Rainer Köning

599 citations

42 papers · 463 indexed · h-index 12

Impact in

Statistics, Probability and Uncertainty top 1%
- Scientific Measurement and Uncertainty Evaluation
Mechanical Engineering top 5%
- Advanced Measurement and Metrology Techniques

Papers in

Statistics, Probability and Uncertainty 23
- Scientific Measurement and Uncertainty Evaluation 23
Mechanical Engineering 31
- Advanced Measurement and Metrology Techniques 31

Co-authors: Jens Flügge Harald Bosse Paul Köchert Gejza Wimmer Viktor Witkovský Eberhard Manske Andrew Yacoot Birk Andreas
Journals: Measurement Science and Technology (11 papers)Metrologia (3 papers)Precision Engineering (2 papers)Microscopy and Microanalysis (1 paper)Applied Optics (1 paper)
Partner nations: Germany Slovakia United States

In The Last Decade

Rainer Köning

39 papers receiving 421 citations

Peers

Countries citing papers authored by Rainer Köning

Since Specialization

Citations

This map shows the geographic impact of Rainer Köning's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Rainer Köning with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Rainer Köning more than expected).

Fields of papers citing papers by Rainer Köning

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Rainer Köning. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Rainer Köning. The network helps show where Rainer Köning may publish in the future.

Co-authorship network

The 25 scholars most cited alongside Rainer Köning, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Rainer Köning Line = papers co-authored together Rainer Köning links everyone, so they are left out of the graph.

All Works

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20 of 20 papers shown

#	Work
1	Introduction and application of a new approach for model-based optical bidirectional measurements Measurement Science and Technology ·J. K. Krüger, Phillip Manley, KausalyaKumari Sahu, Rainer Köning, Chintya Angesty, Montserrat Mases i Coberó, Andreas Heinrich, Philipp‐Immanuel Schneider, Martin Hammerschmidt, Lin Zschiedrich, Eberhard Manske	2024	1
2	Reconstructing phase aberrations for high-precision dimensional microscopy Philipp‐Immanuel Schneider, Phillip Manley, J. K. Krüger, Lin Zschiedrich, Rainer Köning, Bernd Bodermann, Sven Burger	2022	6
3	A single-beam 3DoF homodyne interferometer Measurement Science and Technology ·James Mirabel, Gábor Molnár, О В Нечаева, Frank Paech, Rainer Köning, Hans‐Ulrich Danzebrink, Jiubin Tan, Jens Flügge	2020	10
4	Characterization progress of a UV-microscope recently implemented at the PTB Nanometer Comparator for uni- and bidirectional measurements SHILAP Revista de lepidopterología ·J. K. Krüger, Rainer Köning, Bernd Bodermann	2020	2
5	Multi-dimensional grating interferometer based on fibre-fed measurement heads arranged in Littrow configuration Measurement Science and Technology ·Nina Miklavčič, Gábor Molnár, Rainer Köning, Jens Flügge	2018	10
6	Das neue Antriebskonzept am Nanometerkomparator der PTB tm - Technisches Messen ·Paul Köchert, Eberhard Manske, Rainer Köning, Frank Paech, Jens Flügge	2017	0
7	Challenges in nanometrology: highprecision measurement of position and size tm - Technisches Messen ·Harald Bosse, Bernd Bodermann, Gaoliang Dai, Jens Flügge, C. G. Frase, (unknown), Janusz Mazur, Paul Köchert, Rainer Köning, (unknown), Frank Paech	2015	0
8	Ultra-präzise Lageregelung mittels interferometrischerPositionsdetektion und Tauchspulenantrieb tm - Technisches Messen ·Paul Köchert, Jens Flügge, Rainer Köning, Frank Paech, Eberhard Manske	2014	1
9	Ellipse fitting by nonlinear constraints to demodulate quadrature homodyne interferometer signals and to determine the statistical uncertainty of the interferometric phase Measurement Science and Technology ·Rainer Köning, Gejza Wimmer, Viktor Witkovský	2014	29
10	STABILITY OF A FULLY FIBRE-COUPLED INTERFEROMETER Common Library Network (Der Gemeinsame Bibliotheksverbund) ·Frank Paech, Paul Köchert, Rainer Köning, Jens Flügge	2014	2
11	The road towards accurate optical width measurements at the industrial level Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Bernd Bodermann, Rainer Köning, KausalyaKumari Sahu, Egbert Buhr, Janusz Mazur, Jens Flügge, Harald Bosse	2013	1
12	Estimating the standard uncertainty contribution of the straight-line fit algorithm used to determine the position and the width of a graduation line Metrologia ·Rainer Köning, José Woldenberg, Gejza Wimmer, Viktor Witkovský	2012	0
13	Implementing registration measurements on photomasks at the Nanometer Comparator Measurement Science and Technology ·Rainer Köning, Frank Paech, Débora Macedo dos Santos, Jens Flügge, 佐々木賀広, Harald Bosse	2012	11
14	A heterodyne interferometer with periodic nonlinearities smaller than ±10 pm Measurement Science and Technology ·Frank Paech, Paul Köchert, Rainer Köning, Jens Flügge, Birk Andreas, U. Kuetgens, Andrew Yacoot	2012	75
15	Investigation of the cantilever response of non-contact atomic force microscopy for topography measurements in all three dimensions Measurement Science and Technology ·Janusz Mazur, Debbrah K. Weston, Gaoliang Dai, Rainer Köning, Harald Bosse	2011	6
16	Dimensional Micro- and Nanometrology at PTB Rainer Köning, Jens Flügge, Debbrah K. Weston, 佐々木賀広, Gaoliang Dai, Uwe Brand, V. V. Nesterov, Sebastian Bütefisch, O. Cortés Rico, M. Wurm, Bernd Bodermann, Harald Bosse, Wu QingFa	2011	1
17	Recent activities at PTB nanometer comparator Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Jens Flügge, Rainer Köning, Harald Bosse	2003	10
18	The role of periodic interferometer errors in the calibration of capacitance displacement sensors for nanometrology applications Measurement Science and Technology ·Rainer Köning, Ronald G. Dixson, Joseph Fu, Theodore V. Vorburger	2001	8
19	Nanometer-Scale Dimensional Metrology With the Nist Calibrated Atomic Force Microscope Microscopy and Microanalysis ·Ronald G. Dixson, Rainer Köning, J Oldenburg, Savita Sethi, Theodore V. Vorburger	1999	2
20	The study of silicon stepped surfaces as atomic force microscope calibration standards with a calibrated AFM at NIST J Oldenburg, Theodore V. Vorburger, Ronald G. Dixson, Jianye Fu, Rainer Köning, Richard M. Silver, Ellen D. Williams	1998	12

About Rainer Köning

Rainer Köning is a scholar working on Statistics, Probability and Uncertainty, Mechanical Engineering, Surfaces, Coatings and Films, Biomedical Engineering and Computer Vision and Pattern Recognition, having authored 42 papers that have together received 463 indexed citations. Recurring topics across this work include Advanced Measurement and Metrology Techniques (31 papers), Scientific Measurement and Uncertainty Evaluation (23 papers), Advanced Sensor Technologies Research (13 papers), Force Microscopy Techniques and Applications (8 papers), Optical measurement and interference techniques (7 papers), Surface Roughness and Optical Measurements (5 papers), Advancements in Photolithography Techniques (4 papers) and Sensor Technology and Measurement Systems (4 papers). The work is most often cited by research in Statistics, Probability and Uncertainty (171 citations), Mechanical Engineering (366 citations), Computer Vision and Pattern Recognition (136 citations), Computational Mechanics (119 citations) and Biomedical Engineering (135 citations). Rainer Köning has collaborated with scholars based in Germany, Slovakia and United States. Frequent co-authors include Jens Flügge, Harald Bosse, Paul Köchert, Gejza Wimmer, Viktor Witkovský, Eberhard Manske, Andrew Yacoot, Birk Andreas, U. Kuetgens and Ronald G. Dixson. Their work appears in journals such as Measurement Science and Technology, Metrologia, Precision Engineering, Microscopy and Microanalysis and Applied Optics.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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