C. A. Wallace

421 total citations
24 papers, 315 citations indexed

About

C. A. Wallace is a scholar working on Materials Chemistry, Electrical and Electronic Engineering and Biomedical Engineering. According to data from OpenAlex, C. A. Wallace has authored 24 papers receiving a total of 315 indexed citations (citations by other indexed papers that have themselves been cited), including 11 papers in Materials Chemistry, 9 papers in Electrical and Electronic Engineering and 9 papers in Biomedical Engineering. Recurrent topics in C. A. Wallace's work include Acoustic Wave Resonator Technologies (4 papers), X-ray Diffraction in Crystallography (4 papers) and Surface and Thin Film Phenomena (4 papers). C. A. Wallace is often cited by papers focused on Acoustic Wave Resonator Technologies (4 papers), X-ray Diffraction in Crystallography (4 papers) and Surface and Thin Film Phenomena (4 papers). C. A. Wallace collaborates with scholars based in United Kingdom, United States and Germany. C. A. Wallace's co-authors include R. C. C. Ward, B. J. Isherwood, Peter C. Burns, Tori Z. Forbes, B. P. Richards, Richard Kell, R. C. C. Ward, A. Kerber, M. Kerber and Christopher G. Bailey and has published in prestigious journals such as Nature, Journal of Applied Crystallography and Journal of Physics D Applied Physics.

In The Last Decade

C. A. Wallace

24 papers receiving 281 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
C. A. Wallace United Kingdom	10	167	114	88	67	55	24	315
T. Niemyski Poland	11	193 1.2×	74 0.6×	41 0.5×	47 0.7×	28 0.5×	28	294
O. A. Golikova Russia	12	431 2.6×	137 1.2×	96 1.1×	28 0.4×	26 0.5×	53	514
R. F. Blunt United States	9	210 1.3×	120 1.1×	142 1.6×	55 0.8×	28 0.5×	12	341
M. E. Striefler United States	9	171 1.0×	37 0.3×	58 0.7×	47 0.7×	48 0.9×	12	355
J. C. Nipko United States	10	297 1.8×	182 1.6×	104 1.2×	24 0.4×	76 1.4×	15	517
S. Loughin United States	7	207 1.2×	150 1.3×	68 0.8×	9 0.1×	47 0.9×	12	331
A. Y. Wu United States	12	170 1.0×	104 0.9×	90 1.0×	37 0.6×	68 1.2×	28	282
R. Y. Koyama United States	10	132 0.8×	168 1.5×	168 1.9×	8 0.1×	52 0.9×	15	365
Paul F. Weller United States	9	314 1.9×	220 1.9×	101 1.1×	101 1.5×	11 0.2×	20	489

Countries citing papers authored by C. A. Wallace

Since Specialization

Citations

This map shows the geographic impact of C. A. Wallace's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by C. A. Wallace with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites C. A. Wallace more than expected).

Fields of papers citing papers by C. A. Wallace

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by C. A. Wallace. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by C. A. Wallace. The network helps show where C. A. Wallace may publish in the future.

Co-authorship network of co-authors of C. A. Wallace

This figure shows the co-authorship network connecting the top 25 collaborators of C. A. Wallace. A scholar is included among the top collaborators of C. A. Wallace based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with C. A. Wallace. C. A. Wallace is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

Wallace, C. A., et al.. (2025). Aerial Infrared Health Monitoring of Solar Photovoltaic Farms at Scale. 4462–4470. 1 indexed citations

Wallace, C. A., et al.. (2024). Barely-Visible Surface Crack Detection for Wind Turbine Sustainability. 5933–5939. 1 indexed citations

Forbes, Tori Z., C. A. Wallace, & Peter C. Burns. (2008). NEPTUNYL COMPOUNDS: POLYHEDRON GEOMETRIES, BOND-VALENCE PARAMETERS, AND STRUCTURAL HIERARCHY. The Canadian Mineralogist. 46(6). 1623–1645. 68 indexed citations

Wallace, C. A., et al.. (1982). <title>Manufacture And Measurement Of Ion-Etched X-Ray Diffraction Gratings</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 315. 165–169. 3 indexed citations

Wallace, C. A. & R. C. C. Ward. (1975). X-ray diffraction techniques for the analysis of epitaxic thin films. Journal of Applied Crystallography. 8(5). 545–556. 17 indexed citations

Wallace, C. A., et al.. (1975). The analysis of unwanted-mode vibration patterns in AT-cut quartz oscillator crystals, revealed by X-ray diffraction topography. II. A partial theoretical description of the unwanted mode. Journal of Physics D Applied Physics. 8(15). 1843–1850. 5 indexed citations

Isherwood, B. J. & C. A. Wallace. (1975). The analysis of unwanted-mode vibration patterns in AT-cut quartz oscillator crystals, revealed by X-ray diffraction topography. I. Interpretation of the X-ray diffraction topographs. Journal of Physics D Applied Physics. 8(15). 1827–1842. 5 indexed citations

Wallace, C. A. & R. C. C. Ward. (1975). A high-resolution X-ray topographical technique for thin flexible crystal plates. Journal of Applied Crystallography. 8(2). 281–286. 2 indexed citations

Wallace, C. A. & R. C. C. Ward. (1975). An X-ray cylindrical texture camera for the examination of thin films. Journal of Applied Crystallography. 8(2). 255–260. 52 indexed citations

10.

Richards, B. P., et al.. (1974). Crystallographic aspects of thin PtSi films on Si substrates. Journal of Applied Crystallography. 7(2). 275–280. 3 indexed citations

11.

Richards, B. P., et al.. (1974). The growth, crystallographic and electrical assessment of epitaxial layers of aluminium nitride on corundum substrates. Journal of Crystal Growth. 22(2). 85–98. 32 indexed citations

12.

Wallace, C. A., et al.. (1973). A topotactic reaction between nickel and gallium arsenide. Journal of Applied Crystallography. 6(6). 425–428. 11 indexed citations

13.

Isherwood, B. J. & C. A. Wallace. (1971). The geometry of X-ray multiple diffraction in crystals. Acta Crystallographica Section A. 27(2). 119–130. 17 indexed citations

14.

Wallace, C. A.. (1970). An X-ray test of the polarity of silicon carbide crystals. Journal of Applied Crystallography. 3(5). 328–332. 2 indexed citations

15.

Isherwood, B. J. & C. A. Wallace. (1970). An X-ray multiple diffraction study of crystals of arsenic-doped germanium. Journal of Applied Crystallography. 3(2). 66–71. 9 indexed citations

16.

Wallace, C. A.. (1970). The display of twinning in lithium niobate X-ray diffraction topography. Journal of Applied Crystallography. 3(6). 546–547. 20 indexed citations

17.

Wallace, C. A.. (1968). The study of polytypism in silicon carbide by x-ray diffraction topography. Zeitschrift für Kristallographie. 126(5-6). 444–459. 4 indexed citations

18.

Wallace, C. A. & Christopher G. Bailey. (1967). Dip-Track Test. IEEE Transactions on Electrical Insulation. EI-2(3). 137–140. 3 indexed citations

19.

Isherwood, B. J. & C. A. Wallace. (1966). Measurement of the Lattice Parameter of Silicon, using a Double-diffraction Effect. Nature. 212(5058). 173–175. 15 indexed citations

20.

Isherwood, B. J., et al.. (1965). A study of vibrations in quartz crystals using x-ray diffraction topography. British Journal of Applied Physics. 16(11). 1759–1761. 3 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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