A. van Oostrom
Impact in
- Surfaces, Coatings and Films top 5%
- Electron and X-Ray Spectroscopy Techniques
- Computational Mechanics top 10%
- Ion-surface interactions and analysis
Papers in
-
- Electron and X-Ray Spectroscopy Techniques 6
- Co-authors
- Y. TammingaA. E. T. KuiperF.H.P.M. HabrakenJ. DaamsG. J. van GurpPatricia TurnerM.J. SouthonJ. B. Theeten
- Journals
- Journal of Applied Physics (3 papers)Vacuum (2 papers)Applied Physics Letters (2 papers)Japanese Journal of Applied Physics (1 paper)Surface Science (1 paper)
- Partner nations
- NetherlandsUnited StatesGermany
In The Last Decade
A. van Oostrom
21 papers receiving 467 citations
Peers
Comparison fields: 5 of 51
- Surfaces, Coatings and Films 134
- Computational Mechanics 135
- Atomic and Molecular Physics, and Optics 201
- Electrical and Electronic Engineering 284
- Materials Chemistry 152
Countries citing papers authored by A. van Oostrom
This map shows the geographic impact of A. van Oostrom's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by A. van Oostrom with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites A. van Oostrom more than expected).
Fields of papers citing papers by A. van Oostrom
This network shows the impact of papers produced by A. van Oostrom. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by A. van Oostrom. The network helps show where A. van Oostrom may publish in the future.
Co-authors
The 11 scholars most cited alongside A. van Oostrom, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 1986 | 6 | |
| 2 | 1984 | 7 | |
| 3 | Chemical composition of LPCVD silicon nitride and silicon oxynitride layers | 1983 | 5 |
| 4 | 1982 | 11 | |
| 5 | 1982 | 25 | |
| 6 | 1982 | 51 | |
| 7 | 1980 | 8 | |
| 8 | 1979 | 70 | |
| 9 | 1979 | 58 | |
| 10 | 1976 | 55 | |
| 11 | 1974 | 3 | |
| 12 | 1973 | 5 | |
| 13 | 1970 | 8 | |
| 14 | 1969 | 64 | |
| 15 | 1967 | 16 | |
| 16 | 1967 | 2 | |
| 17 | 1967 | 19 | |
| 18 | 1966 | 2 | |
| 19 | 1963 | 18 | |
| 20 | 1962 | 17 |
About A. van Oostrom
A. van Oostrom is a scholar working on Surfaces, Coatings and Films, Structural Biology, Atomic and Molecular Physics, and Optics, Computational Mechanics and Electrical and Electronic Engineering, having authored 21 papers that have together received 500 indexed citations. Recurring topics across this work include Advanced Materials Characterization Techniques (8 papers), Electron and X-Ray Spectroscopy Techniques (6 papers), Ion-surface interactions and analysis (5 papers), Semiconductor materials and devices (5 papers), Diamond and Carbon-based Materials Research (3 papers), Vacuum and Plasma Arcs (3 papers), Advanced Chemical Physics Studies (3 papers) and Chemical and Physical Properties of Materials (2 papers). The work is most often cited by research in Surfaces, Coatings and Films (134 citations), Computational Mechanics (135 citations), Atomic and Molecular Physics, and Optics (201 citations), Electrical and Electronic Engineering (284 citations) and Materials Chemistry (152 citations). A. van Oostrom has collaborated with scholars based in Netherlands, United States and Germany. Frequent co-authors include Y. Tamminga, A. E. T. Kuiper, F.H.P.M. Habraken, J. Daams, G. J. van Gurp, Patricia Turner, M.J. Southon, J. B. Theeten, G.G.P. van Gorkom and W. Nijman. Their work appears in journals such as Journal of Applied Physics, Vacuum, Applied Physics Letters, Japanese Journal of Applied Physics and Surface Science.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.