A. H. Mueller

474 total citations
14 papers, 368 citations indexed

About

A. H. Mueller is a scholar working on Materials Chemistry, Electrical and Electronic Engineering and Condensed Matter Physics. According to data from OpenAlex, A. H. Mueller has authored 14 papers receiving a total of 368 indexed citations (citations by other indexed papers that have themselves been cited), including 12 papers in Materials Chemistry, 7 papers in Electrical and Electronic Engineering and 4 papers in Condensed Matter Physics. Recurrent topics in A. H. Mueller's work include Electronic and Structural Properties of Oxides (5 papers), Semiconductor materials and devices (5 papers) and ZnO doping and properties (5 papers). A. H. Mueller is often cited by papers focused on Electronic and Structural Properties of Oxides (5 papers), Semiconductor materials and devices (5 papers) and ZnO doping and properties (5 papers). A. H. Mueller collaborates with scholars based in United States, China and New Zealand. A. H. Mueller's co-authors include Anthony K. Burrell, Q. X. Jia, T. Mark McCleskey, Eve Bauer, Hongmei Luo, E. A. Irene, Orlando Auciello, J. Schultz, Yi Hu and N. A. Suvorova and has published in prestigious journals such as Advanced Materials, Applied Physics Letters and Journal of Applied Physics.

In The Last Decade

A. H. Mueller

13 papers receiving 361 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
A. H. Mueller United States	8	266	219	134	51	50	14	368
Simon N. Ogugua South Africa	11	292 1.1×	163 0.7×	52 0.4×	17 0.3×	31 0.6×	22	359
Shui-Yang Lien Taiwan	7	159 0.6×	211 1.0×	74 0.6×	10 0.2×	57 1.1×	14	361
Weiyi Xia United States	13	397 1.5×	163 0.7×	45 0.3×	26 0.5×	77 1.5×	36	494
Sihai Cao China	7	248 0.9×	199 0.9×	173 1.3×	13 0.3×	21 0.4×	10	369
R. Rapalaviciute Germany	6	255 1.0×	115 0.5×	34 0.3×	20 0.4×	45 0.9×	7	362
Е. Ф. Полисадова Russia	15	527 2.0×	297 1.4×	39 0.3×	46 0.9×	50 1.0×	49	574
R. Lamouri Morocco	11	321 1.2×	161 0.7×	48 0.4×	10 0.2×	61 1.2×	23	425
Shugang Tan China	12	227 0.9×	85 0.4×	45 0.3×	17 0.3×	30 0.6×	39	369
B. Hu China	13	349 1.3×	238 1.1×	64 0.5×	9 0.2×	69 1.4×	37	453
Mengkai Lv China	12	316 1.2×	133 0.6×	24 0.2×	54 1.1×	66 1.3×	19	371

Countries citing papers authored by A. H. Mueller

Since Specialization

Citations

This map shows the geographic impact of A. H. Mueller's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by A. H. Mueller with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites A. H. Mueller more than expected).

Fields of papers citing papers by A. H. Mueller

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by A. H. Mueller. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by A. H. Mueller. The network helps show where A. H. Mueller may publish in the future.

Co-authorship network of co-authors of A. H. Mueller

This figure shows the co-authorship network connecting the top 25 collaborators of A. H. Mueller. A scholar is included among the top collaborators of A. H. Mueller based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with A. H. Mueller. A. H. Mueller is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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14 of 14 papers shown

McCleskey, T. Mark, Eve Bauer, Q. X. Jia, et al.. (2013). Optical band gap of NpO2 and PuO2 from optical absorbance of epitaxial films. Journal of Applied Physics. 113(1). 70 indexed citations

Luo, Hongmei, Yuan Lin, Haiyan Wang, et al.. (2008). Epitaxial GaN Thin Films Prepared by Polymer-Assisted Deposition. The Journal of Physical Chemistry C. 112(51). 20535–20538. 15 indexed citations

Bauer, Eve, A. H. Mueller, Igor Usov, et al.. (2008). Chemical Solution Route to Conformal Phosphor Coatings on Nanostructures. Advanced Materials. 20(24). 4704–4707. 11 indexed citations

Luo, Hongmei, A. H. Mueller, T. Mark McCleskey, et al.. (2008). Structural and Photoelectrochemical Properties of BiVO₄ Thin Films. The Journal of Physical Chemistry C. 112(15). 6099–6102. 149 indexed citations

Mueller, A. H., N. A. Suvorova, E. A. Irene, Orlando Auciello, & J. Schultz. (2003). Model for interface formation and the resulting electrical properties for barium–strontium–titanate films on silicon. Journal of Applied Physics. 93(7). 3866–3872. 10 indexed citations

Auciello, Orlando, A. M. Dhote, R. Ramesh, et al.. (2002). Development of Materials Integration Strategies for Electroceramic Film-Based Devices Via Complementary In Situ and Ex Situ Studies of Film Growth and Interface Processes. Integrated ferroelectrics. 46(1). 295–306. 1 indexed citations

Mueller, A. H., N. A. Suvorova, E. A. Irene, Orlando Auciello, & J. Schultz. (2002). Real-time observations of interface formation for barium strontium titanate films on silicon. Applied Physics Letters. 80(20). 3796–3798. 18 indexed citations

Mueller, A. H., N. A. Suvorova, & E. A. Irene. (2002). Sensitivity in extracting static dielectric constants from multiple film stacks. Applied Physics Letters. 80(19). 3596–3598. 3 indexed citations

Krauss, A.R., Orlando Auciello, Jaemo Im, et al.. (2001). Studies of ferroelectric film growth and capacitor interface processes viainsituanalytical techniques and correlation with electrical properties. Integrated ferroelectrics. 32(1-4). 121–131. 7 indexed citations

10.

Mueller, A. H., et al.. (2001). In situ real-time studies of nickel silicide phase formation. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 19(2). 376–383. 50 indexed citations

11.

Mueller, A. H., et al.. (1999). In situ study of interface reactions of ion beam sputter deposited (Ba0.5Sr0.5)TiO3 films on Si, SiO2, and Ir. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 17(4). 1880–1886. 31 indexed citations

12.

Mueller, A. H., et al.. (1999). Combined Spectroscopic Ellipsometry and Ion Beam Surface Analysis for In-Situ Real-Time Characterization of Complex Oxide Film Growth. MRS Proceedings. 569. 2 indexed citations

13.

Mueller, A. H., et al.. (1999). In-Situ Real-Time Ellipsometry Study of Dynamic Processes of YBa₂Cu₃O_7−x Thin Films. MRS Proceedings. 569.

14.

Mueller, A. H., et al.. (1999). Real-time study of oxygen in c-axis oriented YBa2Cu3O7−δ thin films using in situ spectroscopic ellipsometry. Journal of Applied Physics. 86(12). 6979–6984. 1 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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