Gian Bartolo Picotto

584 total citations
32 papers, 412 citations indexed

About

Gian Bartolo Picotto is a scholar working on Mechanical Engineering, Atomic and Molecular Physics, and Optics and Computational Mechanics. According to data from OpenAlex, Gian Bartolo Picotto has authored 32 papers receiving a total of 412 indexed citations (citations by other indexed papers that have themselves been cited), including 15 papers in Mechanical Engineering, 11 papers in Atomic and Molecular Physics, and Optics and 10 papers in Computational Mechanics. Recurrent topics in Gian Bartolo Picotto's work include Advanced Measurement and Metrology Techniques (15 papers), Surface Roughness and Optical Measurements (10 papers) and Force Microscopy Techniques and Applications (9 papers). Gian Bartolo Picotto is often cited by papers focused on Advanced Measurement and Metrology Techniques (15 papers), Surface Roughness and Optical Measurements (10 papers) and Force Microscopy Techniques and Applications (9 papers). Gian Bartolo Picotto collaborates with scholars based in Italy, Finland and Germany. Gian Bartolo Picotto's co-authors include Marco Pisani, Felix Meli, Ludger Koenders, Antti Lassila, Virpi Korpelainen, R. Bellotti, Egbert Buhr, A. Sosso, Günter Wilkening and Michael Krumrey and has published in prestigious journals such as Surface Science, Journal of Physics Condensed Matter and IEEE Transactions on Instrumentation and Measurement.

In The Last Decade

Gian Bartolo Picotto

32 papers receiving 379 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Gian Bartolo Picotto Italy 9 173 148 122 94 87 32 412
Virpi Korpelainen Finland 9 118 0.7× 98 0.7× 91 0.7× 57 0.6× 67 0.8× 25 305
M T Clarkson New Zealand 8 25 0.1× 96 0.6× 115 0.9× 76 0.8× 24 0.3× 18 318
Bayanheshig Bayanheshig China 13 152 0.9× 102 0.7× 204 1.7× 7 0.1× 55 0.6× 81 539
Ching-Shen Su Taiwan 10 212 1.2× 51 0.3× 48 0.4× 118 1.3× 77 0.9× 24 400
Detian Li China 14 24 0.1× 122 0.8× 139 1.1× 67 0.7× 22 0.3× 72 453
Janez Šetina Slovenia 12 70 0.4× 66 0.4× 131 1.1× 117 1.2× 21 0.2× 54 387
Xiaotian Li China 14 87 0.5× 77 0.5× 191 1.6× 4 0.0× 37 0.4× 44 473
Helen D. Ford United Kingdom 13 56 0.3× 38 0.3× 179 1.5× 10 0.1× 122 1.4× 47 497
V. Damian Romania 11 104 0.6× 48 0.3× 66 0.5× 3 0.0× 59 0.7× 68 393

Countries citing papers authored by Gian Bartolo Picotto

Since Specialization
Citations

This map shows the geographic impact of Gian Bartolo Picotto's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Gian Bartolo Picotto with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Gian Bartolo Picotto more than expected).

Fields of papers citing papers by Gian Bartolo Picotto

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Gian Bartolo Picotto. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Gian Bartolo Picotto. The network helps show where Gian Bartolo Picotto may publish in the future.

Co-authorship network of co-authors of Gian Bartolo Picotto

This figure shows the co-authorship network connecting the top 25 collaborators of Gian Bartolo Picotto. A scholar is included among the top collaborators of Gian Bartolo Picotto based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Gian Bartolo Picotto. Gian Bartolo Picotto is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Maurino, Valter, et al.. (2022). Quantitative three-dimensional characterization of critical sizes of non-spherical TiO2 nanoparticles by using atomic force microscopy. Ultramicroscopy. 234. 113480–113480. 3 indexed citations
2.
Picotto, Gian Bartolo, et al.. (2022). AFM Measurements and Tip Characterization of Nanoparticles with Different Shapes. Nanomanufacturing and Metrology. 5(2). 127–138. 36 indexed citations
3.
Picotto, Gian Bartolo, et al.. (2020). Tip–sample characterization in the AFM study of a rod-shaped nanostructure. Measurement Science and Technology. 31(8). 84001–84001. 6 indexed citations
4.
Picotto, Gian Bartolo, et al.. (2020). Differential readings of capacitance-based controls of attitude and displacements at the micro/nano scale. Measurement Science and Technology. 31(10). 104006–104006. 2 indexed citations
5.
Bellotti, R., et al.. (2019). Optical measurements of morphology-to-functional parameters on electrical contacts of photovoltaic cells. Surface Topography Metrology and Properties. 7(3). 35009–35009. 1 indexed citations
6.
Thalmann, R., Felix Meli, Gian Bartolo Picotto, et al.. (2015). Calibration of surface roughness standards. Metrologia. 53(1A). 4001–4001. 2 indexed citations
7.
Prieto, E, Nicholas A. T. Brown, Antti Lassila, et al.. (2012). Final report on inter-RMO Key Comparison EUROMET.L-K5.2004: Calibration of a step gauge. Metrologia. 49(1A). 4008–4008. 4 indexed citations
8.
Picotto, Gian Bartolo, et al.. (2011). Groove depth measurements on roughness reference standards of the Croatian National Laboratory for Length (LFSB). Measurement Science and Technology. 22(9). 94020–94020. 3 indexed citations
9.
Korpelainen, Virpi, et al.. (2011). A method for linearization of a laser interferometer down to the picometre level with a capacitive sensor. Measurement Science and Technology. 22(9). 94027–94027. 17 indexed citations
10.
Danzebrink, Hans‐Ulrich, et al.. (2010). Final report on EUROMET.L-S15.a (EUROMET Project 925): Intercomparison on step height standards and 1D gratings. Metrologia. 47(1A). 4006–4006. 13 indexed citations
11.
Yacoot, Andrew, Marco Pisani, Gian Bartolo Picotto, et al.. (2009). Nanotrace: the investigation of non-linearity in optical interferometers using X-ray interferometry. 4 indexed citations
12.
Picotto, Gian Bartolo, Ludger Koenders, & Günter Wilkening. (2009). Nanoscale metrology. Measurement Science and Technology. 20(8). 80101–80101. 8 indexed citations
13.
Portesi, Chiara, E. Monticone, Stefano Borini, et al.. (2008). Fabrication of superconducting MgB2nanostructures. Journal of Physics Condensed Matter. 20(47). 474210–474210. 4 indexed citations
14.
Koenders, Ludger, Petr Klapetek, Felix Meli, & Gian Bartolo Picotto. (2006). Comparison on step height measurements in the nano and micrometre range by scanning force microscopes. Metrologia. 43(1A). 4001–4001. 11 indexed citations
15.
Portesi, Chiara, Stefano Borini, Gian Bartolo Picotto, & E. Monticone. (2006). AFM analysis of MgB2 films and nanostructures. Surface Science. 601(1). 58–62. 8 indexed citations
16.
Koenders, Ludger, Nikolay Korolev, Tomizo Kurosawa, et al.. (2003). Comparison on Nanometrology: Nano 2—Step height. Metrologia. 40(1A). 4001–4001. 46 indexed citations
17.
Picotto, Gian Bartolo & Marco Pisani. (2001). A sample scanning system with nanometric accuracy for quantitative SPM measurements. Ultramicroscopy. 86(1-2). 247–254. 39 indexed citations
18.
Barbato, Giulio, et al.. (1994). Microhardness measurements by scanning tunneling microscope. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 12(3). 1738–1741. 4 indexed citations
19.
Cabiati, F., et al.. (1994). A surface profile reconstruction method based on multisensor capacitive transducers. Measurement. 13(1). 77–84. 4 indexed citations
20.
Picotto, Gian Bartolo, et al.. (1994). Capacitive sensors coupled to a scanning tunneling microscope piezoscanner for accurate measurements of the tip displacements. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 12(3). 1665–1668. 8 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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