B. Selle

914 total citations
64 papers, 764 citations indexed

About

B. Selle is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, B. Selle has authored 64 papers receiving a total of 764 indexed citations (citations by other indexed papers that have themselves been cited), including 53 papers in Electrical and Electronic Engineering, 37 papers in Materials Chemistry and 21 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in B. Selle's work include Thin-Film Transistor Technologies (30 papers), Semiconductor materials and interfaces (18 papers) and Semiconductor materials and devices (17 papers). B. Selle is often cited by papers focused on Thin-Film Transistor Technologies (30 papers), Semiconductor materials and interfaces (18 papers) and Semiconductor materials and devices (17 papers). B. Selle collaborates with scholars based in Germany, Spain and Ukraine. B. Selle's co-authors include W. Fuhs, I. Sieber, F. Fenske, M. Birkholz, G. González-Dı́az, I. Mártil, W. Bohne, S. Brehme, A. del Prado and J. Röhrich and has published in prestigious journals such as Physical review. B, Condensed matter, Journal of Applied Physics and Applied Surface Science.

In The Last Decade

B. Selle

61 papers receiving 723 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
B. Selle Germany 15 619 554 172 67 55 64 764
F. Fenske Germany 13 461 0.7× 439 0.8× 139 0.8× 58 0.9× 74 1.3× 38 590
M. Baleva Bulgaria 14 348 0.6× 369 0.7× 208 1.2× 55 0.8× 71 1.3× 67 555
J. T. Fitch United States 11 507 0.8× 292 0.5× 107 0.6× 57 0.9× 61 1.1× 29 575
C. Doland United States 13 414 0.7× 272 0.5× 173 1.0× 53 0.8× 29 0.5× 25 554
J. Strane United States 9 401 0.6× 209 0.4× 168 1.0× 67 1.0× 72 1.3× 23 531
D. K. Basa India 13 550 0.9× 503 0.9× 46 0.3× 61 0.9× 43 0.8× 40 667
M. A. Shahid United Kingdom 11 390 0.6× 231 0.4× 311 1.8× 83 1.2× 41 0.7× 38 614
Z E. Smith United States 15 971 1.6× 742 1.3× 101 0.6× 36 0.5× 17 0.3× 40 1.0k
M. Kalitzova Bulgaria 11 424 0.7× 333 0.6× 87 0.5× 43 0.6× 109 2.0× 53 563
Keiichi Nashimoto Japan 13 472 0.8× 400 0.7× 228 1.3× 121 1.8× 84 1.5× 33 681

Countries citing papers authored by B. Selle

Since Specialization
Citations

This map shows the geographic impact of B. Selle's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by B. Selle with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites B. Selle more than expected).

Fields of papers citing papers by B. Selle

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by B. Selle. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by B. Selle. The network helps show where B. Selle may publish in the future.

Co-authorship network of co-authors of B. Selle

This figure shows the co-authorship network connecting the top 25 collaborators of B. Selle. A scholar is included among the top collaborators of B. Selle based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with B. Selle. B. Selle is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Andrés, E. San, A. del Prado, I. Mártil, et al.. (2005). Oxygen to silicon ratio determination of SiOxHy thin films. Thin Solid Films. 492(1-2). 232–235. 7 indexed citations
2.
Rau, B., I. Sieber, B. Selle, et al.. (2004). Homo-epitaxial Si absorber layers grown by low-temperature ECRCVD. Thin Solid Films. 451-452. 644–648. 22 indexed citations
3.
Rau, B., B. Selle, S. Brehme, et al.. (2003). Low-temperature epitaxial Si absorber layers grown by electron-cyclotron resonance chemical vapor deposition. HZB Repository (Helmholtz-Zentrum Berlin für Materialien und Energie GmbH (HZB)). 2. 1237–1240. 1 indexed citations
4.
Schwarzkopf, Jutta, B. Selle, W. Bohne, et al.. (2003). Disorder in silicon films grown epitaxially at low temperature. Journal of Applied Physics. 93(9). 5215–5221. 20 indexed citations
5.
Alex, V., et al.. (2002). Pulsed dc magnetron-sputtering of microcrystalline silicon. Thin Solid Films. 403-404. 86–90. 11 indexed citations
6.
Birkholz, M., B. Selle, W. Fuhs, et al.. (2001). Amorphous-crystalline phase transition during the growth of thin films:  The case of microcrystalline silicon. Physical review. B, Condensed matter. 64(8). 29 indexed citations
7.
Fenske, F., et al.. (2001). Ion-assisted Sputter Deposition of Microcrystalline Silicon Films with Pulsed-DC Plasma Excitation. MRS Proceedings. 664. 3 indexed citations
8.
Bohne, W., et al.. (2000). Compositional analysis of amorphous SiNx: H films by ERDA and infrared spectroscopy. Surface and Interface Analysis. 30(1). 534–537. 13 indexed citations
9.
Birkholz, M., B. Selle, E. Conrad, K. Lips, & W. Fuhs. (2000). Evolution of structure in thin microcrystalline silicon films grown by electron-cyclotron resonance chemical vapor deposition. Journal of Applied Physics. 88(7). 4376–4379. 44 indexed citations
10.
Fenske, F., et al.. (1999). Transparent conductive ZnO:Al films by reactive co-sputtering from separate metallic Zn and Al targets. Thin Solid Films. 343-344. 130–133. 12 indexed citations
11.
Bohne, W., J. Röhrich, B. Selle, et al.. (1999). Analysis of Co and Cr dopants in epitaxial films of β-FeSi 2 by ERDA, RBS, EDX and AES. Fresenius Journal of Analytical Chemistry. 365(1-3). 258–262. 1 indexed citations
12.
Lange, H., et al.. (1996). Optical properties of β-FeSi2 films grown on Si substrates with different degree of structural perfection. Applied Surface Science. 102. 169–172. 14 indexed citations
13.
Fenske, F., et al.. (1996). ZnO/c-Si Heterojunction Interface Tuning by Interlayers. MRS Proceedings. 426. 7 indexed citations
14.
Bohne, W., et al.. (1996). Refined RBS and AES techniques for the analysis of thin films used in photovoltaic devices. physica status solidi (b). 194(1). 69–78. 2 indexed citations
15.
Mai, H., B. Schöneich, B. Selle, et al.. (1994). Synthesis of ß-FeSi<sub>2</sub>-Films by Pulsed Laser Deposition. Materials science forum. 173-174. 123–128. 2 indexed citations
16.
Selle, B., et al.. (1994). RBS analysis of thin MoSix films: Correlation between stoichiometry and some features of sputtering. Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms. 85(1-4). 297–300. 1 indexed citations
17.
Fenske, F., et al.. (1993). Multilevel Contact System with a Thin Silicide Reaction Controlling Interlayer. MRS Proceedings. 320. 3 indexed citations
18.
Goede, O., et al.. (1986). Optical and RBS Studies of ZnS:Te Thin Films. physica status solidi (a). 94(1). 259–265. 8 indexed citations
19.
Kalben, J. von, et al.. (1984). Annealin g of Luminescent ZnSe:Mn Thin Films by a Scanning CW Laser Beam). physica status solidi (a). 81(2). 715–721. 2 indexed citations
20.
Selle, B., Wolfgang Ludwig, & Robert H. Mach. (1967). Photovoltaic Response of Cu2S‐CdS p‐n Heterojunctions. physica status solidi (b). 24(2). 3 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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