C. G. Frase

702 total citations
27 papers, 462 citations indexed

About

C. G. Frase is a scholar working on Surfaces, Coatings and Films, Electrical and Electronic Engineering and Mechanical Engineering. According to data from OpenAlex, C. G. Frase has authored 27 papers receiving a total of 462 indexed citations (citations by other indexed papers that have themselves been cited), including 24 papers in Surfaces, Coatings and Films, 18 papers in Electrical and Electronic Engineering and 8 papers in Mechanical Engineering. Recurrent topics in C. G. Frase's work include Electron and X-Ray Spectroscopy Techniques (22 papers), Advancements in Photolithography Techniques (18 papers) and Surface and Thin Film Phenomena (6 papers). C. G. Frase is often cited by papers focused on Electron and X-Ray Spectroscopy Techniques (22 papers), Advancements in Photolithography Techniques (18 papers) and Surface and Thin Film Phenomena (6 papers). C. G. Frase collaborates with scholars based in Germany, United States and Russia. C. G. Frase's co-authors include Egbert Buhr, Harald Bosse, Tobias Klein, Kai Dirscherl, Virpi Korpelainen, Felix Meli, Michael Krumrey, Alexandre Cuenat, Robert Boyd and Gian Bartolo Picotto and has published in prestigious journals such as Applied Physics Letters, Journal of Physics D Applied Physics and Measurement Science and Technology.

In The Last Decade

C. G. Frase

25 papers receiving 439 citations

Peers

Countries citing papers authored by C. G. Frase

Since Specialization

Citations

This map shows the geographic impact of C. G. Frase's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by C. G. Frase with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites C. G. Frase more than expected).

Fields of papers citing papers by C. G. Frase

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by C. G. Frase. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by C. G. Frase. The network helps show where C. G. Frase may publish in the future.

Co-authorship network of co-authors of C. G. Frase

This figure shows the co-authorship network connecting the top 25 collaborators of C. G. Frase. A scholar is included among the top collaborators of C. G. Frase based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with C. G. Frase. C. G. Frase is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

Sort: Min cites: Since: Top N: Style:

20 of 20 papers shown

#	Work	Indexed citations
1	Simultaneous measurement of lateral and vertical size of nanoparticles using transmission scanning electron microscopy (TSEM) 2017 ·Measurement Science and Technology ·Egbert Buhr, Marion U. Bug, (unknown), (unknown), C. G. Frase	3
2	Challenges in nanometrology: highprecision measurement of position and size 2015 ·tm - Technisches Messen ·Harald Bosse, Bernd Bodermann, Gaoliang Dai, Jens Flügge, C. G. Frase, (unknown), (unknown), Paul Köchert, Rainer Köning, (unknown), (unknown)	0
3	Controlled fabrication of single-walled carbon nanotube electrodes by electron-beam-induced oxidation 2011 ·Applied Physics Letters ·Cornelius Thiele, Michael Engel, Frank Hennrich, Manfred M. Kappes, (unknown), C. G. Frase, H. v. Löhneysen, Ralph Krupke	16
4	Good practice guide for the determination of the size distributions of spherical nanoparticle samples. 2011 ·Robert Boyd, Alexandre Cuenat, Felix Meli, Tobias Klein, C. G. Frase, (unknown), Michael Krumrey, (unknown), (unknown), (unknown), E Prieto	1
5	Traceable measurement of nanoparticle size using a scanning electron microscope in transmission mode (TSEM) 2011 ·Measurement Science and Technology ·Tobias Klein, Egbert Buhr, (unknown), C. G. Frase	39
6	Model-Based Correction of Image Distortion in Scanning Electron Microscopy 2010 ·Key engineering materials ·(unknown), C. G. Frase, Harald Bosse, Rainer Tutsch	3
7	Monte Carlo modeling of BSE reflection in e-beam writers 2010 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·H. Alves, (unknown), (unknown), (unknown), C. G. Frase, Harald Bosse	1
8	Optimization of BSE-detector for e-beam direct write lithography 2009 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·H. Alves, (unknown), (unknown), C. G. Frase, (unknown), (unknown), Harald Bosse	3
9	Characterization of nanoparticles by scanning electron microscopy in transmission mode 2009 ·Measurement Science and Technology ·Egbert Buhr, (unknown), Tobias Klein, (unknown), (unknown), C. G. Frase, Harald Bosse	84
10	International photomask linewidth comparison by NIST and PTB 2008 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·(unknown), Ronald G. Dixson, (unknown), (unknown), András Vládar, Egbert Buhr, (unknown), Bernd Bodermann, C. G. Frase, Harald Bosse	4
11	SEM linewidth measurements of anisotropically etched silicon structures smaller than 0.1 µm 2007 ·Measurement Science and Technology ·C. G. Frase, (unknown), Gaoliang Dai, Harald Bosse, Yu. A. Novikov, A. V. Rakov	28
12	A new SEM CD operator verified against Monte Carlo simulations 2007 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·C. G. Frase, (unknown), (unknown), Egbert Buhr, Harald Bosse	2
13	CD characterization of nanostructures in SEM metrology 2007 ·Measurement Science and Technology ·C. G. Frase, Egbert Buhr, Kai Dirscherl	57
14	Calibration of CD mask standards for the 65-nm node: CoG and MoSi 2007 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Jan Richter, (unknown), (unknown), Bernd Bodermann, Alexander C. Diener, (unknown), C. G. Frase, Harald Bosse	7
15	Systematic investigation of CD metrology tool response to sidewall profile variation on a COG test mask 2006 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·(unknown), (unknown), (unknown), Jan Richter, (unknown), C. G. Frase, Bernd Bodermann, (unknown), Kai Dirscherl, Harald Bosse	3
16	Use of Monte Carlo models in the development and validation of CD operators 2005 ·Surface and Interface Analysis ·C. G. Frase, (unknown)	18
17	Calibration procedures and application of the PTB photomask CD standard 2005 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·(unknown), C. G. Frase, (unknown), Kai Dirscherl, Bernd Bodermann, (unknown), (unknown), Harald Bosse	3
18	Characterization of a 100-nm 1D pitch standard by metrological SEM and SFM 2004 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·(unknown), Thorsten Dziomba, C. G. Frase, Harald Bosse, (unknown)	7
19	Metrological characterization of new CD photomask standards 2004 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·(unknown), Bernd Bodermann, (unknown), C. G. Frase, (unknown), Harald Bosse	2
20	Comparison of linewidth measurements on COG masks 2001 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Harald Bosse, (unknown), C. G. Frase, (unknown), (unknown)	8

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

Explore authors with similar magnitude of impact