T. Kendelewicz
- Surfaces, Coatings and Films top 0.2%
- Electron and X-Ray Spectroscopy Techniques 81
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- Surface and Thin Film Phenomena 76
- Semiconductor materials and interfaces 60
- Advanced Chemical Physics Studies 26
- Semiconductor Quantum Structures and Devices 23
- Radiation top 2%
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- Semiconductor materials and devices 35
- Advanced Semiconductor Detectors and Materials 14
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- Photocathodes and Microchannel Plates 13
T. Kendelewicz
152 papers receiving 3.8k citations
Peers
Comparison fields: 5 of 77
- Surfaces, Coatings and Films 1.2k
- Atomic and Molecular Physics, and Optics 2.4k
- Radiation 282
- Electrical and Electronic Engineering 1.8k
- Renewable Energy, Sustainability and the Environment 420
Countries citing papers authored by T. Kendelewicz
This map shows the geographic impact of T. Kendelewicz's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by T. Kendelewicz with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites T. Kendelewicz more than expected).
Fields of papers citing papers by T. Kendelewicz
This network shows the impact of papers produced by T. Kendelewicz. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by T. Kendelewicz. The network helps show where T. Kendelewicz may publish in the future.
Co-authorship network
The 25 scholars most cited alongside T. Kendelewicz, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | Partial-density of occupied valence states by x-ray standing waves and high-resolution\n\nphotoelectron spectroscopy | 2000 | 12 |
| 2 | MnO(100)の清浄表面と水との反応 | 1999 | 4 |
| 3 | 1999 | 21 | |
| 4 | 1999 | 36 | |
| 5 | 1999 | 112 | |
| 6 | 1998 | 24 | |
| 7 | 1996 | 5 | |
| 8 | 1994 | 4 | |
| 9 | 1993 | 8 | |
| 10 | 1992 | 8 | |
| 11 | 1991 | 15 | |
| 12 | 1991 | 26 | |
| 13 | 1990 | 8 | |
| 14 | 1990 | 2 | |
| 15 | 1989 | 19 | |
| 16 | 1988 | 1 | |
| 17 | 1986 | 2 | |
| 18 | 1985 | 3 | |
| 19 | 1984 | 58 | |
| 20 | 1984 | 5 |
About T. Kendelewicz
T. Kendelewicz is a scholar working on Surfaces, Coatings and Films, Atomic and Molecular Physics, and Optics, Radiation, Structural Biology and Electrical and Electronic Engineering, having authored 154 papers that have together received 4.0k indexed citations. Recurring topics across this work include Electron and X-Ray Spectroscopy Techniques (81 papers), Surface and Thin Film Phenomena (76 papers), Semiconductor materials and interfaces (60 papers), Semiconductor materials and devices (35 papers), Advanced Chemical Physics Studies (26 papers), Semiconductor Quantum Structures and Devices (23 papers), Advanced Semiconductor Detectors and Materials (14 papers) and Photocathodes and Microchannel Plates (13 papers). The work is most often cited by research in Surfaces, Coatings and Films (1.2k citations), Atomic and Molecular Physics, and Optics (2.4k citations), Radiation (282 citations), Electrical and Electronic Engineering (1.8k citations) and Renewable Energy, Sustainability and the Environment (420 citations). T. Kendelewicz has collaborated with scholars based in United States, France and Sweden. Frequent co-authors include W. E. Spicer, I. Lindau, K. E. Miyano, N. Newman, J. Stöhr, Colin Doyle, W. E. Spicer, R. Jaeger, W Petro and I. Lindau. Their work appears in journals such as Physical review. B, Condensed matter, Journal of Vacuum Science & Technology A Vacuum Surfaces and Films, Surface Science, Applied Physics Letters and Physical Review Letters.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.