Artur Jutman
- Hardware and Architecture top 2%
- Electrical and Electronic Engineering top 10%
- Control and Systems Engineering top 10%
- Computer Networks and Communications
- Computational Theory and Mathematics top 10%
- Co-authors
- Sergei DevadzeRaimund UbarJaan RaikErik LarssonM. Sonza ReordaRiccardo CantoroHeinz‐Dietrich WuttkeWitold A. Pleskacz
- Topics
- VLSI and Analog Circuit Testing (74 papers)Integrated Circuits and Semiconductor Failure Analysis (43 papers)Radiation Effects in Electronics (21 papers)
In The Last Decade
Artur Jutman
72 papers receiving 428 citations
Peers
Comparison fields: 5 of 26
- Hardware and Architecture 401
- Electrical and Electronic Engineering 372
- Control and Systems Engineering 77
- Computer Networks and Communications 49
- Computational Theory and Mathematics 36
Countries citing papers authored by Artur Jutman
This map shows the geographic impact of Artur Jutman's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Artur Jutman with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Artur Jutman more than expected).
Fields of papers citing papers by Artur Jutman
This network shows the impact of papers produced by Artur Jutman. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Artur Jutman. The network helps show where Artur Jutman may publish in the future.
Co-authorship network of co-authors of Artur Jutman
This figure shows the co-authorship network connecting the top 25 collaborators of Artur Jutman. A scholar is included among the top collaborators of Artur Jutman based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Artur Jutman. Artur Jutman is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 0 | |
| 2 | 3 | |
| 3 | 2 | |
| 4 | 11 | |
| 5 | 35 | |
| 6 | 4 | |
| 7 | E-Learning Environment for WEB-Based Study of Testing | 2 |
| 8 | 10 | |
| 9 | 2 | |
| 10 | 12 | |
| 11 | 10 | |
| 12 | 1 | |
| 13 | Learning Digital Test and Diagnostics via Internet | 2 |
| 14 | 2 | |
| 15 | 8 | |
| 16 | 2 | |
| 17 | Turbo Tester – diagnostic package for research and training | 11 |
| 18 | 1 | |
| 19 | 1 | |
| 20 | 6 |
About Artur Jutman
Artur Jutman is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering and Software, having authored 81 papers that have together received 462 indexed citations. Recurring topics across this work include VLSI and Analog Circuit Testing (74 papers), Integrated Circuits and Semiconductor Failure Analysis (43 papers) and Radiation Effects in Electronics (21 papers). The work is most often cited by research in Hardware and Architecture (401 citations), Electrical and Electronic Engineering (372 citations) and Software (24 citations). Artur Jutman has collaborated with scholars based in Estonia, Germany and Sweden. Frequent co-authors include Sergei Devadze, Raimund Ubar, Jaan Raik, Erik Larsson, M. Sonza Reorda, Riccardo Cantoro, Heinz‐Dietrich Wuttke, Witold A. Pleskacz, Hans-Joachim Wunderlich and Viera Stopjaková. Their work appears in journals such as IEEE Transactions on Industrial Electronics, Microelectronics Reliability and IEEE Instrumentation & Measurement Magazine.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.