conductors for Fault Current Limiters. IEEE Transactions on Applied Superconductivity. 19(3). 2496–2499. 17 indexed citations

17.

Roy, F., et al.. (2008). 1.4-$\mu\hbox{m}$-Pitch 50% Fill-Factor 1T Charge-Modulation Pixel for CMOS Image Sensors. IEEE Electron Device Letters. 29(3). 221–223. 4 indexed citations

18.

Sirois, Frédéric, et al.. (2008). Evaluation of two commercial finite element packages for calculating AC losses in 2-D high temperature superconducting strips. Journal of Physics Conference Series. 97. 12030–12030. 20 indexed citations

19.

Roy, F., B. Dutoit, Frédéric Sirois, & Francesco Grilli. (2007). 2D Magneto-Thermal Modeling of Coated High-Temperature Superconductors. Infoscience (Ecole Polytechnique Fédérale de Lausanne). 1. 273–277. 1 indexed citations

20.

Findlater, Keith, Robert K. Henderson, D. Baxter, et al.. (2003). SXGA pinned photodiode CMOS image sensor in 0.35 μm technology. 1. 218–489. 31 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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