Bradley L. Thiel
- Electrical and Electronic Engineering
- Surfaces, Coatings and Films top 5%
- Materials Chemistry
- Structural Biology top 2%
- Atomic and Molecular Physics, and Optics
- Co-authors
- Milos TothAthene M. DonaldCharlene J. LoboC. Patrick RoyallN. A. StelmashenkoVasiliki TileliChaobin HeKathleen Dunn
- Topics
- Electron and X-Ray Spectroscopy Techniques (19 papers)Advancements in Photolithography Techniques (12 papers)Advanced Electron Microscopy Techniques and Applications (9 papers)
- Partner nations
- United StatesUnited KingdomAustralia
In The Last Decade
Bradley L. Thiel
24 papers receiving 394 citations
Peers
Comparison fields: 5 of 59
- Electrical and Electronic Engineering 199
- Surfaces, Coatings and Films 197
- Materials Chemistry 119
- Structural Biology 109
- Atomic and Molecular Physics, and Optics 76
Countries citing papers authored by Bradley L. Thiel
This map shows the geographic impact of Bradley L. Thiel's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Bradley L. Thiel with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Bradley L. Thiel more than expected).
Fields of papers citing papers by Bradley L. Thiel
This network shows the impact of papers produced by Bradley L. Thiel. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Bradley L. Thiel. The network helps show where Bradley L. Thiel may publish in the future.
Co-authorship network of co-authors of Bradley L. Thiel
This figure shows the co-authorship network connecting the top 25 collaborators of Bradley L. Thiel. A scholar is included among the top collaborators of Bradley L. Thiel based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Bradley L. Thiel. Bradley L. Thiel is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | Assessing a Multi-Electron Beam Application Approach for Semiconductor Process Metrology | 3 |
| 2 | 47 | |
| 3 | 10 | |
| 4 | 1 | |
| 5 | 20 | |
| 6 | 17 | |
| 7 | 5 | |
| 8 | 27 | |
| 9 | 30 | |
| 10 | 7 | |
| 11 | 27 | |
| 12 | 9 | |
| 13 | 73 | |
| 14 | 3 | |
| 15 | 10 | |
| 16 | 1 | |
| 17 | 21 | |
| 18 | 1 | |
| 19 | 54 | |
| 20 | 4 |
About Bradley L. Thiel
Bradley L. Thiel is a scholar working on Structural Biology, Surfaces, Coatings and Films and Electrical and Electronic Engineering, having authored 24 papers that have together received 411 indexed citations. Recurring topics across this work include Electron and X-Ray Spectroscopy Techniques (19 papers), Advancements in Photolithography Techniques (12 papers) and Advanced Electron Microscopy Techniques and Applications (9 papers). The work is most often cited by research in Structural Biology (109 citations), Surfaces, Coatings and Films (197 citations) and Electrical and Electronic Engineering (199 citations). Bradley L. Thiel has collaborated with scholars based in United States, United Kingdom and Australia. Frequent co-authors include Milos Toth, Athene M. Donald, Charlene J. Lobo, C. Patrick Royall, N. A. Stelmashenko, Vasiliki Tileli, Chaobin He, Kathleen Dunn, Michele Sferrazza and Juntao Li. Their work appears in journals such as Applied Physics Letters, Journal of Applied Physics and Langmuir.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.