David J. Yoon
- Aerospace Engineering top 5%
- Computer Vision and Pattern Recognition top 10%
- Electrical and Electronic Engineering
- Artificial Intelligence
- Environmental Engineering
- Co-authors
- Timothy D. BarfootAngela P. SchoelligTim BarfootShichen LuAndrew LambertHaowei ZhangSoeren KammelPatrick McGarey
- Topics
- Robotics and Sensor-Based Localization (7 papers)Autonomous Vehicle Technology and Safety (6 papers)Anomaly Detection Techniques and Applications (4 papers)
- Journals
- The International Journal of Robotics ResearchIEEE Robotics and Automation LettersJournal of Field Robotics
- Partner nations
- CanadaChinaUnited States
In The Last Decade
David J. Yoon
12 papers receiving 296 citations
Peers
Comparison fields: 5 of 36
- Aerospace Engineering 208
- Computer Vision and Pattern Recognition 102
- Electrical and Electronic Engineering 69
- Artificial Intelligence 63
- Environmental Engineering 51
Countries citing papers authored by David J. Yoon
This map shows the geographic impact of David J. Yoon's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by David J. Yoon with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites David J. Yoon more than expected).
Fields of papers citing papers by David J. Yoon
This network shows the impact of papers produced by David J. Yoon. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by David J. Yoon. The network helps show where David J. Yoon may publish in the future.
Co-authorship network of co-authors of David J. Yoon
This figure shows the co-authorship network connecting the top 25 collaborators of David J. Yoon. A scholar is included among the top collaborators of David J. Yoon based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with David J. Yoon. David J. Yoon is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 0 | |
| 2 | 5 | |
| 3 | 11 | |
| 4 | 1 | |
| 5 | 81 | |
| 6 | 50 | |
| 7 | 20 | |
| 8 | 10 | |
| 9 | 49 | |
| 10 | 19 | |
| 11 | 18 | |
| 12 | 27 | |
| 13 | 13 |
About David J. Yoon
David J. Yoon is a scholar working on Instrumentation, Automotive Engineering and Aerospace Engineering, having authored 13 papers that have together received 304 indexed citations. Recurring topics across this work include Robotics and Sensor-Based Localization (7 papers), Autonomous Vehicle Technology and Safety (6 papers) and Anomaly Detection Techniques and Applications (4 papers). The work is most often cited by research in Instrumentation (41 citations), Aerospace Engineering (208 citations) and Geology (30 citations). David J. Yoon has collaborated with scholars based in Canada, China and United States. Frequent co-authors include Timothy D. Barfoot, Angela P. Schoellig, Tim Barfoot, Shichen Lu, Andrew Lambert, Haowei Zhang, Soeren Kammel, Patrick McGarey, François Pomerleau and Haowei Zhang. Their work appears in journals such as The International Journal of Robotics Research, IEEE Robotics and Automation Letters and Journal of Field Robotics.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.