Byunghoon Lee

638 citations
58 papers · 515 indexed · h-index 13
Topics
Electronic Packaging and Soldering Technologies (15 papers)3D IC and TSV technologies (12 papers)Advancements in Photolithography Techniques (10 papers)

In The Last Decade

Byunghoon Lee

51 papers receiving 490 citations

Peers

Byunghoon Lee
Comparison fields: 5 of 71
  • Electrical and Electronic Engineering 354
  • Mechanical Engineering 134
  • Biomedical Engineering 116
  • Materials Chemistry 86
  • Electronic, Optical and Magnetic Materials 59
Replace Jae‐Hoon Lee with:
Jae‐Hoon Lee South Korea
Johan De Baets Belgium
V. Marinov United States
Abhijit P. Suryavanshi United States
Kai‐Ming Hu China
Y. C. Lee United States
D. Young United States
Hisashi Kino Japan
Xintao Lai China
Min Seok Yoo South Korea
Byunghoon Lee relative to Jae‐Hoon Lee South Korea Jae‐Hoon Lee's profile →
Citations per field
00.5×1.5×2.0×
Jae‐Hoon Lee · 1×
Citations per year

Countries citing papers authored by Byunghoon Lee

Since Specialization
Citations

This map shows the geographic impact of Byunghoon Lee's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Byunghoon Lee with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Byunghoon Lee more than expected).

Fields of papers citing papers by Byunghoon Lee

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Byunghoon Lee. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Byunghoon Lee. The network helps show where Byunghoon Lee may publish in the future.

Co-authorship network of co-authors of Byunghoon Lee

This figure shows the co-authorship network connecting the top 25 collaborators of Byunghoon Lee. A scholar is included among the top collaborators of Byunghoon Lee based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Byunghoon Lee. Byunghoon Lee is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
#WorkIndexed citations
1 0
2 10
3 0
4 0
5 2
6 2
7 12
8 4
9 2
10 7
11 3
12 4
13 12
14 0
15 15
16 14
17 8
18 1
19 7
20 7

About Byunghoon Lee

Byunghoon Lee is a scholar working on Surfaces, Coatings and Films, Hardware and Architecture and Electrical and Electronic Engineering, having authored 58 papers that have together received 515 indexed citations. Recurring topics across this work include Electronic Packaging and Soldering Technologies (15 papers), 3D IC and TSV technologies (12 papers) and Advancements in Photolithography Techniques (10 papers). The work is most often cited by research in Electrical and Electronic Engineering (354 citations), Surfaces, Coatings and Films (39 citations) and Mechanical Engineering (134 citations). Byunghoon Lee has collaborated with scholars based in South Korea, United States and Singapore. Frequent co-authors include Kee-Won Kwon, Hoo-Jeong Lee, Ja‐Myeong Koo, Haseok Jeon, Maenghyo Cho, Sungwoo Park, Jongseo Park, Jaewon Kim, Chee Lip Gan and Joo Hwan Shin. Their work appears in journals such as Advanced Materials, ACS Nano and Biochemistry.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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