Dwight L. Crook
- Electrical and Electronic Engineering
- Electronic, Optical and Magnetic Materials
- Hardware and Architecture
- Materials Chemistry
- Safety, Risk, Reliability and Quality
- Topics
- Semiconductor materials and devices (13 papers)Integrated Circuits and Semiconductor Failure Analysis (12 papers)Advancements in Semiconductor Devices and Circuit Design (8 papers)
- Cited by
- Electrical and Electronic EngineeringHardware and ArchitectureElectronic, Optical and Magnetic Materials
- Journals
- IEEE Transactions on Electron DevicesQuality and Reliability Engineering InternationalReliability physics
- Partner nations
- United States
In The Last Decade
Dwight L. Crook
15 papers receiving 275 citations
Peers
Comparison fields: 5 of 33
- Electrical and Electronic Engineering 269
- Electronic, Optical and Magnetic Materials 44
- Hardware and Architecture 27
- Materials Chemistry 23
- Safety, Risk, Reliability and Quality 16
Countries citing papers authored by Dwight L. Crook
This map shows the geographic impact of Dwight L. Crook's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Dwight L. Crook with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Dwight L. Crook more than expected).
Fields of papers citing papers by Dwight L. Crook
This network shows the impact of papers produced by Dwight L. Crook. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Dwight L. Crook. The network helps show where Dwight L. Crook may publish in the future.
Co-authorship network of co-authors of Dwight L. Crook
This figure shows the co-authorship network connecting the top 25 collaborators of Dwight L. Crook. A scholar is included among the top collaborators of Dwight L. Crook based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Dwight L. Crook. Dwight L. Crook is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 0 | |
| 2 | 19 | |
| 3 | 9 | |
| 4 | 13 | |
| 5 | 12 | |
| 6 | 32 | |
| 7 | 7 | |
| 8 | 3 | |
| 9 | 23 | |
| 10 | 8 | |
| 11 | 7 | |
| 12 | 130 | |
| 13 | 19 | |
| 14 | 3 | |
| 15 | 4 | |
| 16 | Photovoltaic energy conversion under high radiation intensities | 1 |
About Dwight L. Crook
Dwight L. Crook is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture and Surfaces, Coatings and Films, having authored 16 papers that have together received 290 indexed citations. Recurring topics across this work include Semiconductor materials and devices (13 papers), Integrated Circuits and Semiconductor Failure Analysis (12 papers) and Advancements in Semiconductor Devices and Circuit Design (8 papers). The work is most often cited by research in Electrical and Electronic Engineering (269 citations), Hardware and Architecture (27 citations) and Electronic, Optical and Magnetic Materials (44 citations). Dwight L. Crook has collaborated with scholars based in United States. Frequent co-authors include Charles C. Hong, J.R. Yeargan, Samuel J. Rosenberg, L.D. Yau and L. Forbes. Their work appears in journals such as IEEE Transactions on Electron Devices, Quality and Reliability Engineering International and Reliability physics.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.