T.E. Kopley

635 total citations
25 papers, 468 citations indexed

About

T.E. Kopley is a scholar working on Electrical and Electronic Engineering, Biomedical Engineering and Materials Chemistry. According to data from OpenAlex, T.E. Kopley has authored 25 papers receiving a total of 468 indexed citations (citations by other indexed papers that have themselves been cited), including 22 papers in Electrical and Electronic Engineering, 4 papers in Biomedical Engineering and 4 papers in Materials Chemistry. Recurrent topics in T.E. Kopley's work include Semiconductor materials and devices (17 papers), Advancements in Semiconductor Devices and Circuit Design (11 papers) and Integrated Circuits and Semiconductor Failure Analysis (8 papers). T.E. Kopley is often cited by papers focused on Semiconductor materials and devices (17 papers), Advancements in Semiconductor Devices and Circuit Design (11 papers) and Integrated Circuits and Semiconductor Failure Analysis (8 papers). T.E. Kopley collaborates with scholars based in United States, Germany and Canada. T.E. Kopley's co-authors include Jennifer Lu, Jie Liu, Paul Marcoux, Paul L. McEuen, R. G. Wheeler, C.H. Diaz, K. Poulton, R. Jewett, R. Neff and Mitchell A. Winnik and has published in prestigious journals such as Physical Review Letters, Nano Letters and Chemistry of Materials.

In The Last Decade

T.E. Kopley

21 papers receiving 450 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
T.E. Kopley United States 9 304 146 136 66 61 25 468
Hans-Dieter Bauer Germany 9 144 0.5× 196 1.3× 118 0.9× 76 1.2× 84 1.4× 29 377
Anushka Gangnaik Ireland 10 243 0.8× 129 0.9× 188 1.4× 36 0.5× 55 0.9× 14 355
Jieqian Zhang United States 5 175 0.6× 238 1.6× 62 0.5× 57 0.9× 34 0.6× 8 316
Somayyeh Rahimi United States 13 300 1.0× 221 1.5× 186 1.4× 32 0.5× 139 2.3× 26 524
Mats Robertsson Sweden 9 244 0.8× 91 0.6× 109 0.8× 30 0.5× 49 0.8× 18 365
Sung Chan Park South Korea 13 219 0.7× 290 2.0× 106 0.8× 58 0.9× 46 0.8× 26 404
M Miyasaka Japan 11 514 1.7× 287 2.0× 168 1.2× 25 0.4× 45 0.7× 19 617
Maxime Argoud France 12 271 0.9× 251 1.7× 143 1.1× 39 0.6× 42 0.7× 48 368
Valentin Satzinger Austria 12 118 0.4× 121 0.8× 203 1.5× 67 1.0× 48 0.8× 25 337
Willard E. Conley United States 8 266 0.9× 54 0.4× 236 1.7× 42 0.6× 61 1.0× 17 394

Countries citing papers authored by T.E. Kopley

Since Specialization
Citations

This map shows the geographic impact of T.E. Kopley's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by T.E. Kopley with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites T.E. Kopley more than expected).

Fields of papers citing papers by T.E. Kopley

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by T.E. Kopley. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by T.E. Kopley. The network helps show where T.E. Kopley may publish in the future.

Co-authorship network of co-authors of T.E. Kopley

This figure shows the co-authorship network connecting the top 25 collaborators of T.E. Kopley. A scholar is included among the top collaborators of T.E. Kopley based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with T.E. Kopley. T.E. Kopley is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Hahn, Daniel, et al.. (2018). Drift region engineering to reduce hot carrier effects on high voltage MOSFETs. 3. 1–4. 1 indexed citations
2.
Dixon, Thomas, et al.. (2017). Effects of Die-Attach Voids on the Thermal Impedance of Power Electronic Packages. IEEE Transactions on Components Packaging and Manufacturing Technology. 7(10). 1608–1616. 29 indexed citations
3.
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Kopley, T.E., et al.. (2014). Self heating effect on hot carrier degradation characteristic in high voltage n-channel LDMOS. 127–130. 1 indexed citations
6.
Kopley, T.E., et al.. (2011). Effects of pre-stress on hot-carrier degradation of N-channel MOSFETs. 67–72. 1 indexed citations
7.
Lu, Jennifer, Dongning Yuan, Jie Liu, Weinan Leng, & T.E. Kopley. (2008). Three Dimensional Single-Walled Carbon Nanotubes. Nano Letters. 8(10). 3325–3329. 7 indexed citations
8.
Li, Hong, et al.. (2008). Accurate Intrinsic Gate Capacitance Model for Carbon Nanotube-Array Based FETs Considering Screening Effect. IEEE Electron Device Letters. 29(12). 1408–1411. 32 indexed citations
9.
Lu, Jennifer, et al.. (2006). Fabrication of Ordered Catalytically Active Nanoparticles Derived from Block Copolymer Micelle Templates for Controllable Synthesis of Single-Walled Carbon Nanotubes. The Journal of Physical Chemistry B. 110(13). 6655–6660. 47 indexed citations
10.
Lu, Jennifer, T.E. Kopley, N. Moll, et al.. (2005). High-Quality Single-Walled Carbon Nanotubes with Small Diameter, Controlled Density, and Ordered Locations Using a Polyferrocenylsilane Block Copolymer Catalyst Precursor. Chemistry of Materials. 17(9). 2227–2231. 108 indexed citations
11.
Poulton, K., et al.. (2003). A 20 GS/s 8 b ADC with a 1 MB memory in 0.18 μm CMOS. 1. 318–496. 106 indexed citations
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Chan, V. W. S., T.E. Kopley, Paul Marcoux, & J.E. Chung. (2002). High-frequency AC hot-carrier degradation in CMOS circuits. 299–302. 6 indexed citations
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16.
Jiang, Wenjie, et al.. (1998). Assessing circuit-level hot-carrier reliability. 173–179. 14 indexed citations
17.
Diaz, C.H., T.E. Kopley, & Paul Marcoux. (1996). Building-in ESD/EOS reliability for sub-halfmicron CMOS processes. IEEE Transactions on Electron Devices. 43(6). 991–999. 20 indexed citations
18.
Diaz, C.H., T.E. Kopley, & Paul Marcoux. (1995). Building-in ESD/EOS Reliability for Sub-halfmicron CMOS Processes. 276–283.
19.
Kopley, T.E.. (1989). Resonant Tunneling in MOS Devices.. 1 indexed citations
20.
Kopley, T.E., Paul L. McEuen, & R. G. Wheeler. (1988). Resonant Tunneling through Single Electronic States and Its Suppression in a Magnetic Field. Physical Review Letters. 61(14). 1654–1657. 46 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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