B. Duriez

GaAs nano-ridge laser diodes fully fabricated in a 300-mm CMOS pilot line

Predictive models for the surface roughness and subsurface damage depth of semiconductor materials in precision grinding

High-Performance InAs Gate-All-Around Nanowire MOSFETs on 300 mm Si Substrates

An Ultralow-Resistance Ultrashallow Metallic Source/Drain Contact Scheme for III–V NMOS