Doron Meshulach

1.7k total citations · 1 hit paper
18 papers, 1.3k citations indexed

About

Doron Meshulach is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Surfaces, Coatings and Films. According to data from OpenAlex, Doron Meshulach has authored 18 papers receiving a total of 1.3k indexed citations (citations by other indexed papers that have themselves been cited), including 13 papers in Electrical and Electronic Engineering, 7 papers in Atomic and Molecular Physics, and Optics and 4 papers in Surfaces, Coatings and Films. Recurrent topics in Doron Meshulach's work include Integrated Circuits and Semiconductor Failure Analysis (8 papers), Advancements in Photolithography Techniques (7 papers) and Laser-Matter Interactions and Applications (7 papers). Doron Meshulach is often cited by papers focused on Integrated Circuits and Semiconductor Failure Analysis (8 papers), Advancements in Photolithography Techniques (7 papers) and Laser-Matter Interactions and Applications (7 papers). Doron Meshulach collaborates with scholars based in Israel, United States and Belgium. Doron Meshulach's co-authors include Yaron Silberberg, Dvir Yelin, Y. Barad, Shlomo Ruschin, Dieter Van den Heuvel, R. Jonckheere, Kurt Ronse, Eric Hendrickx, T. Bret and Ido Dolev and has published in prestigious journals such as Nature, Physical Review A and Optics Letters.

In The Last Decade

Doron Meshulach

18 papers receiving 1.2k citations

Hit Papers

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What are hit papers?

Hit papers significantly outperform the citation benchmark for their cohort. A paper qualifies if it has ≥500 total citations, achieves ≥1.5× the top-1% citation threshold for papers in the same subfield and year (this is the minimum needed to enter the top 1%, not the average within it), or reaches the top citation threshold in at least one of its specific research topics.

Coherent quantum control of two-photon transitions by a femtosecond laser pulse

1998 540 citations Doron Meshulach, Yaron Silberberg Nature profile →

Peers

Countries citing papers authored by Doron Meshulach

Since Specialization

Citations

This map shows the geographic impact of Doron Meshulach's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Doron Meshulach with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Doron Meshulach more than expected).

Fields of papers citing papers by Doron Meshulach

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Doron Meshulach. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Doron Meshulach. The network helps show where Doron Meshulach may publish in the future.

Co-authorship network of co-authors of Doron Meshulach

This figure shows the co-authorship network connecting the top 25 collaborators of Doron Meshulach. A scholar is included among the top collaborators of Doron Meshulach based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Doron Meshulach. Doron Meshulach is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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18 of 18 papers shown

#	Work	Indexed citations
1	Additional evidence of EUV blank defects first seen by wafer printing 2011 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·R. Jonckheere, Dieter Van den Heuvel, T. Bret, (unknown), (unknown), (unknown), Doron Meshulach, Eric Hendrickx, Kurt Ronse	11
2	Evidence of printing blank-related defects on EUV masks missed by blank inspection 2011 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·R. Jonckheere, Dieter Van den Heuvel, T. Bret, (unknown), (unknown), (unknown), Doron Meshulach, Eric Hendrickx, Kurt Ronse	20
3	Advanced lithography: wafer defect scattering analysis at DUV 2010 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Doron Meshulach, Ido Dolev, (unknown), Kenji Tsuchiya, Makoto Kaneko, (unknown), (unknown)	10
4	Process variation monitoring (PVM) by wafer inspection tool as a complementary method to CD-SEM for mapping LER and defect density on production wafers 2009 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·(unknown), (unknown), (unknown), (unknown), (unknown), (unknown), Doron Meshulach, (unknown), Ido Dolev, (unknown), (unknown), Kaori Goto, (unknown), (unknown), Shin Nakamura, (unknown), (unknown)	1
5	From simulation to characterization - integrated approach for Self Aligned Double Patterning defectivity 2008 ·(unknown), Doron Meshulach, (unknown), Ido Dolev, (unknown), (unknown), (unknown), (unknown), (unknown)	2
6	AWV: high-throughput cross-array cross-wafer variation mapping 2008 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Jeongho Yeo, Byoungho Lee, (unknown), (unknown), Doron Meshulach, (unknown), (unknown), (unknown), (unknown), (unknown), (unknown)	1
7	Immersion lithography defectivity analysis at DUV inspection wavelength 2007 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·(unknown), Doron Meshulach, (unknown), Junho Yeo, (unknown), (unknown), Christian Schwarz, (unknown), Warren Montgomery	2
8	Polarization control for enhanced defect detection on advanced memory devices 2006 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Byoungho Lee, (unknown), Jeongho Yeo, (unknown), Doron Meshulach	3
9	Coherent quantum control of multiphoton transitions by shaped ultrashort optical pulses 1999 ·Physical Review A ·Doron Meshulach, Yaron Silberberg	271
10	Adaptive real-time femtosecond pulse shaping 1998 ·Journal of the Optical Society of America B ·Doron Meshulach, Dvir Yelin, Yaron Silberberg	64
11	Coherent quantum control of two-photon transitions by a femtosecond laser pulse breakdown → 1998 ·Nature ·Doron Meshulach, Yaron Silberberg	540
12	Real-time spatial–spectral interference measurements of ultrashort optical pulses 1997 ·Journal of the Optical Society of America B ·Doron Meshulach, Dvir Yelin, Yaron Silberberg	67
13	Adaptive ultrashort pulse compression and shaping 1997 ·Optics Communications ·Doron Meshulach, Dvir Yelin, Yaron Silberberg	42
14	White light dispersion measurements by one- and two-dimensional spectral interference 1997 ·IEEE Journal of Quantum Electronics ·Doron Meshulach, Dvir Yelin, Yaron Silberberg	23
15	Measurement of ultrashort optical pulses by third-harmonic generation 1997 ·Journal of the Optical Society of America B ·Doron Meshulach, Y. Barad, Yaron Silberberg	47
16	Adaptive femtosecond pulse compression 1997 ·Optics Letters ·Dvir Yelin, Doron Meshulach, Yaron Silberberg	179
17	Active N coupled waveguide switch and power splitter 1994 ·IEEE Journal of Quantum Electronics ·Doron Meshulach, Shlomo Ruschin	9
18	Voltage controlled NN coupled waveguide switch and power splitter 1993 ·IEEE Photonics Technology Letters* ·Shlomo Ruschin, Doron Meshulach	6

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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