C. E. Bouldin
- Surfaces, Coatings and Films top 2%
- Electron and X-Ray Spectroscopy Techniques 22
- Radiation top 2%
- X-ray Spectroscopy and Fluorescence Analysis 22
- Condensed Matter Physics top 5%
- Materials Chemistry top 5%
- X-ray Diffraction in Crystallography 10
- Silicon Nanostructures and Photoluminescence 8
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- Surface and Thin Film Phenomena 12
- Semiconductor materials and interfaces 11
- Advanced Chemical Physics Studies 8
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- Semiconductor materials and devices 7
C. E. Bouldin
64 papers receiving 2.0k citations
Peers
Comparison fields: 5 of 84
- Surfaces, Coatings and Films 328
- Radiation 407
- Condensed Matter Physics 327
- Materials Chemistry 1.0k
- Atomic and Molecular Physics, and Optics 688
Countries citing papers authored by C. E. Bouldin
This map shows the geographic impact of C. E. Bouldin's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by C. E. Bouldin with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites C. E. Bouldin more than expected).
Fields of papers citing papers by C. E. Bouldin
This network shows the impact of papers produced by C. E. Bouldin. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by C. E. Bouldin. The network helps show where C. E. Bouldin may publish in the future.
Co-authorship network
The 25 scholars most cited alongside C. E. Bouldin, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2002 | 33 | |
| 2 | 2002 | 386 | |
| 3 | 2000 | 5 | |
| 4 | 1999 | 1 | |
| 5 | 1998 | 1 | |
| 6 | 1998 | 22 | |
| 7 | 1995 | 28 | |
| 8 | 1992 | 8 | |
| 9 | 1992 | 71 | |
| 10 | 1992 | 15 | |
| 11 | 1992 | 27 | |
| 12 | 1992 | 170 | |
| 13 | 1991 | 26 | |
| 14 | 1991 | 14 | |
| 15 | 1990 | 123 | |
| 16 | Multiple Scattering in the X-Ray Absportion Near-Edge Structure of Tetrahedral Ge Gases | 1988 | 1 |
| 17 | 1986 | 40 | |
| 18 | 1985 | 8 | |
| 19 | 1983 | 38 | |
| 20 | 1982 | 29 |
About C. E. Bouldin
C. E. Bouldin is a scholar working on Surfaces, Coatings and Films, Radiation, Structural Biology, Atomic and Molecular Physics, and Optics and Ceramics and Composites, having authored 65 papers that have together received 2.0k indexed citations. Recurring topics across this work include Electron and X-Ray Spectroscopy Techniques (22 papers), X-ray Spectroscopy and Fluorescence Analysis (22 papers), Surface and Thin Film Phenomena (12 papers), Semiconductor materials and interfaces (11 papers), X-ray Diffraction in Crystallography (10 papers), Advanced Chemical Physics Studies (8 papers), Silicon Nanostructures and Photoluminescence (8 papers) and Semiconductor materials and devices (7 papers). The work is most often cited by research in Surfaces, Coatings and Films (328 citations), Radiation (407 citations), Condensed Matter Physics (327 citations), Materials Chemistry (1.0k citations) and Atomic and Molecular Physics, and Optics (688 citations). C. E. Bouldin has collaborated with scholars based in United States, Israel and France. Frequent co-authors include J. J. Rehr, J. C. Woicik, A. L. Ankudinov, Howard Hung, James S. Sims, Edward A. Stern, J. O. Cross, K. E. Miyano, M. I. Bell and L. B. Sorensen. Their work appears in journals such as Physical review. B, Condensed matter, Physical Review Letters, Physica B Condensed Matter, Journal of Vacuum Science & Technology A Vacuum Surfaces and Films and Review of Scientific Instruments.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.